These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

243 related articles for article (PubMed ID: 27916858)

  • 1. Three-Dimensional Continuous Displacement Measurement with Temporal Speckle Pattern Interferometry.
    Qin J; Gao Z; Wang X; Yang S
    Sensors (Basel); 2016 Nov; 16(12):. PubMed ID: 27916858
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Continual in-plane displacement measurement with temporal wavelet transform speckle pattern interferometry.
    Gao Z; Deng Y; Duan Y; Zhang Z; Wei C; Chen S; Cui J; Feng Q
    Rev Sci Instrum; 2012 Jan; 83(1):015107. PubMed ID: 22299986
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Simultaneous measurement of in-plane and out-of-plane displacement derivatives using dual-wavelength digital holographic interferometry.
    Rajshekhar G; Gorthi SS; Rastogi P
    Appl Opt; 2011 Dec; 50(34):H16-21. PubMed ID: 22193002
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Phase measurement in temporal speckle pattern interferometry: comparison between the phase-shifting and the Fourier transform methods.
    Kaufmann GH; Galizzi GE
    Appl Opt; 2002 Dec; 41(34):7254-63. PubMed ID: 12477116
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry.
    Ruiz PD; Huntley JM; Wildman RD
    Appl Opt; 2005 Jul; 44(19):3945-53. PubMed ID: 16004039
    [TBL] [Abstract][Full Text] [Related]  

  • 6. A simultaneous in- and out-of-plane displacement measurement method.
    Siegmann P; Álvarez-Fernández V; Díaz-Garrido F; Patterson EA
    Opt Lett; 2011 Jan; 36(1):10-2. PubMed ID: 21209670
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Wavelet analysis of speckle patterns with a temporal carrier.
    Fu Y; Tay CJ; Quan C; Miao H
    Appl Opt; 2005 Feb; 44(6):959-65. PubMed ID: 15751686
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure-scale deformations in three dimensions.
    Flynn EB; Bassman LC; Smith TP; Lalji Z; Fullerton LH; Leung TC; Greenfield SR; Koskelo AC
    Appl Opt; 2006 May; 45(14):3218-25. PubMed ID: 16676025
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Experimental evaluation of a 3D wavelet-based phase recovery method in temporal speckle pattern interferometry.
    Galizzi GE; Federico A; Kaufmann GH
    Appl Opt; 2017 May; 56(15):4412-4418. PubMed ID: 29047871
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Surface profile measurement in white-light scanning interferometry using a three-chip color CCD.
    Ma S; Quan C; Zhu R; Tay CJ; Chen L
    Appl Opt; 2011 May; 50(15):2246-54. PubMed ID: 21614118
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Real-time displacement measurement using a multicamera phase-stepping speckle interferometer.
    Haasteren AJ; Frankena HJ
    Appl Opt; 1994 Jul; 33(19):4137-42. PubMed ID: 20935764
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Tri-wavelength simultaneous ESPI for 3D micro-deformation field measurement.
    Jiang H; Yang F; Dai X; He X; Peng G
    Appl Opt; 2022 Jan; 61(2):615-622. PubMed ID: 35200904
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Measurement of nanometric displacements by correlating two speckle interferograms.
    Tendela LP; Galizzi GE; Federico A; Kaufmann GH
    Appl Opt; 2011 Apr; 50(12):1758-64. PubMed ID: 21509068
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Robust phase recovery in temporal speckle pattern interferometry using a 3D directional wavelet transform.
    Federico A; Kaufmann GH
    Opt Lett; 2009 Aug; 34(15):2336-8. PubMed ID: 19649089
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing.
    Lu M; Wang S; Aulbach L; Koch AW
    Appl Opt; 2016 Aug; 55(22):5868-75. PubMed ID: 27505365
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Optimum determination of speckle size to be used in electronic speckle pattern interferometry.
    Yoshimura T; Zhou M; Yamahai K; Liyan Z
    Appl Opt; 1995 Jan; 34(1):87-91. PubMed ID: 20963087
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Surface displacement imaging by interferometry with a light emitting diode.
    Dilhaire S; Grauby S; Jorez S; Lopez LD; Rampnoux JM; Claeys W
    Appl Opt; 2002 Aug; 41(24):4996-5001. PubMed ID: 12206206
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Measurement of all orthogonal components of displacement in the volume of scattering materials using wavelength scanning interferometry.
    Chakraborty S; Ruiz PD
    J Opt Soc Am A Opt Image Sci Vis; 2012 Sep; 29(9):1776-85. PubMed ID: 23201931
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry.
    Lee JY; Lu MP; Lin KY; Huang SH
    Appl Opt; 2012 Mar; 51(8):1095-100. PubMed ID: 22410988
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Digital holographic interferometer using simultaneously three lasers and a single monochrome sensor for 3D displacement measurements.
    Saucedo-A T; De la Torre-Ibarra MH; Santoyo FM; Moreno I
    Opt Express; 2010 Sep; 18(19):19867-75. PubMed ID: 20940878
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 13.