These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

173 related articles for article (PubMed ID: 30959338)

  • 21. Towards a full retrieval of the deformation tensor F using convergent beam electron diffraction.
    Martin Y; Rouviere JL; Zuo JM; Favre-Nicolin V
    Ultramicroscopy; 2016 Jan; 160():64-73. PubMed ID: 26452193
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Modelling dynamical 3D electron diffraction intensities. II. The role of inelastic scattering.
    Mendis B
    Acta Crystallogr A Found Adv; 2024 Mar; 80(Pt 2):178-188. PubMed ID: 38270201
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Using the Hough transform for HOLZ line identification in convergent beam electron diffraction.
    Krämer S; Mayer J
    J Microsc; 1999 Apr; 194(1):2-11. PubMed ID: 10320535
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Development of splitting convergent beam electron diffraction (SCBED).
    Houdellier F; Röder F; Snoeck E
    Ultramicroscopy; 2015 Dec; 159 Pt 1():59-66. PubMed ID: 26319180
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Kikuchi pattern simulations of backscattered and transmitted electrons.
    Winkelmann A; Nolze G; Cios G; Tokarski T; Bała P; Hourahine B; Trager-Cowan C
    J Microsc; 2021 Nov; 284(2):157-184. PubMed ID: 34275156
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Crystal structure refinement using Bloch-wave method for precession electron diffraction.
    Dudka AP; Avilov AS; Nicolopoulos S
    Ultramicroscopy; 2007; 107(6-7):474-82. PubMed ID: 17222976
    [TBL] [Abstract][Full Text] [Related]  

  • 27. A new electron diffraction approach for structure refinement applied to Ca
    Beanland R; Smith K; Vaněk P; Zhang H; Hubert A; Evans K; Römer RA; Kamba S
    Acta Crystallogr A Found Adv; 2021 May; 77(Pt 3):196-207. PubMed ID: 33944798
    [TBL] [Abstract][Full Text] [Related]  

  • 28. An algorithm for refinement of lattice parameters using CBED patterns.
    Morawiec A
    Ultramicroscopy; 2007; 107(4-5):390-5. PubMed ID: 17123736
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Progress toward structure determination.
    Gjønnes J; Olsen A; Matsuhata H
    J Electron Microsc Tech; 1989 Oct; 13(2):98-110. PubMed ID: 2809771
    [TBL] [Abstract][Full Text] [Related]  

  • 30.
    Shi HL; Li ZA
    IUCrJ; 2021 Sep; 8(Pt 5):805-813. PubMed ID: 34584741
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Charge density determination in icosahedral AlPdMn quasicrystal using quantitative convergent beam electron diffraction.
    Yu F; Zou H; Wang J; Wang R
    Micron; 2004; 35(6):411-8. PubMed ID: 15120124
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data.
    Müller K; Schowalter M; Jansen J; Tsuda K; Titantah J; Lamoen D; Rosenauer A
    Ultramicroscopy; 2009 Jun; 109(7):802-14. PubMed ID: 19386419
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Primitive unit cell volumes obtained from unindexed convergent-beam electron diffraction patterns.
    Le Page Y; Downham DA
    J Electron Microsc Tech; 1991 Aug; 18(4):437-9. PubMed ID: 1919797
    [TBL] [Abstract][Full Text] [Related]  

  • 34. The quantitative characterization of SiGe layers by analysing rocking profiles in CBED patterns.
    Zipprich J; Füller T; Banhart F; Schmidt OG; Eberl K
    J Microsc; 1999 Apr; 194(1):12-20. PubMed ID: 10320536
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon.
    Winkelmann A; Nolze G
    Ultramicroscopy; 2010 Feb; 110(3):190-4. PubMed ID: 20005045
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Ab initio structure determination of interlayer expanded zeolites by single crystal rotation electron diffraction.
    Guo P; Liu L; Yun Y; Su J; Wan W; Gies H; Zhang H; Xiao FS; Zou X
    Dalton Trans; 2014 Jul; 43(27):10593-601. PubMed ID: 24809825
    [TBL] [Abstract][Full Text] [Related]  

  • 37. HOLZ line analysis of lattice parameters in magnesium alloys.
    Rossouw CJ; Venkatesan K
    J Electron Microsc (Tokyo); 2001; 50(5):391-404. PubMed ID: 11794614
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Self-interference of split HOLZ line (SIS-HOLZ) for z-dependent atomic displacement measurement: Theoretical discussion.
    Norouzpour M; Rakhsha R; Herring R
    Micron; 2017 Jun; 97():68-77. PubMed ID: 28371643
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Pawley and Rietveld refinements using electron diffraction from L1₂-type intermetallic Au₃Fe₁-x nanocrystals during their in-situ order-disorder transition.
    Luo Z; Vasquez Y; Bondi JF; Schaak RE
    Ultramicroscopy; 2011 Jul; 111(8):1295-304. PubMed ID: 21864770
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Application of X-ray Diffraction and Electron Crystallography for Solving Complex Structure Problems.
    Li J; Sun J
    Acc Chem Res; 2017 Nov; 50(11):2737-2745. PubMed ID: 29091406
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 9.