These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

207 related articles for article (PubMed ID: 29446630)

  • 1. Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric Material.
    Schroeder U; Richter C; Park MH; Schenk T; Pešić M; Hoffmann M; Fengler FPG; Pohl D; Rellinghaus B; Zhou C; Chung CC; Jones JL; Mikolajick T
    Inorg Chem; 2018 Mar; 57(5):2752-2765. PubMed ID: 29446630
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Ferroelectricity and antiferroelectricity of doped thin HfO2-based films.
    Park MH; Lee YH; Kim HJ; Kim YJ; Moon T; Kim KD; Müller J; Kersch A; Schroeder U; Mikolajick T; Hwang CS
    Adv Mater; 2015 Mar; 27(11):1811-31. PubMed ID: 25677113
    [TBL] [Abstract][Full Text] [Related]  

  • 3. The flexoelectric effect in Al-doped hafnium oxide.
    Celano U; Popovici M; Florent K; Lavizzari S; Favia P; Paulussen K; Bender H; di Piazza L; Van Houdt J; Vandervorst W
    Nanoscale; 2018 May; 10(18):8471-8476. PubMed ID: 29691544
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi Diffraction.
    Lederer M; Kämpfe T; Vogel N; Utess D; Volkmann B; Ali T; Olivo R; Müller J; Beyer S; Trentzsch M; Seidel K; Eng ALM
    Nanomaterials (Basel); 2020 Feb; 10(2):. PubMed ID: 32098415
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Phase-Exchange-Driven Wake-Up and Fatigue in Ferroelectric Hafnium Zirconium Oxide Films.
    Fields SS; Smith SW; Ryan PJ; Jaszewski ST; Brummel IA; Salanova A; Esteves G; Wolfley SL; Henry MD; Davids PS; Ihlefeld JF
    ACS Appl Mater Interfaces; 2020 Jun; 12(23):26577-26585. PubMed ID: 32410447
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Improved Ferroelectric Switching Endurance of La-Doped Hf
    Chernikova AG; Kozodaev MG; Negrov DV; Korostylev EV; Park MH; Schroeder U; Hwang CS; Markeev AM
    ACS Appl Mater Interfaces; 2018 Jan; 10(3):2701-2708. PubMed ID: 29282976
    [TBL] [Abstract][Full Text] [Related]  

  • 7. The Doping Effect on the Intrinsic Ferroelectricity in Hafnium Oxide-Based Nano-Ferroelectric Devices.
    Li Z; Wei J; Meng J; Liu Y; Yu J; Wang T; Xu K; Liu P; Zhu H; Chen S; Sun QQ; Zhang DW; Chen L
    Nano Lett; 2023 May; 23(10):4675-4682. PubMed ID: 36913490
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Synergistic effect of Si concentration and distribution on ferroelectric properties optimization of Si:HfO
    Shao Y; Yang W; Wang Y; Deng Y; Liao N; Zhu B; Lin X; Jiang L; Jiang J; Yang Q; Zhong X
    J Phys Condens Matter; 2022 Aug; 34(41):. PubMed ID: 35901791
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Ultrathin Hf0.5Zr0.5O2 Ferroelectric Films on Si.
    Chernikova A; Kozodaev M; Markeev A; Negrov D; Spiridonov M; Zarubin S; Bak O; Buragohain P; Lu H; Suvorova E; Gruverman A; Zenkevich A
    ACS Appl Mater Interfaces; 2016 Mar; 8(11):7232-7. PubMed ID: 26931409
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Comprehensive study on the origin of orthorhombic phase stabilization in Gd-doped HfO
    Banerjee D; Dey CC; Kumar R; Modak B; Hazra S; Datta S; Ghosh B; Thakare SV; Jha SN; Bhattacharyya D
    Phys Chem Chem Phys; 2023 Aug; 25(32):21479-21491. PubMed ID: 37539659
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Revealing Antiferroelectric Switching and Ferroelectric Wakeup in Hafnia by Advanced Piezoresponse Force Microscopy.
    Collins L; Celano U
    ACS Appl Mater Interfaces; 2020 Sep; 12(37):41659-41665. PubMed ID: 32870659
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Superior and stable ferroelectric properties of hafnium-zirconium-oxide thin films deposited
    Kim HB; Jung M; Oh Y; Lee SW; Suh D; Ahn JH
    Nanoscale; 2021 May; 13(18):8524-8530. PubMed ID: 33908540
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Synaptic Characteristics of Atomic Layer-Deposited Ferroelectric Lanthanum-Doped HfO
    Jeon YR; Kim D; Ku B; Chung C; Choi C
    ACS Appl Mater Interfaces; 2023 Dec; ():. PubMed ID: 38041654
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Polarization-dependent electric potential distribution across nanoscale ferroelectric Hf
    Matveyev Y; Mikheev V; Negrov D; Zarubin S; Kumar A; Grimley ED; LeBeau JM; Gloskovskii A; Tsymbal EY; Zenkevich A
    Nanoscale; 2019 Nov; 11(42):19814-19822. PubMed ID: 31624822
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Engineering of Ferroelectric HfO
    Weeks SL; Pal A; Narasimhan VK; Littau KA; Chiang T
    ACS Appl Mater Interfaces; 2017 Apr; 9(15):13440-13447. PubMed ID: 28337909
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Enhancing ferroelectric performance in hafnia-based MFIS capacitor through interface passivation and bulk doping.
    Yang J; Xie Y; Zhu C; Chen S; Wei J; Liu Y; Chen M; Cao D
    Nanotechnology; 2024 Mar; 35(23):. PubMed ID: 38430571
    [TBL] [Abstract][Full Text] [Related]  

  • 17. A perspective on the physical scaling down of hafnia-based ferroelectrics.
    Park JY; Lee DH; Park GH; Lee J; Lee Y; Park MH
    Nanotechnology; 2023 Feb; 34(20):. PubMed ID: 36745914
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Ferroelectricity in Hf
    Chouprik A; Zakharchenko S; Spiridonov M; Zarubin S; Chernikova A; Kirtaev R; Buragohain P; Gruverman A; Zenkevich A; Negrov D
    ACS Appl Mater Interfaces; 2018 Mar; 10(10):8818-8826. PubMed ID: 29464951
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Complex Internal Bias Fields in Ferroelectric Hafnium Oxide.
    Schenk T; Hoffmann M; Ocker J; Pešić M; Mikolajick T; Schroeder U
    ACS Appl Mater Interfaces; 2015 Sep; 7(36):20224-33. PubMed ID: 26308500
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Fatigue mechanism of yttrium-doped hafnium oxide ferroelectric thin films fabricated by pulsed laser deposition.
    Huang F; Chen X; Liang X; Qin J; Zhang Y; Huang T; Wang Z; Peng B; Zhou P; Lu H; Zhang L; Deng L; Liu M; Liu Q; Tian H; Bi L
    Phys Chem Chem Phys; 2017 Feb; 19(5):3486-3497. PubMed ID: 27924320
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 11.