These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
172 related articles for article (PubMed ID: 31614863)
1. Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing. Kunicki P; Angelov T; Ivanov T; Gotszalk T; Rangelow I Sensors (Basel); 2019 Oct; 19(20):. PubMed ID: 31614863 [TBL] [Abstract][Full Text] [Related]
2. Calibration and examination of piezoresistive Wheatstone bridge cantilevers for scanning probe microscopy. Gotszalk T; Grabiec P; Rangelow IW Ultramicroscopy; 2003; 97(1-4):385-9. PubMed ID: 12801693 [TBL] [Abstract][Full Text] [Related]
3. 3D finite element analysis of electrostatic deflection of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: I. Triangular shaped cantilevers with symmetric pyramidal tips. Valdrè G; Moro D Nanotechnology; 2008 Oct; 19(40):405501. PubMed ID: 21832617 [TBL] [Abstract][Full Text] [Related]
5. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration. Slattery AD; Blanch AJ; Quinton JS; Gibson CT Ultramicroscopy; 2013 Aug; 131():46-55. PubMed ID: 23685172 [TBL] [Abstract][Full Text] [Related]
6. Near-zero contact force atomic force microscopy investigations using active electromagnetic cantilevers. Świadkowski B; Majstrzyk W; Kunicki P; Sierakowski A; Gotszalk T Nanotechnology; 2020 Jul; 31(42):. PubMed ID: 32599567 [TBL] [Abstract][Full Text] [Related]
7. 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips. Valdrè G; Moro D Nanotechnology; 2008 Oct; 19(40):405502. PubMed ID: 21832618 [TBL] [Abstract][Full Text] [Related]
8. Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode. Biczysko P; Dzierka A; Jóźwiak G; Rudek M; Gotszalk T; Janus P; Grabiec P; Rangelow IW Ultramicroscopy; 2018 Jan; 184(Pt A):199-208. PubMed ID: 28950210 [TBL] [Abstract][Full Text] [Related]
9. Atomic force microscope cantilever calibration using a focused ion beam. Slattery AD; Quinton JS; Gibson CT Nanotechnology; 2012 Jul; 23(28):285704. PubMed ID: 22728463 [TBL] [Abstract][Full Text] [Related]
10. Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers. Slattery AD; Blanch AJ; Quinton JS; Gibson CT Nanotechnology; 2013 Jan; 24(1):015710. PubMed ID: 23220746 [TBL] [Abstract][Full Text] [Related]