These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
183 related articles for article (PubMed ID: 30843044)
1. Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller. Shimada Y; Yoshida K; Inoue K; Shiraishi T; Kiguchi T; Nagai Y; Konno TJ Microscopy (Oxf); 2019 Jun; 68(3):271-278. PubMed ID: 30843044 [TBL] [Abstract][Full Text] [Related]
2. Thermally Induced Dynamics of Dislocations in Graphene at Atomic Resolution. Gong C; Robertson AW; He K; Lee GD; Yoon E; Allen CS; Kirkland AI; Warner JH ACS Nano; 2015 Oct; 9(10):10066-75. PubMed ID: 26461042 [TBL] [Abstract][Full Text] [Related]
3. Key factors for the dynamic ETEM observation of single atoms. Yoshida K; Tominaga T; Hanatani T; Tagami A; Sasaki Y; Yamasaki J; Saitoh K; Tanaka N Microscopy (Oxf); 2013 Dec; 62(6):571-82. PubMed ID: 23772052 [TBL] [Abstract][Full Text] [Related]
5. Crystallization of TiO₂ Nanotubes by In Situ Heating TEM. Casu A; Lamberti A; Stassi S; Falqui A Nanomaterials (Basel); 2018 Jan; 8(1):. PubMed ID: 29342894 [TBL] [Abstract][Full Text] [Related]
6. Direct observation of the initial process of Ostwald ripening using spherical aberration-corrected transmission electron microscopy. Yoshida K; Bright A; Tanaka N J Electron Microsc (Tokyo); 2012 Apr; 61(2):99-103. PubMed ID: 22366031 [TBL] [Abstract][Full Text] [Related]
7. Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability. van Omme JT; Zakhozheva M; Spruit RG; Sholkina M; Pérez Garza HH Ultramicroscopy; 2018 Sep; 192():14-20. PubMed ID: 29802911 [TBL] [Abstract][Full Text] [Related]
8. Customizable in situ TEM devices fabricated in freestanding membranes by focused ion beam milling. Lei A; Petersen DH; Booth TJ; Homann LV; Kallesoe C; Sukas OS; Gyrsting Y; Molhave K; Boggild P Nanotechnology; 2010 Oct; 21(40):405304. PubMed ID: 20829573 [TBL] [Abstract][Full Text] [Related]
9. Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale. Gai PL; Yoshida K; Shute C; Jia X; Walsh M; Ward M; Dresselhaus MS; Weertman JR; Boyes ED Microsc Res Tech; 2011 Jul; 74(7):664-70. PubMed ID: 20954265 [TBL] [Abstract][Full Text] [Related]
10. Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments. Vijayan S; Jinschek JR; Kujawa S; Greiser J; Aindow M Microsc Microanal; 2017 Aug; 23(4):708-716. PubMed ID: 28578727 [TBL] [Abstract][Full Text] [Related]
11. Development of in situ optical spectroscopy with high temporal resolution in an aberration-corrected transmission electron microscope. Liu C; Ma C; Xu J; Qiao R; Sun H; Li X; Xu Z; Gao P; Wang E; Liu K; Bai X Rev Sci Instrum; 2021 Jan; 92(1):013704. PubMed ID: 33514196 [TBL] [Abstract][Full Text] [Related]
12. Focused Ion Beam Interfaced with a 200 keV Transmission Electron Microscope for In Situ Micropatterning on Semiconductors. Tanaka M; Furuya K; Saito T Microsc Microanal; 1998 May; 4(3):207-217. PubMed ID: 9767657 [TBL] [Abstract][Full Text] [Related]
13. The Relationships of Microscopic Evolution to Resistivity Variation of a FIB-Deposited Platinum Interconnector. Zhong C; Qi R; Zheng Y; Cheng Y; Song W; Huang R Micromachines (Basel); 2020 Jun; 11(6):. PubMed ID: 32545476 [TBL] [Abstract][Full Text] [Related]
14. Advanced preparation of plan-view specimens on a MEMS chip for Minenkov A; Šantić N; Truglas T; Aberl J; Vukušić L; Brehm M; Groiss H MRS Bull; 2022; 47(4):359-370. PubMed ID: 35968543 [TBL] [Abstract][Full Text] [Related]
15. Chemistry and Structure of Graphene Oxide via Direct Imaging. Dave SH; Gong C; Robertson AW; Warner JH; Grossman JC ACS Nano; 2016 Aug; 10(8):7515-22. PubMed ID: 27397115 [TBL] [Abstract][Full Text] [Related]
16. Advances in atomic resolution in situ environmental transmission electron microscopy and 1A aberration corrected in situ electron microscopy. Gai PL; Boyes ED Microsc Res Tech; 2009 Mar; 72(3):153-64. PubMed ID: 19140163 [TBL] [Abstract][Full Text] [Related]
17. Quantification of extreme thermal gradients during in situ transmission electron microscope heating experiments. Vijayan S; Wang R; Kong Z; Jinschek JR Microsc Res Tech; 2022 Apr; 85(4):1527-1537. PubMed ID: 34897877 [TBL] [Abstract][Full Text] [Related]
18. An in situ heating TEM analysis method for an interface reaction. Tanigaki T; Ito K; Nagakubo Y; Asakawa T; Kanemura T J Electron Microsc (Tokyo); 2009 Oct; 58(5):281-7. PubMed ID: 19376815 [TBL] [Abstract][Full Text] [Related]
19. Atomic imaging in aberration-corrected high-resolution transmission electron microscopy. Chen JH; Zandbergen HW; Dyck DV Ultramicroscopy; 2004 Jan; 98(2-4):81-97. PubMed ID: 15046789 [TBL] [Abstract][Full Text] [Related]
20. In Situ Thermal Annealing Transmission Electron Microscopy (TEM) Investigation of III/V Semiconductor Heterostructures Using a Setup for Safe Usage of Toxic and Pyrophoric Gases. Straubinger R; Beyer A; Ochs T; Stolz W; Volz K Microsc Microanal; 2017 Aug; 23(4):751-757. PubMed ID: 28784198 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]