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12. Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events. Russo ED; Blum I; Houard J; Gilbert M; Da Costa G; Blavette D; Rigutti L Ultramicroscopy; 2018 Apr; 187():126-134. PubMed ID: 29454890 [TBL] [Abstract][Full Text] [Related]
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