These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

359 related articles for article (PubMed ID: 30537672)

  • 21. Revealing local variations in nanoparticle size distributions in supported catalysts: a generic TEM specimen preparation method.
    Pingel T; Skoglundh M; Grönbeck H; Olsson E
    J Microsc; 2015 Nov; 260(2):125-32. PubMed ID: 26139081
    [TBL] [Abstract][Full Text] [Related]  

  • 22. The correlation between ion beam/material interactions and practical FIB specimen preparation.
    Prenitzer BI; Urbanik-Shannon CA; Giannuzzi LA; Brown SR; Irwin RB; Shofner TL; Stevie FA
    Microsc Microanal; 2003 Jun; 9(3):216-36. PubMed ID: 12807673
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a Dedicated Focused Ion Beam System.
    Yaguchi T; Kamino T; Ishitani T; Urao R
    Microsc Microanal; 1999 Sep; 5(5):365-370. PubMed ID: 10473682
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy.
    Giannuzzi LA; Phifer D; Giannuzzi NJ; Capuano MJ
    J Oral Maxillofac Surg; 2007 Apr; 65(4):737-47. PubMed ID: 17368372
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Multi-scale characterization by FIB-SEM/TEM/3DAP.
    Ohkubo T; Sepehri-Amin H; Sasaki TT; Hono K
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i6-i7. PubMed ID: 25359845
    [TBL] [Abstract][Full Text] [Related]  

  • 26. In situ lift-out dedicated techniques using FIB-SEM system for TEM specimen preparation.
    Tomus D; Ng HP
    Micron; 2013 Jan; 44():115-9. PubMed ID: 22664233
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Layer-by-layer thinning of two-dimensional MoS2 films by using a focused ion beam.
    Wang D; Wang Y; Chen X; Zhu Y; Zhan K; Cheng H; Wang X
    Nanoscale; 2016 Feb; 8(7):4107-12. PubMed ID: 26821788
    [TBL] [Abstract][Full Text] [Related]  

  • 28. TEM sample preparation by FIB for carbon nanotube interconnects.
    Ke X; Bals S; Romo Negreira A; Hantschel T; Bender H; Van Tendeloo G
    Ultramicroscopy; 2009 Oct; 109(11):1353-9. PubMed ID: 19665846
    [TBL] [Abstract][Full Text] [Related]  

  • 29. 3D imaging of cells and tissues by focused ion beam/scanning electron microscopy (FIB/SEM).
    Drobne D
    Methods Mol Biol; 2013; 950():275-92. PubMed ID: 23086881
    [TBL] [Abstract][Full Text] [Related]  

  • 30. FIB plan and side view cross-sectional TEM sample preparation of nanostructures.
    Lenrick F; Ek M; Jacobsson D; Borgström MT; Wallenberg LR
    Microsc Microanal; 2014 Feb; 20(1):133-40. PubMed ID: 24229472
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Fabrication of high quality plan-view TEM specimens using the focused ion beam.
    O'Shea KJ; McGrouther D; Ferguson CA; Jungbauer M; Hühn S; Moshnyaga V; MacLaren DA
    Micron; 2014 Nov; 66():9-15. PubMed ID: 25080271
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Investigation of resins suitable for the preparation of biological sample for 3-D electron microscopy.
    Kizilyaprak C; Longo G; Daraspe J; Humbel BM
    J Struct Biol; 2015 Feb; 189(2):135-46. PubMed ID: 25433274
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel.
    Yaguchi T; Matsumoto H; Kamino T; Ishitani T; Urao R
    Microsc Microanal; 2001 May; 7(3):287-291. PubMed ID: 12597819
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Focused ion beam scanning electron microscopy in biology.
    Kizilyaprak C; Daraspe J; Humbel BM
    J Microsc; 2014 Jun; 254(3):109-14. PubMed ID: 24707797
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography.
    Prosa TJ; Larson DJ
    Microsc Microanal; 2017 Apr; 23(2):194-209. PubMed ID: 28162119
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments.
    Vijayan S; Jinschek JR; Kujawa S; Greiser J; Aindow M
    Microsc Microanal; 2017 Aug; 23(4):708-716. PubMed ID: 28578727
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling.
    Sasaki H; Matsuda T; Kato T; Muroga T; Iijima Y; Saitoh T; Iwase F; Yamada Y; Izumi T; Shiohara Y; Hirayama T
    J Electron Microsc (Tokyo); 2004; 53(5):497-500. PubMed ID: 15582954
    [TBL] [Abstract][Full Text] [Related]  

  • 38. The focused ion beam fold-out: sample preparation method for transmission electron microscopy.
    Floresca HC; Jeon J; Wang JG; Kim MJ
    Microsc Microanal; 2009 Dec; 15(6):558-63. PubMed ID: 19804654
    [TBL] [Abstract][Full Text] [Related]  

  • 39. A new method for preparing plan-view TEM specimen of multilayered films using focused ion beam.
    Kato T; Muroga T; Iijima Y; Saitoh T; Yamada Y; Izumi T; Shiohara Y; Hirayama T; Ikuhara Y
    J Electron Microsc (Tokyo); 2004; 53(5):501-4. PubMed ID: 15582955
    [TBL] [Abstract][Full Text] [Related]  

  • 40. An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB.
    Zhong XL; Haigh SJ; Zhou X; Withers PJ
    Ultramicroscopy; 2020 Dec; 219():113135. PubMed ID: 33129062
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 18.