These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

141 related articles for article (PubMed ID: 32086184)

  • 1. Inelastic mean free path measurement by STEM-EELS technique using needle-shaped specimen.
    Oh-Ishi K; Ohsuna T
    Ultramicroscopy; 2020 May; 212():112955. PubMed ID: 32086184
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides.
    Basha A; Levi G; Amrani T; Li Y; Ankonina G; Shekhter P; Kornblum L; Goldfarb I; Kohn A
    Ultramicroscopy; 2022 Oct; 240():113570. PubMed ID: 35700667
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Site-specific angular dependent determination of inelastic mean free path of 300 keV electrons in GaN nanorods.
    Ghatak J; Chatterjee A; Shivaprasad SM
    J Microsc; 2021 Jun; 282(3):250-257. PubMed ID: 33442878
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Determination of absolute thickness and mean free path of thin foil specimen by zeta-factor method.
    Ohshima K; Kaneko K; Fujita T; Horita Z
    J Electron Microsc (Tokyo); 2004; 53(2):137-42. PubMed ID: 15180208
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Measurement of mean free paths for inelastic electron scattering of Si and SiO2.
    Lee CW; Ikematsu Y; Shindo D
    J Electron Microsc (Tokyo); 2002; 51(3):143-8. PubMed ID: 12113621
    [TBL] [Abstract][Full Text] [Related]  

  • 6. EELS log-ratio technique for specimen-thickness measurement in the TEM.
    Malis T; Cheng SC; Egerton RF
    J Electron Microsc Tech; 1988 Feb; 8(2):193-200. PubMed ID: 3246607
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Fabrication of thin TEM sample of ionic liquid for high-resolution ELNES measurements.
    Miyata T; Mizoguchi T
    Ultramicroscopy; 2017 Jul; 178():81-87. PubMed ID: 27793468
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Quantitative atomic cross section analysis by 4D-STEM and EELS.
    Seifer S; Houben L; Elbaum M
    Ultramicroscopy; 2024 May; 259():113936. PubMed ID: 38359631
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Local thickness measurement through scattering contrast and electron energy-loss spectroscopy.
    Zhang HR; Egerton RF; Malac M
    Micron; 2012 Jan; 43(1):8-15. PubMed ID: 21803591
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Comparative study on the specimen thickness measurement using EELS and CBED methods.
    Heo YU
    Appl Microsc; 2020 May; 50(1):8. PubMed ID: 33580338
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging.
    Feja B; Aebi U
    J Microsc; 1999 Jan; 193(1):15-19. PubMed ID: 12558683
    [TBL] [Abstract][Full Text] [Related]  

  • 12. An experimental method for calibration of the plasmon mean free path.
    Meltzman H; Kauffmann Y; Thangadurai P; Drozdov M; Baram M; Brandon D; Kaplan WD
    J Microsc; 2009 Dec; 236(3):165-73. PubMed ID: 19941556
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Characterization of DLC films by EELS and electron holography.
    Shindo D; Musashi T; Ikematsu Y; Murakami Y; Nakamura N; Chiba H
    J Electron Microsc (Tokyo); 2005 Jan; 54(1):11-7. PubMed ID: 15695480
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Low-energy electron properties: Electron inelastic mean free path, energy loss function and the dielectric function. Recent measurements, applications, and the plasmon-coupling theory.
    Chantler CT; Bourke JD
    Ultramicroscopy; 2019 Jun; 201():38-48. PubMed ID: 30925298
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer.
    Konvalina I; Daniel B; Zouhar M; Paták A; Müllerová I; Frank L; Piňos J; Průcha L; Radlička T; Werner WSM; Mikmeková EM
    Nanomaterials (Basel); 2021 Sep; 11(9):. PubMed ID: 34578750
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Density measurement of thin layers by electron energy loss spectroscopy (EELS).
    Thomas J; Ramm J; Gemming T
    Micron; 2013 Jul; 50():57-61. PubMed ID: 23791912
    [TBL] [Abstract][Full Text] [Related]  

  • 17. The experimental electron mean-free-path in Si under typical (S)TEM conditions.
    Potapov PL
    Ultramicroscopy; 2014 Dec; 147():21-4. PubMed ID: 24954136
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections.
    Craven AJ; Bobynko J; Sala B; MacLaren I
    Ultramicroscopy; 2016 Nov; 170():113-127. PubMed ID: 27569850
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Determination of Mean Inner Potential and Inelastic Mean Free Path of ZnTe Using Off-Axis Electron Holography and Dynamical Effects Affecting Phase Determination.
    Gan Z; DiNezza M; Zhang YH; Smith DJ; McCartney MR
    Microsc Microanal; 2015 Dec; 21(6):1406-1412. PubMed ID: 26611637
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Searching ultimate nanometrology for AlOx thickness in magnetic tunnel junction by analytical electron microscopy and X-ray reflectometry.
    Song SA; Hirano T; Park JB; Kaji K; Kim KH; Terada S
    Microsc Microanal; 2005 Oct; 11(5):431-45. PubMed ID: 17481324
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.