These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
108 related articles for article (PubMed ID: 30307015)
1. Near interface ionic transport in oxygen vacancy stabilized cubic zirconium oxide thin films. Raza M; Sanna S; Dos Santos Gómez L; Gautron E; El Mel AA; Pryds N; Snyders R; Konstantinidis S; Esposito V Phys Chem Chem Phys; 2018 Nov; 20(41):26068-26071. PubMed ID: 30307015 [TBL] [Abstract][Full Text] [Related]
2. Oxygen vacancy mediated cubic phase stabilization at room temperature in pure nano-crystalline zirconia films: a combined experimental and first-principles based investigation. Kalita P; Saini S; Rajput P; Jha SN; Bhattacharyya D; Ojha S; Avasthi DK; Bhattacharya S; Ghosh S Phys Chem Chem Phys; 2019 Oct; 21(40):22482-22490. PubMed ID: 31588473 [TBL] [Abstract][Full Text] [Related]
3. The growth of ultra-thin zirconia films on Pd(3)Zr(0 0 0 1). Choi JI; Mayr-Schmölzer W; Mittendorfer F; Redinger J; Diebold U; Schmid M J Phys Condens Matter; 2014 Jun; 26(22):225003. PubMed ID: 24823813 [TBL] [Abstract][Full Text] [Related]
4. Modification of properties of yttria stabilized zirconia epitaxial thin films by excimer laser annealing. Bayati R; Molaei R; Richmond A; Nori S; Wu F; Kumar D; Narayan J; Reynolds JG; Reynolds CL ACS Appl Mater Interfaces; 2014 Dec; 6(24):22316-25. PubMed ID: 25474124 [TBL] [Abstract][Full Text] [Related]
5. Effects of Oxygen Partial Pressure and Substrate Temperature on the Structure and Morphology of Sc and Y Co-Doped ZrO Rabo JR; Takayanagi M; Tsuchiya T; Nakajima H; Terabe K; Cervera RBM Materials (Basel); 2022 Jan; 15(2):. PubMed ID: 35057125 [TBL] [Abstract][Full Text] [Related]
6. Fabrication of hydroxyapatite thin films on zirconia using a sputtering technique. Ozeki K; Goto T; Aoki H; Masuzawa T Biomed Mater Eng; 2014; 24(5):1793-802. PubMed ID: 25201393 [TBL] [Abstract][Full Text] [Related]
7. Defect interactions and ionic transport in scandia stabilized zirconia. Devanathan R; Thevuthasan S; Gale JD Phys Chem Chem Phys; 2009 Jul; 11(26):5506-11. PubMed ID: 19551221 [TBL] [Abstract][Full Text] [Related]
8. First principles study of segregation to the Σ5(310) grain boundary of cubic zirconia. Marinopoulos AG J Phys Condens Matter; 2011 Mar; 23(8):085005. PubMed ID: 21411898 [TBL] [Abstract][Full Text] [Related]
9. Interface proximity effects on ionic conductivity in nanoscale oxide-ion conducting yttria stabilized zirconia: an atomistic simulation study. Sankaranarayanan SK; Ramanathan S J Chem Phys; 2011 Feb; 134(6):064703. PubMed ID: 21322717 [TBL] [Abstract][Full Text] [Related]
11. Probing vacancy behavior across complex oxide heterointerfaces. Zhu J; Lee JW; Lee H; Xie L; Pan X; De Souza RA; Eom CB; Nonnenmann SS Sci Adv; 2019 Feb; 5(2):eaau8467. PubMed ID: 30801011 [TBL] [Abstract][Full Text] [Related]
12. Interfacial control of oxygen vacancy doping and electrical conduction in thin film oxide heterostructures. Veal BW; Kim SK; Zapol P; Iddir H; Baldo PM; Eastman JA Nat Commun; 2016 Jun; 7():11892. PubMed ID: 27283250 [TBL] [Abstract][Full Text] [Related]
13. Ionic Conductivity of Mesostructured Yttria-Stabilized Zirconia Thin Films with Cubic Pore Symmetry—On the Influence of Water on the Surface Oxygen Ion Transport. Elm MT; Hofmann JD; Suchomski C; Janek J; Brezesinski T ACS Appl Mater Interfaces; 2015 Jun; 7(22):11792-801. PubMed ID: 25984884 [TBL] [Abstract][Full Text] [Related]
14. Atomic Resolution Imaging of Nanoscale Chemical Expansion in Pr Swallow JG; Lee JK; Defferriere T; Hughes GM; Raja SN; Tuller HL; Warner JH; Van Vliet KJ ACS Nano; 2018 Feb; 12(2):1359-1372. PubMed ID: 29338198 [TBL] [Abstract][Full Text] [Related]
15. Growth and characterisation of zirconia surfaces on Cu(111). Paulidou A; Nix RM Phys Chem Chem Phys; 2005 Apr; 7(7):1482-9. PubMed ID: 19787972 [TBL] [Abstract][Full Text] [Related]
16. Structure of superconducting thin films of YBa2Cu3O7-x grown on SrTiO3 and cubic zirconia. Tietz LA; De Cooman BC; Carter CB; Lathrop DK; Russek SE; Buhrman RA J Electron Microsc Tech; 1988 Mar; 8(3):263-72. PubMed ID: 3246617 [TBL] [Abstract][Full Text] [Related]