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14. M-lines characterization of selenide and telluride thick films for mid-infrared interferometry. Labadie L; Vigreux-Bercovici C; Pradel A; Kern P; Arezki B; Broquin JE Opt Express; 2006 Sep; 14(18):8459-69. PubMed ID: 19529223 [TBL] [Abstract][Full Text] [Related]
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