These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

143 related articles for article (PubMed ID: 29278760)

  • 21. Open-source controller for low-cost and high-speed atomic force microscopy imaging of skin corneocyte nanotextures.
    Liao HS; Akhtar I; Werner C; Slipets R; Pereda J; Wang JH; Raun E; Nørgaard LO; Dons FE; Hwu EET
    HardwareX; 2022 Oct; 12():e00341. PubMed ID: 35936941
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Resonant control of an atomic force microscope micro-cantilever for active Q control.
    Fairbairn M; Moheimani SO
    Rev Sci Instrum; 2012 Aug; 83(8):083708. PubMed ID: 22938304
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope.
    Fukuda S; Uchihashi T; Ando T
    Rev Sci Instrum; 2015 Jun; 86(6):063703. PubMed ID: 26133840
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Large-area high-speed scanning probe microscopy using legacy scanners.
    Dey S; Kartik V
    Rev Sci Instrum; 2019 Jun; 90(6):063706. PubMed ID: 31255012
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Novel amplitude and frequency demodulation algorithm for a virtual dynamic atomic force microscope.
    Kokavecz J; Tóth Z; Horváth ZL; Heszler P; Mechler A
    Nanotechnology; 2006 Apr; 17(7):S173-7. PubMed ID: 21727410
    [TBL] [Abstract][Full Text] [Related]  

  • 26. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points.
    Herfst R; Dekker B; Witvoet G; Crowcombe W; de Lange D; Sadeghian H
    Rev Sci Instrum; 2015 Nov; 86(11):113703. PubMed ID: 26628140
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Design and control of multi-actuated atomic force microscope for large-range and high-speed imaging.
    Soltani Bozchalooi I; Careaga Houck A; AlGhamdi JM; Youcef-Toumi K
    Ultramicroscopy; 2016 Jan; 160():213-224. PubMed ID: 26547505
    [TBL] [Abstract][Full Text] [Related]  

  • 28. An operating method with lateral scan for reducing the error in topography caused by the tip-sample angle in atomic force microscopy.
    Zhou FQ; Zhao XZ; Wang F; Wang YY
    Microsc Microanal; 2010 Oct; 16(5):630-5. PubMed ID: 20731887
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Indirect identification and compensation of lateral scanner resonances in atomic force microscopes.
    Burns DJ; Youcef-Toumi K; Fantner GE
    Nanotechnology; 2011 Aug; 22(31):315701. PubMed ID: 21727318
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.
    Zhao J; Gong W; Cai W; Shang G
    Rev Sci Instrum; 2013 Aug; 84(8):083706. PubMed ID: 24007072
    [TBL] [Abstract][Full Text] [Related]  

  • 31. High-speed atomic force microscope based on an astigmatic detection system.
    Liao HS; Chen YH; Ding RF; Huang HF; Wang WM; Hwu ET; Huang KY; Chang CS; Hwang IS
    Rev Sci Instrum; 2014 Oct; 85(10):103710. PubMed ID: 25362406
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Numerical simulation of nano scanning in intermittent-contact mode AFM under Q control.
    Varol A; Gunev I; Orun B; Basdogan C
    Nanotechnology; 2008 Feb; 19(7):075503. PubMed ID: 21817636
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Local raster scanning for high-speed imaging of biopolymers in atomic force microscopy.
    Chang PI; Huang P; Maeng J; Andersson SB
    Rev Sci Instrum; 2011 Jun; 82(6):063703. PubMed ID: 21721698
    [TBL] [Abstract][Full Text] [Related]  

  • 34. The effect of drive frequency and set point amplitude on tapping forces in atomic force microscopy: simulation and experiment.
    Legleiter J
    Nanotechnology; 2009 Jun; 20(24):245703. PubMed ID: 19471079
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Error Analysis of the Combined-Scan High-Speed Atomic Force Microscopy.
    Liu L; Kong M; Wu S; Xu X; Wang D
    Sensors (Basel); 2021 Sep; 21(18):. PubMed ID: 34577346
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Components for high speed atomic force microscopy.
    Fantner GE; Schitter G; Kindt JH; Ivanov T; Ivanova K; Patel R; Holten-Andersen N; Adams J; Thurner PJ; Rangelow IW; Hansma PK
    Ultramicroscopy; 2006; 106(8-9):881-7. PubMed ID: 16730410
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Software for drift compensation, particle tracking and particle analysis of high-speed atomic force microscopy image series.
    Husain M; Boudier T; Paul-Gilloteaux P; Casuso I; Scheuring S
    J Mol Recognit; 2012 May; 25(5):292-8. PubMed ID: 22528191
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Opportunities in high-speed atomic force microscopy.
    Brown BP; Picco L; Miles MJ; Faul CF
    Small; 2013 Oct; 9(19):3201-11. PubMed ID: 23609982
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Note: A novel atomic force microscope fast imaging approach: variable-speed scanning.
    Zhang Y; Fang Y; Yu J; Dong X
    Rev Sci Instrum; 2011 May; 82(5):056103. PubMed ID: 21639551
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Robust atomic force microscopy using multiple sensors.
    Baranwal M; Gorugantu RS; Salapaka SM
    Rev Sci Instrum; 2016 Aug; 87(8):083704. PubMed ID: 27587128
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 8.