These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
2. Absolute measurement of F2-laser power at 157 nm. Kück S; Brandt F; Kremling HA; Gottwald A; Hoehl A; Richter M Appl Opt; 2006 May; 45(14):3325-30. PubMed ID: 16676038 [TBL] [Abstract][Full Text] [Related]
3. Photon-counting-based optical frequency metrology. Ferreira da Silva T Appl Opt; 2020 Dec; 59(36):11232-11239. PubMed ID: 33362044 [TBL] [Abstract][Full Text] [Related]
4. Calibration of Displacement Laser Interferometer Systems for Industrial Metrology. Haitjema H Sensors (Basel); 2019 Sep; 19(19):. PubMed ID: 31546748 [TBL] [Abstract][Full Text] [Related]
5. A heterodyne straightness and displacement measuring interferometer with laser beam drift compensation for long-travel linear stage metrology. Chen B; Cheng L; Yan L; Zhang E; Lou Y Rev Sci Instrum; 2017 Mar; 88(3):035114. PubMed ID: 28372378 [TBL] [Abstract][Full Text] [Related]
6. Subnanometer absolute displacement measurement using a frequency comb referenced dual resonance tracking Fabry-Perot interferometer. Zhu M; Wei H; Zhao S; Wu X; Li Y Appl Opt; 2015 May; 54(14):4594-601. PubMed ID: 25967521 [TBL] [Abstract][Full Text] [Related]
7. A metrological large range atomic force microscope with improved performance. Dai G; Wolff H; Pohlenz F; Danzebrink HU Rev Sci Instrum; 2009 Apr; 80(4):043702. PubMed ID: 19405661 [TBL] [Abstract][Full Text] [Related]
8. Precision displacement measurement by active laser heterodyne interferometry. Lin YJ; Pan CL Appl Opt; 1991 May; 30(13):1648-52. PubMed ID: 20700338 [TBL] [Abstract][Full Text] [Related]
9. Hybrid application of laser-focused atomic deposition and extreme ultraviolet interference lithography methods for manufacturing of self-traceable nanogratings. Liu J; Zhao J; Deng X; Yang S; Xue C; Wu Y; Tai R; Hu X; Dai G; Li T; Cheng X Nanotechnology; 2021 Apr; 32(17):175301. PubMed ID: 33461181 [TBL] [Abstract][Full Text] [Related]
10. Heterodyne wavelength meter for continuous-wave lasers. Wang X; Li Y; Zhang S Appl Opt; 2007 Aug; 46(23):5631-4. PubMed ID: 17694109 [TBL] [Abstract][Full Text] [Related]
12. Calibration of a high spatial resolution laser two-color heterodyne interferometer for density profile measurements in the TJ-II stellarator. Acedo P; Pedreira P; Criado AR; Lamela H; Sánchez M; Sánchez J Rev Sci Instrum; 2008 Oct; 79(10):10E713. PubMed ID: 19044531 [TBL] [Abstract][Full Text] [Related]
13. A heterodyne interferometer for angle metrology. Hahn I; Weilert M; Wang X; Goullioud R Rev Sci Instrum; 2010 Apr; 81(4):045103. PubMed ID: 20441364 [TBL] [Abstract][Full Text] [Related]
14. Two-longitudinal-mode He-Ne laser for heterodyne interferometers to measure displacement. Kim MS; Kim SW Appl Opt; 2002 Oct; 41(28):5938-42. PubMed ID: 12371553 [TBL] [Abstract][Full Text] [Related]
19. Traceable terahertz power measurement from 1 THz to 5 THz. Steiger A; Kehrt M; Monte C; Müller R Opt Express; 2013 Jun; 21(12):14466-73. PubMed ID: 23787634 [TBL] [Abstract][Full Text] [Related]
20. A new facility for the synchrotron radiation-based calibration of transfer radiation sources in the ultraviolet and vacuum ultraviolet spectral range. Thornagel R; Fliegauf R; Klein R; Kroth S; Paustian W; Richter M Rev Sci Instrum; 2015 Jan; 86(1):013106. PubMed ID: 25638071 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]