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9. Novel analysis technique for measuring edge density fluctuation profiles with reflectometry in the Large Helical Device. Creely AJ; Ida K; Yoshinuma M; Tokuzawa T; Tsujimura T; Akiyama T; Sakamoto R; Emoto M; Tanaka K; Michael CA Rev Sci Instrum; 2017 Jul; 88(7):073509. PubMed ID: 28764512 [TBL] [Abstract][Full Text] [Related]
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