These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
140 related articles for article (PubMed ID: 28487005)
1. Nitrogen Gas Field Ion Source (GFIS) Focused Ion Beam (FIB) Secondary Electron Imaging: A First Look. Schmidt ME; Yasaka A; Akabori M; Mizuta H Microsc Microanal; 2017 Aug; 23(4):758-768. PubMed ID: 28487005 [TBL] [Abstract][Full Text] [Related]
2. Xenon gas field ion source from a single-atom tip. Lai WC; Lin CY; Chang WT; Li PC; Fu TY; Chang CS; Tsong TT; Hwang IS Nanotechnology; 2017 Jun; 28(25):255301. PubMed ID: 28548051 [TBL] [Abstract][Full Text] [Related]
3. Evaluation of neon focused ion beam milling for TEM sample preparation. Pekin TC; Allen FI; Minor AM J Microsc; 2016 Oct; 264(1):59-63. PubMed ID: 27172066 [TBL] [Abstract][Full Text] [Related]
4. Characteristics Comparison of Neon, Argon, and Krypton Ion Emissions from Gas Field Ionization Sources with a Single-Atom Tip. Shichi H; Matsubara S; Hashizume T Microsc Microanal; 2019 Feb; 25(1):105-114. PubMed ID: 30698124 [TBL] [Abstract][Full Text] [Related]
5. Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources. Klingner N; Hlawacek G; Mazarov P; Pilz W; Meyer F; Bischoff L Beilstein J Nanotechnol; 2020; 11():1742-1749. PubMed ID: 33282621 [TBL] [Abstract][Full Text] [Related]
6. Neon and helium focused ion beam etching of resist patterns. Xia D; Zhu X; Khanom F; Runt D Nanotechnology; 2020 Nov; 31(47):475301. PubMed ID: 32886649 [TBL] [Abstract][Full Text] [Related]
7. Defect Localization and Nanofabrication for Conductive Structures with Voltage Contrast in Helium Ion Microscopy. Xia D; McVey S; Huynh C; Kuehn W ACS Appl Mater Interfaces; 2019 Feb; 11(5):5509-5516. PubMed ID: 30644713 [TBL] [Abstract][Full Text] [Related]
8. Gallium, neon and helium focused ion beam milling of thin films demonstrated for polymeric materials: study of implantation artifacts. Allen FI; Velez NR; Thayer RC; Patel NH; Jones MA; Meyers GF; Minor AM Nanoscale; 2019 Jan; 11(3):1403-1409. PubMed ID: 30604814 [TBL] [Abstract][Full Text] [Related]
9. 3D imaging of cells and tissues by focused ion beam/scanning electron microscopy (FIB/SEM). Drobne D Methods Mol Biol; 2013; 950():275-92. PubMed ID: 23086881 [TBL] [Abstract][Full Text] [Related]
10. FIB-SEM cathodoluminescence tomography: practical and theoretical considerations. De Winter DA; Lebbink MN; Wiggers De Vries DF; Post JA; Drury MR J Microsc; 2011 Sep; 243(3):315-26. PubMed ID: 21692799 [TBL] [Abstract][Full Text] [Related]
12. Imaging thin films of nanoporous low-k dielectrics: comparison between ultramicrotomy and focused ion beam preparations for transmission electron microscopy. Thompson LE; Rice PM; Delenia E; Lee VY; Brock PJ; Magbitang TP; Dubois G; Volksen W; Miller RD; Kim HC Microsc Microanal; 2006 Apr; 12(2):156-9. PubMed ID: 17481352 [TBL] [Abstract][Full Text] [Related]
13. Electron and ion imaging of gland cells using the FIB/SEM system. Drobne D; Milani M; Zrimec A; Leser V; Berden Zrimec M J Microsc; 2005 Jul; 219(Pt 1):29-35. PubMed ID: 15998363 [TBL] [Abstract][Full Text] [Related]
14. Sample preparation toward seamless 3D imaging technique from micrometer to nanometer scale. Miyake A; Matsuno J; Toh S Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i24-i25. PubMed ID: 25359821 [TBL] [Abstract][Full Text] [Related]
15. An Experiment-Based Profile Function for the Calculation of Damage Distribution in Bulk Silicon Induced by a Helium Focused Ion Beam Process. Chen Q; Shao T; Xing Y Sensors (Basel); 2020 Apr; 20(8):. PubMed ID: 32316545 [TBL] [Abstract][Full Text] [Related]
16. The prospects of a subnanometer focused neon ion beam. Rahman FH; McVey S; Farkas L; Notte JA; Tan S; Livengood RH Scanning; 2012; 34(2):129-34. PubMed ID: 21796647 [TBL] [Abstract][Full Text] [Related]
17. A flexible method for the preparation of thin film samples for in situ TEM characterization combining shadow-FIB milling and electron-beam-assisted etching. Liebig JP; Göken M; Richter G; Mačković M; Przybilla T; Spiecker E; Pierron ON; Merle B Ultramicroscopy; 2016 Dec; 171():82-88. PubMed ID: 27643461 [TBL] [Abstract][Full Text] [Related]
18. Fabrication of a trimer/single atom tip for gas field ion sources by means of field evaporation without tip heating. Kim KI; Kim YH; Ogawa T; Choi S; Cho B; Ahn SJ; Park IY Ultramicroscopy; 2018 Sep; 192():50-56. PubMed ID: 29890500 [TBL] [Abstract][Full Text] [Related]
19. Recent developments in nanofabrication using focused ion beams. Tseng AA Small; 2005 Oct; 1(10):924-39. PubMed ID: 17193371 [TBL] [Abstract][Full Text] [Related]
20. Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications. Haub M; Guenther T; Bogner M; Zimmermann A Micromachines (Basel); 2022 Jun; 13(7):. PubMed ID: 35888836 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]