These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
22. Plasma-Assisted Molecular Beam Epitaxy Growth of Mg3N2 and Zn3N2 Thin Films. Wu P; Tiedje T J Vis Exp; 2019 May; (147):. PubMed ID: 31132060 [TBL] [Abstract][Full Text] [Related]
23. Titanium oxide thin films obtained with physical and chemical vapour deposition methods for optical biosensing purposes. Dominik M; Leśniewski A; Janczuk M; Niedziółka-Jönsson J; Hołdyński M; Wachnicki Ł; Godlewski M; Bock WJ; Śmietana M Biosens Bioelectron; 2017 Jul; 93():102-109. PubMed ID: 27717731 [TBL] [Abstract][Full Text] [Related]
24. Improvement of optical properties of TiO2 thin film treated with electron beam. Shin JH; Lee BC; Woo HG; Hwang KH; Jun J J Nanosci Nanotechnol; 2013 Mar; 13(3):1951-5. PubMed ID: 23755627 [TBL] [Abstract][Full Text] [Related]
25. Titanium oxide film for the bottom antireflective layer in deep ultraviolet lithography. Jun BH; Han SS; Kim KS; Lee JS; Jiang ZT; Bae BS; No K; Kim DW; Kang HY; Koh YB Appl Opt; 1997 Mar; 36(7):1482-6. PubMed ID: 18250825 [TBL] [Abstract][Full Text] [Related]
26. Ti/TiO Kim D; Kim KM; Han H; Lee J; Ko D; Park KR; Jang KB; Kim D; Forrester JS; Lee SH; Kim JC; Mhin S Sci Rep; 2022 Jan; 12(1):32. PubMed ID: 34996994 [TBL] [Abstract][Full Text] [Related]
27. Effect of substrate overetching and heat treatment of titanium oxide waveguide gratings and thin films on their optical properties. Saleem MR; Honkanen S; Turunen J Appl Opt; 2013 Jan; 52(3):422-32. PubMed ID: 23338189 [TBL] [Abstract][Full Text] [Related]
28. Electrical and Optical Properties of CeNi5 Nanoscale Films. Todoran R; Todoran D; Racolta D; Szakács Z Nanoscale Res Lett; 2016 Dec; 11(1):253. PubMed ID: 27184966 [TBL] [Abstract][Full Text] [Related]
29. Estimation of thermal conductivity of amorphous silicon thin films from the optical reflectivity measurement. Moon SJ; Choi JH J Nanosci Nanotechnol; 2013 Sep; 13(9):6362-6. PubMed ID: 24205662 [TBL] [Abstract][Full Text] [Related]
30. Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometry. Larivière GP; Frigerio JM; Rivory J; Abelès F Appl Opt; 1992 Oct; 31(28):6056-61. PubMed ID: 20733808 [TBL] [Abstract][Full Text] [Related]
31. Surface characteristics and protein adsorption on combinatorial binary Ti-M (Cr, Al, Ni) and Al-M (Ta, Zr) library films. Bai Z; Filiaggi MJ; Sanderson RJ; Lohstreter LB; McArthur MA; Dahn JR J Biomed Mater Res A; 2010 Feb; 92(2):521-32. PubMed ID: 19235218 [TBL] [Abstract][Full Text] [Related]
32. Diffractive Refractometer Based on Scalar Theory. Salvatore M; Reda F; Borbone F; Januariyasa IK; Maddalena P; Oscurato SL Polymers (Basel); 2023 Mar; 15(7):. PubMed ID: 37050219 [TBL] [Abstract][Full Text] [Related]
33. Structure of superconducting thin films of YBa2Cu3O7-x grown on SrTiO3 and cubic zirconia. Tietz LA; De Cooman BC; Carter CB; Lathrop DK; Russek SE; Buhrman RA J Electron Microsc Tech; 1988 Mar; 8(3):263-72. PubMed ID: 3246617 [TBL] [Abstract][Full Text] [Related]
35. Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry. Gustin KM Appl Opt; 1987 Sep; 26(18):3796-802. PubMed ID: 20490143 [TBL] [Abstract][Full Text] [Related]
36. [A method of manufacture and characteristic of surface properties and biological activity of thin-film coatings of Cu-Ti system]. Wojcieszak D; Kaczmarek D; Adamiak B; Domaradzki J; Mazur M; Jankowska D; Gamian A; Antosiak A; Szponar B; Rybak Z; Paluch D; Rusak A Polim Med; 2013; 43(3):135-40. PubMed ID: 24377178 [TBL] [Abstract][Full Text] [Related]
37. Measurement of the refractive index and thickness for infrared optical films deposited on rough substrates. Saito M; Nakamura S; Miyagi M Appl Opt; 1992 Oct; 31(28):6139-44. PubMed ID: 20733820 [TBL] [Abstract][Full Text] [Related]
38. Anodizing of Hydrogenated Titanium and Zirconium Films. Poznyak A; Pligovka A; Salerno M Materials (Basel); 2021 Dec; 14(24):. PubMed ID: 34947086 [TBL] [Abstract][Full Text] [Related]
39. Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry. Jaiswal J; Mourya S; Malik G; Chauhan S; Sanger A; Daipuriya R; Singh M; Chandra R Appl Opt; 2016 Oct; 55(29):8368-8375. PubMed ID: 27828089 [TBL] [Abstract][Full Text] [Related]
40. Determination of refractive index and layer thickness of nm-thin films via ellipsometry. Nestler P; Helm CA Opt Express; 2017 Oct; 25(22):27077-27085. PubMed ID: 29092189 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]