These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

221 related articles for article (PubMed ID: 29099811)

  • 1. Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data.
    Liu Z; Mei W; Zeng X; Yang C; Zhou X
    Sensors (Basel); 2017 Nov; 17(11):. PubMed ID: 29099811
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Prediction of IGBT Gate Oxide Layer's Performance Degradation Based on MultiScaleFormer Network.
    He S; Yu M; Chen Y; Zhou Z; Yu L; Zhang C; Ni Y
    Micromachines (Basel); 2024 Jul; 15(8):. PubMed ID: 39203636
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Power Performance Comparison of SiC-IGBT and Si-IGBT Switches in a Three-Phase Inverter for Aircraft Applications.
    Abdalgader IAS; Kivrak S; Özer T
    Micromachines (Basel); 2022 Feb; 13(2):. PubMed ID: 35208437
    [TBL] [Abstract][Full Text] [Related]  

  • 4. IGBT Fault Prediction Combining Terminal Characteristics and Artificial Intelligence Neural Network.
    Li C
    Comput Math Methods Med; 2022; 2022():7459354. PubMed ID: 35872937
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Performance Degradation Modeling and Its Prediction Algorithm of an IGBT Gate Oxide Layer Based on a CNN-LSTM Network.
    Wang X; Zhou Z; He S; Liu J; Cui W
    Micromachines (Basel); 2023 Apr; 14(5):. PubMed ID: 37241583
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Degradation prediction model based on a neural network with dynamic windows.
    Zhang X; Xiao L; Kang J
    Sensors (Basel); 2015 Mar; 15(3):6996-7015. PubMed ID: 25806873
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Digital-Twin-Driven Intelligent Insulated-Gate Bipolar Transistor Production Lines.
    Zhang X; Liu X; Song Y; Li X; Huang W; Zhou Y; Liu S
    Sensors (Basel); 2024 Jan; 24(2):. PubMed ID: 38257704
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Bearing remaining useful life prediction using support vector machine and hybrid degradation tracking model.
    Yan M; Wang X; Wang B; Chang M; Muhammad I
    ISA Trans; 2020 Mar; 98():471-482. PubMed ID: 31492470
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network.
    Wu J; Chen X; Zhang Z
    Comput Intell Neurosci; 2021; 2021():6036118. PubMed ID: 34630549
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Using Machine Learning and Finite Element Analysis to Extract Traction-Separation Relations at Bonding Wire Interfaces of Insulated Gate Bipolar Transistor Modules.
    Zhao S; An T; Wang Q; Qin F
    Materials (Basel); 2024 Feb; 17(5):. PubMed ID: 38473474
    [TBL] [Abstract][Full Text] [Related]  

  • 11. The Optimal Design of Field Ring for Reliability and Realization of 3.3 kV Insulated-Gate Bipolar Transistor Power Semiconductor.
    Shin MC; Kim HA; Ahn BS; Cui HF; Kim SY; Kang EG
    J Nanosci Nanotechnol; 2019 Mar; 19(3):1720-1723. PubMed ID: 30469253
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Machine Learning Algorithm for Efficient Design of Separated Buffer Super-Junction IGBT.
    Kim KY; Hwang TH; Song YS; Kim H; Kim JH
    Micromachines (Basel); 2023 Jan; 14(2):. PubMed ID: 36838033
    [TBL] [Abstract][Full Text] [Related]  

  • 13. A Novel IGBT with SIPOS Pillars Achieving Ultralow Power Loss in TCAD Simulation Study.
    Yuan S; Yan Z; Li Y; Wang Y; Liu Q; Zhan X; Jiang X; He Y; Gong X
    Micromachines (Basel); 2024 Jun; 15(6):. PubMed ID: 38930729
    [TBL] [Abstract][Full Text] [Related]  

  • 14. New Particle Filter Based on GA for Equipment Remaining Useful Life Prediction.
    Li K; Wu J; Zhang Q; Su L; Chen P
    Sensors (Basel); 2017 Mar; 17(4):. PubMed ID: 28350341
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Joint Learning of Failure Mode Recognition and Prognostics for Degradation Processes.
    Wang D; Xian X; Song C
    IEEE Trans Autom Sci Eng; 2024 Apr; 21(2):1421-1433. PubMed ID: 38595999
    [TBL] [Abstract][Full Text] [Related]  

  • 16. A Study on Real Time IGBT Junction Temperature Estimation Using the NTC and Calculation of Power Losses in the Automotive Inverter System.
    Lim H; Hwang J; Kwon S; Baek H; Uhm J; Lee G
    Sensors (Basel); 2021 Apr; 21(7):. PubMed ID: 33918142
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Hybrid Degradation Equipment Remaining Useful Life Prediction Oriented Parallel Simulation considering Model Soft Switch.
    Ge C; Zhu Y; Di Y
    Comput Intell Neurosci; 2019; 2019():9179870. PubMed ID: 30992700
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Study of the Solder Characteristics of IGBT Modules Based on Thermal-Mechanical Coupling Simulation.
    Chen J; Liu B; Hu M; Huang S; Yu S; Wu Y; Yang J
    Materials (Basel); 2023 May; 16(9):. PubMed ID: 37176386
    [TBL] [Abstract][Full Text] [Related]  

  • 19. AVNM: A Voting based Novel Mathematical Rule for Image Classification.
    Vidyarthi A; Mittal N
    Comput Methods Programs Biomed; 2016 Dec; 137():195-201. PubMed ID: 28110724
    [TBL] [Abstract][Full Text] [Related]  

  • 20. A 65-kV insulated gate bipolar transistor switch applied in damped AC voltages partial discharge detection system.
    Jiang J; Ma GM; Luo DP; Li CR; Li QM; Wang W
    Rev Sci Instrum; 2014 Feb; 85(2):024706. PubMed ID: 24593382
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 12.