136 related articles for article (PubMed ID: 31330942)
21. Direct measurement of TEM lamella thickness in FIB-SEM.
Conlan AP; Tillotson E; Rakowski A; Cooper D; Haigh SJ
J Microsc; 2020 Sep; 279(3):168-176. PubMed ID: 31823368
[TBL] [Abstract][Full Text] [Related]
22. Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1--Applications to accurate dimension measurements.
Postek MT; Vladár AE; Wells OC; Lowney JL
Scanning; 2001; 23(5):298-304. PubMed ID: 11587322
[TBL] [Abstract][Full Text] [Related]
23. Electron beam broadening in electron-transparent samples at low electron energies.
Hugenschmidt M; Müller E; Gerthsen D
J Microsc; 2019 Jun; 274(3):150-157. PubMed ID: 31001840
[TBL] [Abstract][Full Text] [Related]
24. Electron backscattering for signal enhancement in a thin-film CdTe radiation detector.
Akbari F; Shvydka D
Med Phys; 2022 Oct; 49(10):6654-6665. PubMed ID: 35830344
[TBL] [Abstract][Full Text] [Related]
25. Secondary electron count imaging in SEM.
Agarwal A; Simonaitis J; Goyal VK; Berggren KK
Ultramicroscopy; 2023 Mar; 245():113662. PubMed ID: 36521266
[TBL] [Abstract][Full Text] [Related]
26. Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope.
Hashimoto Y; Takeuchi S; Sunaoshi T; Yamazawa Y
Ultramicroscopy; 2020 Feb; 209():112889. PubMed ID: 31756599
[TBL] [Abstract][Full Text] [Related]
27. Formation Mechanism of Secondary Electron Contrast of Graphene Layers on a Metal Substrate.
Shihommatsu K; Takahashi J; Momiuchi Y; Hoshi Y; Kato H; Homma Y
ACS Omega; 2017 Nov; 2(11):7831-7836. PubMed ID: 31457340
[TBL] [Abstract][Full Text] [Related]
28. Signal detection and imaging methods for MEMS electron microscope.
Białas M; Grzebyk T; Krysztof M; Górecka-Drzazga A
Ultramicroscopy; 2023 Feb; 244():113653. PubMed ID: 36459864
[TBL] [Abstract][Full Text] [Related]
29. New scintillation detector of backscattered electrons for the low voltage SEM.
Wandrol P
J Microsc; 2007 Jul; 227(Pt 1):24-9. PubMed ID: 17635656
[TBL] [Abstract][Full Text] [Related]
30. Sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy setup for pulsed and constant wave X-ray light sources.
Shavorskiy A; Neppl S; Slaughter DS; Cryan JP; Siefermann KR; Weise F; Lin MF; Bacellar C; Ziemkiewicz MP; Zegkinoglou I; Fraund MW; Khurmi C; Hertlein MP; Wright TW; Huse N; Schoenlein RW; Tyliszczak T; Coslovich G; Robinson J; Kaindl RA; Rude BS; Ölsner A; Mähl S; Bluhm H; Gessner O
Rev Sci Instrum; 2014 Sep; 85(9):093102. PubMed ID: 25273702
[TBL] [Abstract][Full Text] [Related]
31. Medical X-band linear accelerator for high-precision radiotherapy.
Lee YS; Kim S; Kim GJ; Lee JH; Kim IS; Kim JI; Shin KY; Seol Y; Oh T; An NY; Lee J; Hwang J; Oh Y; Kang YN
Med Phys; 2021 Sep; 48(9):5327-5342. PubMed ID: 34224166
[TBL] [Abstract][Full Text] [Related]
32. Experimental evaluation of environmental scanning electron microscopes at high chamber pressure.
Fitzek H; Schroettner H; Wagner J; Hofer F; Rattenberger J
J Microsc; 2015 Nov; 260(2):133-9. PubMed ID: 26173072
[TBL] [Abstract][Full Text] [Related]
33. A workflow for 3D-CLEM investigating liver tissue.
Kremer A; VAN Hamme E; Bonnardel J; Borghgraef P; GuÉrin CJ; Guilliams M; Lippens S
J Microsc; 2021 Mar; 281(3):231-242. PubMed ID: 33034376
[TBL] [Abstract][Full Text] [Related]
34. Fabrication and Characterization of a High-Performance Multi-Annular Backscattered Electron Detector for Desktop SEM.
Lin WR; Chuang YJ; Lee CH; Tseng FG; Chen FR
Sensors (Basel); 2018 Sep; 18(9):. PubMed ID: 30223459
[TBL] [Abstract][Full Text] [Related]
35. A new type of scanning electron microscope using the coaxial backscattered electrons.
Jiang CZ; Morin P; Rosenberg N
Micron; 2002; 33(1):69-74. PubMed ID: 11473816
[TBL] [Abstract][Full Text] [Related]
36. Scintillation SE detector for variable pressure scanning electron microscopes.
Jirák J; Nedela V; Cernoch P; Cudek P; Runstuk J
J Microsc; 2010 Sep; 239(3):233-8. PubMed ID: 20701661
[TBL] [Abstract][Full Text] [Related]
37. Simulation for improvement of system sensitivity of radiochromic film dosimetry with different band-pass filters and scanner light intensities.
Kamomae T; Miyabe Y; Sawada A; Matoba O; Nakata M; Yano S; Takakura T; Mizowaki T; Itoh A; Hiraoka M
Radiol Phys Technol; 2011 Jul; 4(2):140-7. PubMed ID: 21409612
[TBL] [Abstract][Full Text] [Related]
38. Scintillator avalanche photoconductor with high resolution emitter readout for low dose x-ray imaging: lag.
Lia D; Zhao W; Nanba M; Egami N
Med Phys; 2009 Sep; 36(9):4047-58. PubMed ID: 19810477
[TBL] [Abstract][Full Text] [Related]
39. The Determination and Application of the Point Spread Function in the Scanning Electron Microscope.
Zotta MD; Nevins MC; Hailstone RK; Lifshin E
Microsc Microanal; 2018 Aug; 24(4):396-405. PubMed ID: 30175706
[TBL] [Abstract][Full Text] [Related]
40. Backscattered electron imaging for high resolution surface scanning electron microscopy with a new type YAG-detector.
Walther P; Autrata R; Chen Y; Pawley JB
Scanning Microsc; 1991 Jun; 5(2):301-9; discussion 310. PubMed ID: 1947922
[TBL] [Abstract][Full Text] [Related]
[Previous] [Next] [New Search]
