342 related articles for article (PubMed ID: 28192763)
1. Beam broadening in transmission and conventional EBSD.
Rice KP; Chen Y; Keller RR; Stoykovich MP
Micron; 2017 Apr; 95():42-50. PubMed ID: 28192763
[TBL] [Abstract][Full Text] [Related]
2. Transmission Kikuchi diffraction versus electron back-scattering diffraction: A case study on an electron transparent cross-section of TWIP steel.
Gazder AA; Elkhodary KI; Nancarrow MJB; Saleh AA
Micron; 2017 Dec; 103():53-63. PubMed ID: 28972922
[TBL] [Abstract][Full Text] [Related]
3. Effect of microscope parameter and specimen thickness of spatial resolution of transmission electron backscatter diffraction.
Wang YZ; Kong MG; Liu ZW; Lin CC; Zeng Y
J Microsc; 2016 Oct; 264(1):34-40. PubMed ID: 27086586
[TBL] [Abstract][Full Text] [Related]
4. Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization.
Brodusch N; Demers H; Trudeau M; Gauvin R
Scanning; 2013; 35(6):375-86. PubMed ID: 23440636
[TBL] [Abstract][Full Text] [Related]
5. On the optimum resolution of transmission-electron backscattered diffraction (t-EBSD).
van Bremen R; Ribas Gomes D; de Jeer LTH; Ocelík V; De Hosson JTM
Ultramicroscopy; 2016 Jan; 160():256-264. PubMed ID: 26579885
[TBL] [Abstract][Full Text] [Related]
6. EBSD spatial resolution for detecting sigma phase in steels.
Bordín SF; Limandri S; Ranalli JM; Castellano G
Ultramicroscopy; 2016 Dec; 171():177-185. PubMed ID: 27690348
[TBL] [Abstract][Full Text] [Related]
7. Electron beam broadening in electron-transparent samples at low electron energies.
Hugenschmidt M; Müller E; Gerthsen D
J Microsc; 2019 Jun; 274(3):150-157. PubMed ID: 31001840
[TBL] [Abstract][Full Text] [Related]
8. Energy-filtered electron backscatter diffraction.
Deal A; Hooghan T; Eades A
Ultramicroscopy; 2008 Jan; 108(2):116-25. PubMed ID: 17509764
[TBL] [Abstract][Full Text] [Related]
9. A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.
Babinsky K; De Kloe R; Clemens H; Primig S
Ultramicroscopy; 2014 Sep; 144():9-18. PubMed ID: 24815026
[TBL] [Abstract][Full Text] [Related]
10. Effects of accelerating voltage and specimen thickness on the spatial resolution of transmission electron backscatter diffraction in Cu.
Shih JW; Kuo KW; Kuo JC; Kuo TY
Ultramicroscopy; 2017 Jun; 177():43-52. PubMed ID: 28284057
[TBL] [Abstract][Full Text] [Related]
11. Dynamical electron backscatter diffraction patterns. Part I: pattern simulations.
Callahan PG; De Graef M
Microsc Microanal; 2013 Oct; 19(5):1255-65. PubMed ID: 23800378
[TBL] [Abstract][Full Text] [Related]
12. Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon.
Winkelmann A; Nolze G
Ultramicroscopy; 2010 Feb; 110(3):190-4. PubMed ID: 20005045
[TBL] [Abstract][Full Text] [Related]
13. Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope.
Pascal E; Singh S; Callahan PG; Hourahine B; Trager-Cowan C; Graef M
Ultramicroscopy; 2018 Apr; 187():98-106. PubMed ID: 29428431
[TBL] [Abstract][Full Text] [Related]
14. Analysis of the microstructure of bulk MgB
Koblischka-Veneva A; Koblischka MR; Schmauch J; Noudem J; Murakami M
J Microsc; 2019 Jun; 274(3):123-131. PubMed ID: 30852839
[TBL] [Abstract][Full Text] [Related]
15. Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging.
Mendis BG; Barthel J; Findlay SD; Allen LJ
Microsc Microanal; 2020 Dec; 26(6):1147-1157. PubMed ID: 33190677
[TBL] [Abstract][Full Text] [Related]
16. Using transmission Kikuchi diffraction to study intergranular stress corrosion cracking in type 316 stainless steels.
Meisnar M; Vilalta-Clemente A; Gholinia A; Moody M; Wilkinson AJ; Huin N; Lozano-Perez S
Micron; 2015 Aug; 75():1-10. PubMed ID: 25974882
[TBL] [Abstract][Full Text] [Related]
17. Exploring Spatial Resolution in Electron Back-Scattered Diffraction Experiments via Monte Carlo Simulation.
Ren SX; Kenik EA; Alexander KB; Goyal A
Microsc Microanal; 1998 Jan; 4(1):15-22. PubMed ID: 9524142
[TBL] [Abstract][Full Text] [Related]
18. Reversed scan direction reduces electron beam damage in EBSD maps.
Kidder S; Prior D
J Microsc; 2014 Aug; 255(2):89-93. PubMed ID: 24943109
[TBL] [Abstract][Full Text] [Related]
19. Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction.
Proust G; Trimby P; Piazolo S; Retraint D
J Vis Exp; 2017 Apr; (122):. PubMed ID: 28447998
[TBL] [Abstract][Full Text] [Related]
20. Practical application of direct electron detectors to EBSD mapping in 2D and 3D.
Mingard KP; Stewart M; Gee MG; Vespucci S; Trager-Cowan C
Ultramicroscopy; 2018 Jan; 184(Pt A):242-251. PubMed ID: 28992558
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]