These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

88 related articles for article (PubMed ID: 30925261)

  • 1. Fourier optics of image formation in aberration-corrected LEEM.
    Yu KM; Lau KLW; Altman MS
    Ultramicroscopy; 2019 May; 200():160-168. PubMed ID: 30925261
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Comparing Fourier optics and contrast transfer function modeling of image formation in low energy electron microscopy.
    Yu KM; Locatelli A; Altman MS
    Ultramicroscopy; 2017 Dec; 183():109-116. PubMed ID: 28366353
    [TBL] [Abstract][Full Text] [Related]  

  • 3. A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM.
    Schramm SM; Pang AB; Altman MS; Tromp RM
    Ultramicroscopy; 2012 Apr; 115():88-108. PubMed ID: 22209472
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Defocus in cathode lens instruments.
    Tromp RM; Altman MS
    Ultramicroscopy; 2017 Dec; 183():2-7. PubMed ID: 28256280
    [TBL] [Abstract][Full Text] [Related]  

  • 5. High order phase contrast and source divergence in low energy electron microscopy.
    Yu L; Wan W; Yu KM; Altman M; Tang WX
    Ultramicroscopy; 2021 Jun; 225():113284. PubMed ID: 33872959
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Fourier optics of image formation in LEEM.
    Pang AB; Müller T; Altman MS; Bauer E
    J Phys Condens Matter; 2009 Aug; 21(31):314006. PubMed ID: 21828567
    [TBL] [Abstract][Full Text] [Related]  

  • 7. A monochromatic, aberration-corrected, dual-beam low energy electron microscope.
    Mankos M; Shadman K
    Ultramicroscopy; 2013 Jul; 130():13-28. PubMed ID: 23582636
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Progress toward an aberration-corrected low energy electron microscope for DNA sequencing and surface analysis.
    Mankos M; Shadman K; N'diaye AT; Schmid AK; Persson HH; Davis RW
    J Vac Sci Technol B Nanotechnol Microelectron; 2012 Nov; 30(6):6F402. PubMed ID: 23847748
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources.
    Wan W; Yu L; Zhu L; Yang X; Wei Z; Liu JZ; Feng J; Kunze K; Schaff O; Tromp R; Tang WX
    Ultramicroscopy; 2017 Mar; 174():89-96. PubMed ID: 28063340
    [TBL] [Abstract][Full Text] [Related]  

  • 10. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.
    Tromp RM; Hannon JB; Ellis AW; Wan W; Berghaus A; Schaff O
    Ultramicroscopy; 2010 Jun; 110(7):852-61. PubMed ID: 20395048
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Optimization and stability of the contrast transfer function in aberration-corrected electron microscopy.
    Tromp RM; Schramm SM
    Ultramicroscopy; 2013 Feb; 125():72-80. PubMed ID: 23314476
    [TBL] [Abstract][Full Text] [Related]  

  • 12. LEEM image phase contrast of MnAs stripes.
    Pang AB; Pavlovska A; Däweritz L; Locatelli A; Bauer E; Altman MS
    Ultramicroscopy; 2013 Jul; 130():7-12. PubMed ID: 23571091
    [TBL] [Abstract][Full Text] [Related]  

  • 13. A novel low energy electron microscope for DNA sequencing and surface analysis.
    Mankos M; Shadman K; Persson HH; N'Diaye AT; Schmid AK; Davis RW
    Ultramicroscopy; 2014 Oct; 145():36-49. PubMed ID: 24524867
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Emission microscopy and related techniques: resolution in photoelectron microscopy, low energy electron microscopy and mirror electron microscopy.
    Rempfer GF; Griffith OH
    Ultramicroscopy; 1992 Nov; 47(1-3):35-54. PubMed ID: 1481280
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Phase retrieval low energy electron microscopy.
    Yu RP; Kennedy SM; Paganin DM; Jesson DE
    Micron; 2010 Apr; 41(3):232-8. PubMed ID: 20015655
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Measuring chromatic aberration in LEEM/PEEM.
    Tromp RM
    Ultramicroscopy; 2019 Apr; 199():46-49. PubMed ID: 30772717
    [TBL] [Abstract][Full Text] [Related]  

  • 17. CryoEM single particle reconstruction with a complex-valued particle stack.
    Bromberg R; Guo Y; Borek D; Otwinowski Z
    J Struct Biol; 2023 Jun; 215(2):107945. PubMed ID: 36889560
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Apodized coherent transfer function constraint for partially coherent Fourier ptychographic microscopy.
    Chen X; Zhu Y; Sun M; Li D; Mu Q; Xuan L
    Opt Express; 2019 May; 27(10):14099-14111. PubMed ID: 31163863
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis.
    de Jong TA; Kok DNL; van der Torren AJH; Schopmans H; Tromp RM; van der Molen SJ; Jobst J
    Ultramicroscopy; 2020 Jun; 213():112913. PubMed ID: 32389485
    [TBL] [Abstract][Full Text] [Related]  

  • 20. A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results.
    Tromp RM; Hannon JB; Wan W; Berghaus A; Schaff O
    Ultramicroscopy; 2013 Apr; 127():25-39. PubMed ID: 22925736
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 5.