These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
2. Characterization of the cathode objective lens by Real-Space Microspot Low Energy Electron Diffraction. Tromp RM Ultramicroscopy; 2013 Jul; 130():2-6. PubMed ID: 23510571 [TBL] [Abstract][Full Text] [Related]
3. A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM. Schramm SM; Pang AB; Altman MS; Tromp RM Ultramicroscopy; 2012 Apr; 115():88-108. PubMed ID: 22209472 [TBL] [Abstract][Full Text] [Related]
4. Comparing Fourier optics and contrast transfer function modeling of image formation in low energy electron microscopy. Yu KM; Locatelli A; Altman MS Ultramicroscopy; 2017 Dec; 183():109-116. PubMed ID: 28366353 [TBL] [Abstract][Full Text] [Related]
5. Fourier optics of image formation in aberration-corrected LEEM. Yu KM; Lau KLW; Altman MS Ultramicroscopy; 2019 May; 200():160-168. PubMed ID: 30925261 [TBL] [Abstract][Full Text] [Related]
8. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design. Tromp RM; Hannon JB; Ellis AW; Wan W; Berghaus A; Schaff O Ultramicroscopy; 2010 Jun; 110(7):852-61. PubMed ID: 20395048 [TBL] [Abstract][Full Text] [Related]
9. Fourier optics of image formation in LEEM. Pang AB; Müller T; Altman MS; Bauer E J Phys Condens Matter; 2009 Aug; 21(31):314006. PubMed ID: 21828567 [TBL] [Abstract][Full Text] [Related]
10. Optimization and stability of the contrast transfer function in aberration-corrected electron microscopy. Tromp RM; Schramm SM Ultramicroscopy; 2013 Feb; 125():72-80. PubMed ID: 23314476 [TBL] [Abstract][Full Text] [Related]
11. Measuring and correcting aberrations of a cathode objective lens. Tromp RM Ultramicroscopy; 2011 Mar; 111(4):273-81. PubMed ID: 21353153 [TBL] [Abstract][Full Text] [Related]
12. Energy-filtered real- and k-space secondary and energy-loss electron imaging with Dual Emission Electron spectro-Microscope: Cs/Mo(110). Grzelakowski KP Ultramicroscopy; 2016 May; 164():78-87. PubMed ID: 26520016 [TBL] [Abstract][Full Text] [Related]
13. High order phase contrast and source divergence in low energy electron microscopy. Yu L; Wan W; Yu KM; Altman M; Tang WX Ultramicroscopy; 2021 Jun; 225():113284. PubMed ID: 33872959 [TBL] [Abstract][Full Text] [Related]
14. The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imaging. Lentzen M Ultramicroscopy; 2004 Jun; 99(4):211-20. PubMed ID: 15149715 [TBL] [Abstract][Full Text] [Related]
15. An adjustable electron achromat for cathode lens microscopy. Tromp RM Ultramicroscopy; 2015 Dec; 159 Pt 3():497-502. PubMed ID: 25825026 [TBL] [Abstract][Full Text] [Related]
16. Aberrations of the cathode objective lens up to fifth order. Tromp RM; Wan W; Schramm SM Ultramicroscopy; 2012 Aug; 119():33-9. PubMed ID: 22188906 [TBL] [Abstract][Full Text] [Related]
17. Shadow images for in-line holography in a STEM instrument. Wang SY; Cowley JM Microsc Res Tech; 1995 Feb; 30(2):181-92. PubMed ID: 7711329 [TBL] [Abstract][Full Text] [Related]
18. A monochromatic, aberration-corrected, dual-beam low energy electron microscope. Mankos M; Shadman K Ultramicroscopy; 2013 Jul; 130():13-28. PubMed ID: 23582636 [TBL] [Abstract][Full Text] [Related]
19. A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results. Tromp RM; Hannon JB; Wan W; Berghaus A; Schaff O Ultramicroscopy; 2013 Apr; 127():25-39. PubMed ID: 22925736 [TBL] [Abstract][Full Text] [Related]
20. Selected-area diffraction and spectroscopy in LEEM and PEEM. Tromp RM Ultramicroscopy; 2012 Sep; 120():73-7. PubMed ID: 22842113 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]