These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
141 related articles for article (PubMed ID: 31005819)
21. The effect of post-sintering heat treatments on the fatigue properties of porous coated Ti-6Al-4V alloy. Cook SD; Thongpreda N; Anderson RC; Haddad RJ J Biomed Mater Res; 1988 Apr; 22(4):287-302. PubMed ID: 3372550 [TBL] [Abstract][Full Text] [Related]
22. An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy. Uzuhashi J; Ohkubo T; Hono K Microsc Microanal; 2024 Mar; ():. PubMed ID: 38442209 [TBL] [Abstract][Full Text] [Related]
23. [Comparison of surface characteristics and cytocompatibility of Ti-6Al-4V alloy fabricated with select laser melting and electron beam melting]. Zhao BJ; Wang H; Yan RZ; Wang C; Li RX; Hu M Zhonghua Kou Qiang Yi Xue Za Zhi; 2016 Dec; 51(12):753-757. PubMed ID: 27978917 [No Abstract] [Full Text] [Related]
24. Direct Observation of PFIB-Induced Clustering in Precipitation-Strengthened Al Alloys by Atom Probe Tomography. Tweddle D; Johnson JA; Kapoor M; Mileski S; Carsley JE; Thompson GB Microsc Microanal; 2022 Jan; ():1-6. PubMed ID: 35067265 [TBL] [Abstract][Full Text] [Related]
25. Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography. Rice KP; Chen Y; Prosa TJ; Larson DJ Microsc Microanal; 2016 Jun; 22(3):583-8. PubMed ID: 27329309 [TBL] [Abstract][Full Text] [Related]
26. A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT). Kim SH; Kang PW; Park OO; Seol JB; Ahn JP; Lee JY; Choi PP Ultramicroscopy; 2018 Jul; 190():30-38. PubMed ID: 29680520 [TBL] [Abstract][Full Text] [Related]
27. Preparation of nanowire specimens for laser-assisted atom probe tomography. Blumtritt H; Isheim D; Senz S; Seidman DN; Moutanabbir O Nanotechnology; 2014 Oct; 25(43):435704. PubMed ID: 25299058 [TBL] [Abstract][Full Text] [Related]
28. Theory and New Applications of Ex Situ Lift Out. Giannuzzi LA; Yu Z; Yin D; Harmer MP; Xu Q; Smith NS; Chan L; Hiller J; Hess D; Clark T Microsc Microanal; 2015 Aug; 21(4):1034-48. PubMed ID: 26223551 [TBL] [Abstract][Full Text] [Related]
29. In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam. Douglas JO; Conroy M; Giuliani F; Gault B Microsc Microanal; 2023 Jun; 29(3):1009-1017. PubMed ID: 37749683 [TBL] [Abstract][Full Text] [Related]
30. Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples. Liu J; Niu R; Gu J; Cabral M; Song M; Liao X Sci Rep; 2020 Jun; 10(1):10324. PubMed ID: 32587335 [TBL] [Abstract][Full Text] [Related]
31. Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing. Tkadletz M; Waldl H; Schiester M; Lechner A; Schusser G; Krause M; Schalk N Ultramicroscopy; 2023 Apr; 246():113672. PubMed ID: 36586198 [TBL] [Abstract][Full Text] [Related]
32. A Versatile and Reproducible Cryo-sample Preparation Methodology for Atom Probe Studies. Woods EV; Singh MP; Kim SH; Schwarz TM; Douglas JO; El-Zoka AA; Giulani F; Gault B Microsc Microanal; 2023 Dec; 29(6):1992-2003. PubMed ID: 37856778 [TBL] [Abstract][Full Text] [Related]
33. In situ site-specific specimen preparation for atom probe tomography. Thompson K; Lawrence D; Larson DJ; Olson JD; Kelly TF; Gorman B Ultramicroscopy; 2007; 107(2-3):131-9. PubMed ID: 16938398 [TBL] [Abstract][Full Text] [Related]
34. In situ lift-out dedicated techniques using FIB-SEM system for TEM specimen preparation. Tomus D; Ng HP Micron; 2013 Jan; 44():115-9. PubMed ID: 22664233 [TBL] [Abstract][Full Text] [Related]
35. Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM. Uzuhashi J; Ohkubo T; Hono K Ultramicroscopy; 2023 May; 247():113704. PubMed ID: 36822070 [TBL] [Abstract][Full Text] [Related]
36. Cross-shaped markers for the preparation of site-specific transmission electron microscopy lamellae using focused ion beam techniques. O'Hanlon TJ; Bao A; Massabuau FC; Kappers MJ; Oliver RA Ultramicroscopy; 2020 May; 212():112970. PubMed ID: 32114315 [TBL] [Abstract][Full Text] [Related]
37. Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach. Allen FI; Blanchard PT; Lake R; Pappas D; Xia D; Notte JA; Zhang R; Minor AM; Sanford NA Microsc Microanal; 2023 Sep; 29(5):1628-1638. PubMed ID: 37584510 [TBL] [Abstract][Full Text] [Related]
38. A reproducible method for damage-free site-specific preparation of atom probe tips from interfaces. Felfer PJ; Alam T; Ringer SP; Cairney JM Microsc Res Tech; 2012 Apr; 75(4):484-91. PubMed ID: 21956865 [TBL] [Abstract][Full Text] [Related]
39. A versatile cryo-transfer system, connecting cryogenic focused ion beam sample preparation to atom probe microscopy. Macauley C; Heller M; Rausch A; Kümmel F; Felfer P PLoS One; 2021; 16(1):e0245555. PubMed ID: 33465106 [TBL] [Abstract][Full Text] [Related]
40. Grain boundary study of technically pure molybdenum by combining APT and TKD. Babinsky K; Knabl W; Lorich A; De Kloe R; Clemens H; Primig S Ultramicroscopy; 2015 Dec; 159 Pt 2():445-51. PubMed ID: 26025208 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]