These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

137 related articles for article (PubMed ID: 31330942)

  • 41. Raman Scattering Study on the Influence of E-Beam Bombardment on Si Electron Lens.
    Lee GW; Lee YB; Baek DH; Kim JG; Kim HS
    Molecules; 2021 May; 26(9):. PubMed ID: 34066676
    [TBL] [Abstract][Full Text] [Related]  

  • 42. A high-resolution add-on in-lens attachment for scanning electron microscopes.
    Khursheed A; Karuppiah N; Koh SH
    Scanning; 2001; 23(3):204-10. PubMed ID: 11405306
    [TBL] [Abstract][Full Text] [Related]  

  • 43. Dual-phase steel structure visualized by extremely slow electrons.
    Mikmeková Š; Yamada K; Noro H
    Microscopy (Oxf); 2015 Dec; 64(6):437-43. PubMed ID: 26497974
    [TBL] [Abstract][Full Text] [Related]  

  • 44. A differentially pumped secondary electron detector for low-vacuum scanning electron microscopy.
    Jacka M; Zadrazil M; Lopour F
    Scanning; 2003; 25(5):243-6. PubMed ID: 14748387
    [TBL] [Abstract][Full Text] [Related]  

  • 45. Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope.
    Koh A; Khavnekar S; Yang W; Karia D; Cats D; van der Ploeg R; Grollios F; Raschdorf O; Kotecha A; Němeček D
    J Vis Exp; 2022 Mar; (181):. PubMed ID: 35377368
    [TBL] [Abstract][Full Text] [Related]  

  • 46. Spin-polarized scanning electron microscopy.
    Koike K
    Microscopy (Oxf); 2013 Feb; 62(1):177-91. PubMed ID: 23325928
    [TBL] [Abstract][Full Text] [Related]  

  • 47. Conditions required for detection of specimen-specific SE-I secondary electrons in an analytical SEM.
    Apkarian RP
    J Microsc; 1989 May; 154(Pt 2):177-88. PubMed ID: 2746638
    [TBL] [Abstract][Full Text] [Related]  

  • 48. Electron beam-induced current imaging with two-angstrom resolution.
    Mecklenburg M; Hubbard WA; Lodico JJ; Regan BC
    Ultramicroscopy; 2019 Dec; 207():112852. PubMed ID: 31678644
    [TBL] [Abstract][Full Text] [Related]  

  • 49. A Band-Pass Filter Based on Half-Mode Substrate Integrated Waveguide and Spoof Surface Plasmon Polaritons.
    Zhao L; Li Y; Chen ZM; Liang XH; Wang J; Shen X; Zhang Q
    Sci Rep; 2019 Sep; 9(1):13429. PubMed ID: 31530864
    [TBL] [Abstract][Full Text] [Related]  

  • 50. A Novel Monochromator with Offset Cylindrical Lenses and Its Application to a Low-Voltage Scanning Electron Microscope.
    Ogawa T; Yamazawa Y; Kawai S; Mouri A; Katane J; Park IY; Takai Y; Agemura T
    Microsc Microanal; 2022 Feb; ():1-13. PubMed ID: 35164889
    [TBL] [Abstract][Full Text] [Related]  

  • 51. About the role of the various types of secondary electrons (SE; SE; SE) on the performance of LVSEM.
    Cazaux J
    J Microsc; 2004 Jun; 214(Pt 3):341-7. PubMed ID: 15157201
    [TBL] [Abstract][Full Text] [Related]  

  • 52. High-resolution, low-voltage SEM for true surface imaging and analysis.
    Jaksch H; Martin JP
    Anal Bioanal Chem; 1995 Oct; 353(3-4):378-82. PubMed ID: 15048503
    [TBL] [Abstract][Full Text] [Related]  

  • 53. Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscope.
    Yoon YH; Kim SJ; Kim DH
    Microscopy (Oxf); 2015 Dec; 64(6):449-54. PubMed ID: 26371281
    [TBL] [Abstract][Full Text] [Related]  

  • 54. Conditions required for high quality high magnification images in secondary electron-I scanning electron microscopy.
    Peters KR
    Scan Electron Microsc; 1982; (Pt 4):1359-72. PubMed ID: 7184136
    [TBL] [Abstract][Full Text] [Related]  

  • 55. 3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithm.
    Borzunov AA; Karaulov VY; Koshev NA; Lukyanenko DV; Rau EI; Yagola AG; Zaitsev SV
    Ultramicroscopy; 2019 Dec; 207():112830. PubMed ID: 31494480
    [TBL] [Abstract][Full Text] [Related]  

  • 56. Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures.
    Srinivasan A; Han W; Khursheed A
    Microsc Microanal; 2018 Oct; 24(5):453-460. PubMed ID: 30277195
    [TBL] [Abstract][Full Text] [Related]  

  • 57. Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast.
    Sulyok A; Toth AL; Zommer L; Menyhard M; Jablonski A
    Ultramicroscopy; 2013 Jan; 124():88-95. PubMed ID: 23142749
    [TBL] [Abstract][Full Text] [Related]  

  • 58. A calculation approach for current density distribution evolution of secondary electrons using differential algebra method.
    Hu H; Li M; Hu J; Liu F; Kang Y
    Micron; 2024 Mar; 178():103592. PubMed ID: 38277896
    [TBL] [Abstract][Full Text] [Related]  

  • 59. Origins of material contrast in scanning ion microscope images.
    Ishitani T; Madokoro Y; Nakagawa M; Ohya K
    J Electron Microsc (Tokyo); 2002; 51(4):207-13. PubMed ID: 12227550
    [TBL] [Abstract][Full Text] [Related]  

  • 60. A systematic investigation of the charging effect in scanning electron microscopy for metal nanostructures on insulating substrates.
    Flatabø R; Coste A; Greve MM
    J Microsc; 2017 Mar; 265(3):287-297. PubMed ID: 27911467
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 7.