These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

230 related articles for article (PubMed ID: 32148216)

  • 21. A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomography.
    Priebe A; Audoit G; Barnes JP
    Ultramicroscopy; 2017 Feb; 173():10-13. PubMed ID: 27898297
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approach.
    Tkadletz M; Lechner A; Pölzl S; Schalk N
    Ultramicroscopy; 2021 Nov; 230():113402. PubMed ID: 34624587
    [TBL] [Abstract][Full Text] [Related]  

  • 23. An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam.
    Halpin JE; Webster RWH; Gardner H; Moody MP; Bagot PAJ; MacLaren DA
    Ultramicroscopy; 2019 Jul; 202():121-127. PubMed ID: 31005819
    [TBL] [Abstract][Full Text] [Related]  

  • 24. 3D imaging of cells and tissues by focused ion beam/scanning electron microscopy (FIB/SEM).
    Drobne D
    Methods Mol Biol; 2013; 950():275-92. PubMed ID: 23086881
    [TBL] [Abstract][Full Text] [Related]  

  • 25. On the fabrication of atom probe tomography specimens of Al alloys at room temperature using focused ion beam milling with liquid Ga ion source.
    Mondal S; Bansal U; Makineni SK
    Microsc Res Tech; 2022 Sep; 85(9):3040-3049. PubMed ID: 35560854
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Cross-shaped markers for the preparation of site-specific transmission electron microscopy lamellae using focused ion beam techniques.
    O'Hanlon TJ; Bao A; Massabuau FC; Kappers MJ; Oliver RA
    Ultramicroscopy; 2020 May; 212():112970. PubMed ID: 32114315
    [TBL] [Abstract][Full Text] [Related]  

  • 27. FIB-SEM cathodoluminescence tomography: practical and theoretical considerations.
    De Winter DA; Lebbink MN; Wiggers De Vries DF; Post JA; Drury MR
    J Microsc; 2011 Sep; 243(3):315-26. PubMed ID: 21692799
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomography.
    Greene ME; Kelly TF; Larson DJ; Prosa TJ
    J Microsc; 2012 Sep; 247(3):288-99. PubMed ID: 22906016
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Cryo-focused-ion-beam applications in structural biology.
    Rigort A; Plitzko JM
    Arch Biochem Biophys; 2015 Sep; 581():122-30. PubMed ID: 25703192
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary.
    Pérez-Willard F; Wolde-Giorgis D; Al-Kassab T; López GA; Mittemeijer EJ; Kirchheim R; Gerthsen D
    Micron; 2008; 39(1):45-52. PubMed ID: 17331735
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation.
    Bogdanowicz J; Kumar A; Fleischmann C; Gilbert M; Houard J; Vella A; Vandervorst W
    Ultramicroscopy; 2018 May; 188():19-23. PubMed ID: 29529555
    [TBL] [Abstract][Full Text] [Related]  

  • 32. An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy.
    Uzuhashi J; Ohkubo T; Hono K
    Microsc Microanal; 2024 Mar; ():. PubMed ID: 38442209
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Atom probe tomography.
    Gault B; Chiaramonti A; Cojocaru-Mirédin O; Stender P; Dubosq R; Freysoldt C; Makineni SK; Li T; Moody M; Cairney JM
    Nat Rev Methods Primers; 2021; 1(51):. PubMed ID: 37719173
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Cryo-focused ion beam preparation of perovskite based solar cells for atom probe tomography.
    Rivas NA; Babayigit A; Conings B; Schwarz T; Sturm A; Garzón Manjón A; Cojocaru-Mirédin O; Gault B; Renner FU
    PLoS One; 2020; 15(1):e0227920. PubMed ID: 31945119
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Focused ion beam (FIB)/scanning electron microscopy (SEM) in tissue structural research.
    Leser V; Milani M; Tatti F; Tkalec ZP; Strus J; Drobne D
    Protoplasma; 2010 Oct; 246(1-4):41-8. PubMed ID: 20169456
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Atom-probe for FinFET dopant characterization.
    Kambham AK; Mody J; Gilbert M; Koelling S; Vandervorst W
    Ultramicroscopy; 2011 May; 111(6):535-9. PubMed ID: 21288644
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography.
    Rice KP; Chen Y; Prosa TJ; Larson DJ
    Microsc Microanal; 2016 Jun; 22(3):583-8. PubMed ID: 27329309
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing.
    Tkadletz M; Waldl H; Schiester M; Lechner A; Schusser G; Krause M; Schalk N
    Ultramicroscopy; 2023 Apr; 246():113672. PubMed ID: 36586198
    [TBL] [Abstract][Full Text] [Related]  

  • 39. 3D correlative morphological and elemental characterization of materials at the deep submicrometre scale.
    Priebe A; Goret G; Bleuet P; Audoit G; Laurencin J; Barnes JP
    J Microsc; 2016 Nov; 264(2):247-251. PubMed ID: 27513607
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Criteria and considerations for preparing atom-probe tomography specimens of nanomaterials utilizing an encapsulation methodology.
    Sun Z; Hazut O; Yerushalmi R; Lauhon LJ; Seidman DN
    Ultramicroscopy; 2018 Jan; 184(Pt A):225-233. PubMed ID: 28985626
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 12.