These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
273 related articles for article (PubMed ID: 28147654)
1. Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range. Çelik Ü; Karcı Ö; Uysallı Y; Özer HÖ; Oral A Rev Sci Instrum; 2017 Jan; 88(1):013705. PubMed ID: 28147654 [TBL] [Abstract][Full Text] [Related]
2. 1 fm/Hz noise level low temperature Fabry-Pérot atomic force/magnetic force microscope operating in 4-300 K temperature range. Karc Ö; Çelik Ü; Oral A Rev Sci Instrum; 2020 Jan; 91(1):013703. PubMed ID: 32012622 [TBL] [Abstract][Full Text] [Related]
3. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution. Karcı Ö; Dede M; Oral A Rev Sci Instrum; 2014 Oct; 85(10):103705. PubMed ID: 25362401 [TBL] [Abstract][Full Text] [Related]
4. Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy. Deng W; Zhang GM; Murphy MF; Lilley F; Harvey DM; Burton DR Microsc Res Tech; 2015 Oct; 78(10):935-46. PubMed ID: 26303510 [TBL] [Abstract][Full Text] [Related]
5. Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy. Fukuma T; Yoshioka S; Asakawa H Rev Sci Instrum; 2011 Jul; 82(7):073707. PubMed ID: 21806189 [TBL] [Abstract][Full Text] [Related]
6. A novel phase-shift-based amplitude detector for a high-speed atomic force microscope. Miyagi A; Scheuring S Rev Sci Instrum; 2018 Aug; 89(8):083704. PubMed ID: 30184715 [TBL] [Abstract][Full Text] [Related]
7. Topography imaging with a heated atomic force microscope cantilever in tapping mode. Park K; Lee J; Zhang ZM; King WP Rev Sci Instrum; 2007 Apr; 78(4):043709. PubMed ID: 17477672 [TBL] [Abstract][Full Text] [Related]
8. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever. Yeh MK; Tai NH; Chen BY Rev Sci Instrum; 2009 Apr; 80(4):043705. PubMed ID: 19405664 [TBL] [Abstract][Full Text] [Related]
9. Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy. Özgür Özer H Ultramicroscopy; 2019 Jan; 196():54-57. PubMed ID: 30278318 [TBL] [Abstract][Full Text] [Related]
10. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers. Killgore JP; Tung RC; Hurley DC Nanotechnology; 2014 Aug; 25(34):345701. PubMed ID: 25098183 [TBL] [Abstract][Full Text] [Related]
11. Influence of spurious resonances on the interaction force in dynamic AFM. Costa L; Rodrigues MS Beilstein J Nanotechnol; 2015; 6():420-7. PubMed ID: 25821682 [TBL] [Abstract][Full Text] [Related]
12. In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude. de Laat ML; Pérez Garza HH; Ghatkesar MK Sensors (Basel); 2016 Apr; 16(4):. PubMed ID: 27077863 [TBL] [Abstract][Full Text] [Related]