These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

128 related articles for article (PubMed ID: 31943021)

  • 1. Application of focused ion-beam sampling for sidewall-roughness measurement of free-standing sub-μm objects by atomic force microscopy.
    Nagatomi T; Nakao T; Fujimoto Y
    Microscopy (Oxf); 2020 Mar; 69(1):11-16. PubMed ID: 31943021
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor.
    Hussain D; Wen Y; Zhang H; Song J; Xie H
    Sensors (Basel); 2018 Jan; 18(1):. PubMed ID: 29301265
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Three-dimensional imaging of undercut and sidewall structures by atomic force microscopy.
    Cho SJ; Ahn BW; Kim J; Lee JM; Hua Y; Yoo YK; Park SI
    Rev Sci Instrum; 2011 Feb; 82(2):023707. PubMed ID: 21361601
    [TBL] [Abstract][Full Text] [Related]  

  • 4.
    Pillatsch L; Kalácska S; Maeder X; Michler J
    Microsc Microanal; 2021 Feb; 27(1):65-73. PubMed ID: 33222706
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Observation of Si pattern sidewall using inclination atomic force microscope for evaluation of line edge roughness.
    Hosaka S; Koyabu H; Noro M; Takizawa K; Sone H; Yin Y
    J Nanosci Nanotechnol; 2010 Jul; 10(7):4522-7. PubMed ID: 21128451
    [TBL] [Abstract][Full Text] [Related]  

  • 6. The description of friction of silicon MEMS with surface roughness: virtues and limitations of a stochastic Prandtl-Tomlinson model and the simulation of vibration-induced friction reduction.
    van Spengen WM; Turq V; Frenken JW
    Beilstein J Nanotechnol; 2010; 1():163-71. PubMed ID: 21977407
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Atomic force microscope caliper for critical dimension measurements of micro and nanostructures through sidewall scanning.
    Xie H; Hussain D; Yang F; Sun L
    Ultramicroscopy; 2015 Nov; 158():8-16. PubMed ID: 26103045
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopy.
    Yoo SB; Yun SH; Jo AJ; Cho SJ; Cho H; Lee JH; Ahn BW
    Appl Microsc; 2022 Mar; 52(1):1. PubMed ID: 35258764
    [TBL] [Abstract][Full Text] [Related]  

  • 9. AFM Study of Roughness Development during ToF-SIMS Depth Profiling of Multilayers with a Cs
    Ekar J; Kovač J
    Langmuir; 2022 Oct; 38(42):12871-12880. PubMed ID: 36239688
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach.
    Lee LH; Yu CH; Wei CY; Lee PC; Huang JS; Wen CY
    Ultramicroscopy; 2019 Feb; 197():95-99. PubMed ID: 30537672
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Direct investigation of (sub-) surface preparation artifacts in GaAs based materials by FIB sectioning.
    Belz J; Beyer A; Torunski T; Stolz W; Volz K
    Ultramicroscopy; 2016 Apr; 163():19-30. PubMed ID: 26855206
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Tuning the surface properties of hydrogel at the nanoscale with focused ion irradiation.
    Kim Y; Abuelfilat AY; Hoo SP; Al-Abboodi A; Liu B; Ng T; Chan P; Fu J
    Soft Matter; 2014 Nov; 10(42):8448-56. PubMed ID: 25225831
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments.
    Vijayan S; Jinschek JR; Kujawa S; Greiser J; Aindow M
    Microsc Microanal; 2017 Aug; 23(4):708-716. PubMed ID: 28578727
    [TBL] [Abstract][Full Text] [Related]  

  • 14. High aspect ratio AFM Probe processing by helium-ion-beam induced deposition.
    Onishi K; Guo H; Nagano S; Fujita D
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i30. PubMed ID: 25359832
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Pt thermal atomic layer deposition for silicon x-ray micropore optics.
    Takeuchi K; Ezoe Y; Ishikawa K; Numazawa M; Terada M; Ishi D; Fujitani M; Sowa MJ; Ohashi T; Mitsuda K
    Appl Opt; 2018 Apr; 57(12):3237-3243. PubMed ID: 29714311
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Investigation of resins suitable for the preparation of biological sample for 3-D electron microscopy.
    Kizilyaprak C; Longo G; Daraspe J; Humbel BM
    J Struct Biol; 2015 Feb; 189(2):135-46. PubMed ID: 25433274
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope.
    MacLaren I; Nord M; Jiao C; Yücelen E
    Microsc Microanal; 2019 Feb; 25(1):115-118. PubMed ID: 30696493
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Atomic force microscopy deep trench and sidewall imaging with an optical fiber probe.
    Xie H; Hussain D; Yang F; Sun L
    Rev Sci Instrum; 2014 Dec; 85(12):123704. PubMed ID: 25554298
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Development of a laser-focused ion beam combination machine.
    Yoshida Y; Masuzawa T; Ikeda H; Oguchi K; Yamagishi H; Wakabayashi Y
    Rev Sci Instrum; 2010 Feb; 81(2):02B702. PubMed ID: 20192442
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Reducing adhesion force by means of atomic layer deposition of ZnO films with nanoscale surface roughness.
    Chai Z; Liu Y; Lu X; He D
    ACS Appl Mater Interfaces; 2014 Mar; 6(5):3325-30. PubMed ID: 24506135
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.