These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
122 related articles for article (PubMed ID: 31510353)
1. Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable range. Park J; Mori H; Jin J Opt Express; 2019 Aug; 27(17):24682-24692. PubMed ID: 31510353 [TBL] [Abstract][Full Text] [Related]
2. Vibration-insensitive measurements of the thickness profile of large glass panels. Park J; Bae J; Jin J; Kim JA; Kim JW Opt Express; 2015 Dec; 23(26):32941-9. PubMed ID: 26831961 [TBL] [Abstract][Full Text] [Related]
3. Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry. Murphy DF; Flavin DA Appl Opt; 2000 Sep; 39(25):4607-15. PubMed ID: 18350050 [TBL] [Abstract][Full Text] [Related]
4. Simultaneous thickness and group index measurement with a single arm low-coherence interferometer. Zilio SC Opt Express; 2014 Nov; 22(22):27392-7. PubMed ID: 25401888 [TBL] [Abstract][Full Text] [Related]
5. Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb. Bae J; Park J; Ahn H; Jin J Opt Express; 2017 May; 25(11):12689-12697. PubMed ID: 28786623 [TBL] [Abstract][Full Text] [Related]
6. Measurement of glass thickness and refractive index based on spectral interference technology. Xue K; Wang J; Zhao Y; Xiao Z Appl Opt; 2021 Sep; 60(26):7983-7988. PubMed ID: 34613058 [TBL] [Abstract][Full Text] [Related]
7. Optical method for simultaneous thickness measurements of two layers with a significant thickness difference. Bae J; Park J; Ahn H; Jin J Opt Express; 2021 Sep; 29(20):31615-31631. PubMed ID: 34615252 [TBL] [Abstract][Full Text] [Related]
8. Measurement of group refractive index wavelength dependence using a low-coherence tandem interferometer. Hirai A; Matsumoto H Appl Opt; 2006 Aug; 45(22):5614-20. PubMed ID: 16855658 [TBL] [Abstract][Full Text] [Related]
9. Simultaneous measurement of refractive-index and thickness for optical materials by laser feedback interferometry. Xu L; Zhang S; Tan Y; Sun L Rev Sci Instrum; 2014 Aug; 85(8):083111. PubMed ID: 25173250 [TBL] [Abstract][Full Text] [Related]
10. Simultaneous measurement of group refractive index and thickness of optical samples using optical coherence tomography. Cheng HC; Liu YC Appl Opt; 2010 Feb; 49(5):790-7. PubMed ID: 20154745 [TBL] [Abstract][Full Text] [Related]
11. Simultaneous determination of refractive index and thickness of moderately thick plane-parallel transparent glass plates using cyclic path optical configuration setup and a lateral shearing interferometer. Kumar YP; Chatterjee S Appl Opt; 2012 Jun; 51(16):3533-7. PubMed ID: 22695591 [TBL] [Abstract][Full Text] [Related]
12. Air etalon facilitated simultaneous measurement of group refractive index and thickness using spectral interferometry. Zhang K; Tao L; Cheng W; Liu J; Chen Z Appl Opt; 2014 Nov; 53(31):7483-6. PubMed ID: 25402915 [TBL] [Abstract][Full Text] [Related]
13. Precise thickness profile measurement insensitive to spatial and temporal temperature gradients on a large glass substrate. Park J; Mori H; Jang YS; Jin J Appl Opt; 2020 Jul; 59(20):5881-5887. PubMed ID: 32672730 [TBL] [Abstract][Full Text] [Related]
14. Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers. Jin J; Maeng S; Park J; Kim JA; Kim JW Opt Express; 2014 Sep; 22(19):23427-32. PubMed ID: 25321811 [TBL] [Abstract][Full Text] [Related]
15. Absolute thickness metrology with submicrometer accuracy using a low-coherence distance measuring interferometer. Zhao Y; Schmidt G; Moore DT; Ellis JD Appl Opt; 2015 Sep; 54(25):7693-700. PubMed ID: 26368894 [TBL] [Abstract][Full Text] [Related]
16. Angstrom-range optical path-length measurement with a high-speed scanning heterodyne optical interferometer. Riza NA; Arain MA Appl Opt; 2003 May; 42(13):2341-5. PubMed ID: 12737467 [TBL] [Abstract][Full Text] [Related]
17. Nonbulk motion system for simultaneously measuring the refractive index and thickness of a sample using tunable optics and spatial signal processing-based Gaussian beam imaging. Reza SA; Qasim M Appl Opt; 2016 Jan; 55(2):368-78. PubMed ID: 26835774 [TBL] [Abstract][Full Text] [Related]
18. Single tapered fiber tip for simultaneous measurements of thickness, refractive index and distance to a sample. Moreno-Hernández C; Monzón-Hernández D; Hernández-Romano I; Villatoro J Opt Express; 2015 Aug; 23(17):22141-8. PubMed ID: 26368188 [TBL] [Abstract][Full Text] [Related]
19. High-accuracy interferometer with a prism pair for measurement of the absolute refractive index of glass. Hori Y; Hirai A; Minoshima K; Matsumoto H Appl Opt; 2009 Apr; 48(11):2045-50. PubMed ID: 19363541 [TBL] [Abstract][Full Text] [Related]
20. Simultaneous film thickness and refractive index measurement using a constrained fitting method in a white light spectral interferometer. Yuan L; Guo T; Tang D; Liu H; Guo X Opt Express; 2022 Jan; 30(1):349-363. PubMed ID: 35201213 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]