154 related articles for article (PubMed ID: 28752135)
1. Nanoscale x-ray imaging of circuit features without wafer etching.
Deng J; Hong YP; Chen S; Nashed YSG; Peterka T; Levi AJF; Damoulakis J; Saha S; Eiles T; Jacobsen C
Phys Rev B; 2017 Mar; 95(10):. PubMed ID: 28752135
[TBL] [Abstract][Full Text] [Related]
2. Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials.
Du M; Jacobsen C
Ultramicroscopy; 2018 Jan; 184(Pt A):293-309. PubMed ID: 29073575
[TBL] [Abstract][Full Text] [Related]
3. X-Ray Multibeam Ptychography at up to 20 keV: Nano-Lithography Enhances X-Ray Nano-Imaging.
Li T; Kahnt M; Sheppard TL; Yang R; Falch KV; Zvagelsky R; Villanueva-Perez P; Wegener M; Lyubomirskiy M
Adv Sci (Weinh); 2024 Jun; ():e2310075. PubMed ID: 38922762
[TBL] [Abstract][Full Text] [Related]
4. Grinding and chemical mechanical polishing process for micropore x-ray optics fabricated with deep reactive ion etching.
Fukushima A; Fujitani M; Ishikawa K; Numazawa M; Ishi D; Otsubo R; Nagatoshi H; Suzuki H; Yuasa T; Ohashi T; Mitsuda K; Ezoe Y
Appl Opt; 2019 Jul; 58(19):5240-5247. PubMed ID: 31503620
[TBL] [Abstract][Full Text] [Related]
5. Staircase array of inclined refractive multi-lenses for large field of view pixel super-resolution scanning transmission hard X-ray microscopy.
Mamyrbayev T; Ikematsu K; Takano H; Wu Y; Kimura K; Doll P; Last A; Momose A; Meyer P
J Synchrotron Radiat; 2021 May; 28(Pt 3):732-740. PubMed ID: 33949982
[TBL] [Abstract][Full Text] [Related]
6. Synchrotron-radiation X-ray topography of surface strain in large-diameter silicon wafers.
Kawado S; Iida S; Yamaguchi S; Kimura S; Hirose Y; Kajiwara K; Chikaura Y; Umeno M
J Synchrotron Radiat; 2002 May; 9(Pt 3):166-8. PubMed ID: 11972372
[TBL] [Abstract][Full Text] [Related]
7. Tunable hard x-ray nanofocusing with Fresnel zone plates fabricated using deep etching.
Li K; Ali S; Wojcik M; De Andrade V; Huang X; Yan H; Chu YS; Nazaretski E; Pattammattel A; Jacobsen C
Optica; 2020 May; 7(5):410-416. PubMed ID: 33294496
[TBL] [Abstract][Full Text] [Related]
8. Characteristic performance evaluation of a photon counting Si strip detector for low dose spectral breast CT imaging.
Cho HM; Barber WC; Ding H; Iwanczyk JS; Molloi S
Med Phys; 2014 Sep; 41(9):091903. PubMed ID: 25186390
[TBL] [Abstract][Full Text] [Related]
9. Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer.
Nakamura N; Szypryt P; Dagel AL; Alpert BK; Bennett DA; Doriese WB; Durkin M; Fowler JW; Fox DT; Gard JD; Goodner RN; Harris JZ; Hilton GC; Jimenez ES; Kernen BL; Larson KW; Levine ZH; McArthur D; Morgan KM; O'Neil GC; Ortiz NJ; Pappas CG; Reintsema CD; Schmidt DR; Schultz PA; Thompson KR; Ullom JN; Vale L; Vaughan CT; Walker C; Weber JC; Wheeler JW; Swetz DS
Sensors (Basel); 2024 Apr; 24(9):. PubMed ID: 38732996
[TBL] [Abstract][Full Text] [Related]
10. Versatile pattern generation of periodic, high aspect ratio Si nanostructure arrays with sub-50-nm resolution on a wafer scale.
Ho JW; Wee Q; Dumond J; Tay A; Chua SJ
Nanoscale Res Lett; 2013 Dec; 8(1):506. PubMed ID: 24289275
[TBL] [Abstract][Full Text] [Related]
11. X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution.
Holler M; Diaz A; Guizar-Sicairos M; Karvinen P; Färm E; Härkönen E; Ritala M; Menzel A; Raabe J; Bunk O
Sci Rep; 2014 Jan; 4():3857. PubMed ID: 24457289
[TBL] [Abstract][Full Text] [Related]
12. Integrated circuit authentication using photon-limited x-ray microscopy.
Markman A; Javidi B
Opt Lett; 2016 Jul; 41(14):3297-300. PubMed ID: 27420519
[TBL] [Abstract][Full Text] [Related]
13. Calibration of High-Resolution X-Ray Tomography With Atomic Force Microscopy.
Kalukin AR; Winn B; Wang Y; Jacobsen C; Levine ZH; Fu J
J Res Natl Inst Stand Technol; 2000; 105(6):867-74. PubMed ID: 27551641
[TBL] [Abstract][Full Text] [Related]
14. Dark-field X-ray ptychography: Towards high-resolution imaging of thick and unstained biological specimens.
Suzuki A; Shimomura K; Hirose M; Burdet N; Takahashi Y
Sci Rep; 2016 Oct; 6():35060. PubMed ID: 27734961
[TBL] [Abstract][Full Text] [Related]
15. Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics.
Lechowski B; Kutukova K; Grenzer J; Panchenko I; Krueger P; Clausner A; Zschech E
Nanomaterials (Basel); 2024 Jan; 14(2):. PubMed ID: 38276751
[TBL] [Abstract][Full Text] [Related]
16. Light transmission and internal scattering in pulsed laser-etched partially-transparent silicon wafers.
Rohaizar MH; Sepeai S; Surhada N; Ludin NA; Ibrahim MA; Sopian K; Zaidi SH
Heliyon; 2019 Nov; 5(11):e02790. PubMed ID: 31768436
[TBL] [Abstract][Full Text] [Related]
17. Improvement in thickness uniformity of thick SOI by numerically controlled local wet etching.
Yamamura K; Ueda K; Hosoda M; Zettsu N
J Nanosci Nanotechnol; 2011 Apr; 11(4):2910-5. PubMed ID: 21776652
[TBL] [Abstract][Full Text] [Related]
18. Evaluation of high intensity synchrotron radiation x-ray imaging using Si crystals with lapped surface at 33.3 keV.
Kamezawa C; Hyodo K
Rev Sci Instrum; 2023 Sep; 94(9):. PubMed ID: 37676086
[TBL] [Abstract][Full Text] [Related]
19. Demonstration of single-frame coherent X-ray diffraction imaging using triangular aperture: Towards dynamic nanoimaging of extended objects.
Takazawa S; Kang J; Abe M; Uematsu H; Ishiguro N; Takahashi Y
Opt Express; 2021 May; 29(10):14394-14402. PubMed ID: 33985163
[TBL] [Abstract][Full Text] [Related]
20.
; ; . PubMed ID:
[No Abstract] [Full Text] [Related]
[Next] [New Search]