130 related articles for article (PubMed ID: 31873601)
1. Calibration of the retardation inhomogeneity for the compensator-rotating imaging ellipsometer.
Jin L; Iizuka Y; Iwao T; Kondoh E; Uehara M; Gelloz B
Appl Opt; 2019 Nov; 58(33):9224-9229. PubMed ID: 31873601
[TBL] [Abstract][Full Text] [Related]
2. Optimizing precision of rotating-analyzer and rotating-compensator ellipsometers.
Aspnes DE
J Opt Soc Am A Opt Image Sci Vis; 2004 Mar; 21(3):403-10. PubMed ID: 15005405
[TBL] [Abstract][Full Text] [Related]
3. Spectroscopic null ellipsometer using a variable retarder.
Watkins LR; Shamailov SS
Appl Opt; 2011 Jan; 50(1):50-2. PubMed ID: 21221159
[TBL] [Abstract][Full Text] [Related]
4. Alignment and calibration of the MgF2 biplate compensator for applications in rotating-compensator multichannel ellipsometry.
Lee J; Rovira PI; An I; Collins RW
J Opt Soc Am A Opt Image Sci Vis; 2001 Aug; 18(8):1980-5. PubMed ID: 11488503
[TBL] [Abstract][Full Text] [Related]
5. Rotatable Offner imaging system for ellipsometric measurement.
Jin L; Tanaka T; Kondoh E; Gelloz B; Sano K; Fujio I; Kajiyama Y; Uehara M
Rev Sci Instrum; 2017 Jan; 88(1):013704. PubMed ID: 28147651
[TBL] [Abstract][Full Text] [Related]
6. Calibration of focusing lens artifacts in a dual rotating-compensator Mueller matrix ellipsometer.
Fan Z; Tang Y; Wei K; Zhang Y
Appl Opt; 2018 May; 57(15):4145-4152. PubMed ID: 29791388
[TBL] [Abstract][Full Text] [Related]
7. Real-time characterization of film growth on transparent substrates by rotating-compensator multichannel ellipsometry.
Lee J; Collins RW
Appl Opt; 1998 Jul; 37(19):4230-8. PubMed ID: 18285868
[TBL] [Abstract][Full Text] [Related]
8. Real time in situ ellipsometric and gravimetric monitoring for electrochemistry experiments.
Broch L; Johann L; Stein N; Zimmer A; Beck R
Rev Sci Instrum; 2007 Jun; 78(6):064101. PubMed ID: 17614627
[TBL] [Abstract][Full Text] [Related]
9. A synchrotron-radiation-based variable angle ellipsometer for the visible to vacuum ultraviolet spectral range.
Neumann MD; Cobet C; Kaser H; Kolbe M; Gottwald A; Richter M; Esser N
Rev Sci Instrum; 2014 May; 85(5):055117. PubMed ID: 24880425
[TBL] [Abstract][Full Text] [Related]
10. Mueller matrix ellipsometer based on discrete-angle rotating Fresnel rhomb compensators.
Bian S; Cui C; Arteaga O
Appl Opt; 2021 Jun; 60(16):4964-4971. PubMed ID: 34143059
[TBL] [Abstract][Full Text] [Related]
11. Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrology.
Chen X; Du W; Yuan K; Chen J; Jiang H; Zhang C; Liu S
Rev Sci Instrum; 2016 May; 87(5):053707. PubMed ID: 27250435
[TBL] [Abstract][Full Text] [Related]
12. Null ellipsometer with phase modulation.
Postava K; Maziewski A; Yamaguchi T; Ossikovski R; Visnovsky S; Pistora J
Opt Express; 2004 Nov; 12(24):6040-5. PubMed ID: 19488245
[TBL] [Abstract][Full Text] [Related]
13. Calibration method of the specific characteristic of an electronic system of a rotating-analyzer ellipsometer.
Kawabata S; Motoki M; Yokota H
Appl Opt; 1997 Apr; 36(10):2178-82. PubMed ID: 18253189
[TBL] [Abstract][Full Text] [Related]
14. Spectroscopic ellipsometer based on direct measurement of polarization ellipticity.
Watkins LR
Appl Opt; 2011 Jun; 50(18):2973-8. PubMed ID: 21691363
[TBL] [Abstract][Full Text] [Related]
15. High-speed retardation modulation ellipsometer.
Moritani A; Okuda Y; Kubo H; Nakai J
Appl Opt; 1983 Aug; 22(16):2429-36. PubMed ID: 18196151
[TBL] [Abstract][Full Text] [Related]
16. In process ellipsometer azimuth angle calibration.
Adams JR; Bashara NM
Appl Opt; 1976 Dec; 15(12):3179-84. PubMed ID: 20168410
[TBL] [Abstract][Full Text] [Related]
17. Robust incident angle calibration of angle-resolved ellipsometry for thin film measurement.
Peng L; Tang D; Wang J; Chen R; Gao F; Zhou L
Appl Opt; 2021 May; 60(13):3971-3976. PubMed ID: 33983336
[TBL] [Abstract][Full Text] [Related]
18. Second-order systematic errors in Mueller matrix dual rotating compensator ellipsometry.
Broch L; En Naciri A; Johann L
Appl Opt; 2010 Jun; 49(17):3250-8. PubMed ID: 20539341
[TBL] [Abstract][Full Text] [Related]
19. Error-reduced channeled spectroscopic ellipsometer with palm-size sensing head.
Okabe H; Hayakawa M; Matoba J; Naito H; Oka K
Rev Sci Instrum; 2009 Aug; 80(8):083104. PubMed ID: 19725643
[TBL] [Abstract][Full Text] [Related]
20. Systematic errors for a Mueller matrix dual rotating compensator ellipsometer.
Broch L; En Naciri A; Johann L
Opt Express; 2008 Jun; 16(12):8814-24. PubMed ID: 18545594
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]