These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

290 related articles for article (PubMed ID: 3199219)

  • 1. Artifacts introduced by ion milling in Al-Li-Cu alloys.
    Singh AK; Imam MA; Sadananda K
    J Electron Microsc Tech; 1988 Apr; 8(4):355-61. PubMed ID: 3199219
    [TBL] [Abstract][Full Text] [Related]  

  • 2. An analytical electron microscopic investigation of precipitation in an Al-Cu-Zn-Mg-Ag alloy.
    Hasan F; Lorimer GW
    Microsc Res Tech; 1993 Mar; 24(4):359-66. PubMed ID: 8513176
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Amorphisation of MgO single crystal specimens prepared by ion milling for transmission electron microscopy studies.
    Khan MY; Brown LM; Chaudhri MM
    J Electron Microsc Tech; 1990 Aug; 15(4):377-82. PubMed ID: 2391563
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Preparation of TEM samples of ferritic alloys.
    Yao Z; Xu S; Jenkins ML; Kirk MA
    J Electron Microsc (Tokyo); 2008 Jun; 57(3):91-4. PubMed ID: 18316797
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Cross-sectional transmission electron microscopy of X-ray multilayer thin film structures.
    Nguyen TD; Gronsky R; Kortright JB
    J Electron Microsc Tech; 1991 Dec; 19(4):473-85. PubMed ID: 1797992
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Applications of the FIB lift-out technique for TEM specimen preparation.
    Giannuzzi LA; Drown JL; Brown SR; Irwin RB; Stevie FA
    Microsc Res Tech; 1998 May; 41(4):285-90. PubMed ID: 9633946
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Preparation of TEM foils from Nb-10 a/o Si.
    Cockeram B; Jackson AG; Omlor RE; Srinivasan R; Weiss I
    Microsc Res Tech; 1992 Aug; 22(3):298-300. PubMed ID: 1504356
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Location specific in situ TEM straining specimens made using FIB.
    Field RD; Papin PA
    Ultramicroscopy; 2004 Dec; 102(1):23-6. PubMed ID: 15556697
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites.
    Gasser P; Klotz UE; Khalid FA; Beffort O
    Microsc Microanal; 2004 Apr; 10(2):311-6. PubMed ID: 15306057
    [TBL] [Abstract][Full Text] [Related]  

  • 10. About the contrast of δ' precipitates in bulk Al-Cu-Li alloys in reflection mode with a field-emission scanning electron microscope at low accelerating voltage.
    Brodusch N; Voisard F; Gauvin R
    J Microsc; 2017 Nov; 268(2):107-118. PubMed ID: 28569389
    [TBL] [Abstract][Full Text] [Related]  

  • 11. In situ hydride formation in titanium during focused ion milling.
    Ding R; Jones IP
    J Electron Microsc (Tokyo); 2011; 60(1):1-9. PubMed ID: 20871111
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV.
    Kamino T; Yaguchi T; Kuroda Y; Ohnishi T; Ishitani T; Miyahara Y; Horita Z
    J Electron Microsc (Tokyo); 2004; 53(5):459-63. PubMed ID: 15582947
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Focused ion beam milling and ultramicrotomy of mineralised ivory dentine for analytical transmission electron microscopy.
    Jantou V; Turmaine M; West GD; Horton MA; McComb DW
    Micron; 2009 Jun; 40(4):495-501. PubMed ID: 19157888
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Microstructural studies of 35 degrees C copper Ni-Ti orthodontic wire and TEM confirmation of low-temperature martensite transformation.
    Brantley WA; Guo W; Clark WA; Iijima M
    Dent Mater; 2008 Feb; 24(2):204-10. PubMed ID: 17561249
    [TBL] [Abstract][Full Text] [Related]  

  • 15. The precession technique in electron diffraction and its application to structure determination of nano-size precipitates in alloys.
    Gjønnes J; Hansen V; Kverneland A
    Microsc Microanal; 2004 Feb; 10(1):16-20. PubMed ID: 15306062
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Influence of material properties on TEM specimen preparation of thin films.
    Madsen LD; Weaver L; Jacobsen SN
    Microsc Res Tech; 1997 Mar; 36(5):354-61. PubMed ID: 9140934
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics.
    Zinkle SJ; Haltom CP; Jenkins LC; DuBose CK
    J Electron Microsc Tech; 1991 Dec; 19(4):452-60. PubMed ID: 1797990
    [TBL] [Abstract][Full Text] [Related]  

  • 18. HRTEM and TEM studies of amorphous structures in ZrNiTiCu base alloys obtained by rapid solidification or ball milling.
    Dutkiewicz J; Lityńska L; Maziarz W; Kocisko R; Molnarová M; Kovácová A
    Micron; 2009 Jan; 40(1):1-5. PubMed ID: 18614372
    [TBL] [Abstract][Full Text] [Related]  

  • 19. A technique for the preparation of cross-sectional TEM samples of ZnSe/GaAs heterostructures which eliminates process-induced defects.
    Yu JE; Jones KS; Park RM
    J Electron Microsc Tech; 1991 Jul; 18(3):315-24. PubMed ID: 1880604
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Preparation of cross-sectional TEM samples for low-angle ion milling.
    McCaffrey JP; Barna A
    Microsc Res Tech; 1997 Mar; 36(5):362-7. PubMed ID: 9140935
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 15.