These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

145 related articles for article (PubMed ID: 32155571)

  • 1. Study of interfacial random strain fields in core-shell ZnO nanowires by scanning transmission electron microscopy.
    Zhang Y; Zhang W; Sun Y; Yu H; Lu J; Lin N; Wang Z; Pan N; Wang X; Ma C
    Micron; 2020 Jun; 133():102862. PubMed ID: 32155571
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Oxidation-state sensitive imaging of cerium dioxide by atomic-resolution low-angle annular dark field scanning transmission electron microscopy.
    Johnston-Peck AC; Winterstein JP; Roberts AD; DuChene JS; Qian K; Sweeny BC; Wei WD; Sharma R; Stach EA; Herzing AA
    Ultramicroscopy; 2016 Mar; 162():52-60. PubMed ID: 26744830
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Fast-Response Single-Nanowire Photodetector Based on ZnO/WS
    Butanovs E; Vlassov S; Kuzmin A; Piskunov S; Butikova J; Polyakov B
    ACS Appl Mater Interfaces; 2018 Apr; 10(16):13869-13876. PubMed ID: 29619827
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Compositional characterization of GaAs/GaAsSb nanowires by quantitative HAADF-STEM.
    Kauko H; Grieb T; Bjørge R; Schowalter M; Munshi AM; Weman H; Rosenauer A; van Helvoort AT
    Micron; 2013 Jan; 44():254-60. PubMed ID: 22854214
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces.
    Yu Z; Muller DA; Silcox J
    Ultramicroscopy; 2008 Apr; 108(5):494-501. PubMed ID: 17920197
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis.
    Grieb T; Müller K; Fritz R; Schowalter M; Neugebohrn N; Knaub N; Volz K; Rosenauer A
    Ultramicroscopy; 2012 Jun; 117():15-23. PubMed ID: 22634136
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy images.
    Yamazaki T; Watanabe K; Recnik A; Ceh M; Kawasaki M; Shiojiri M
    J Electron Microsc (Tokyo); 2000; 49(6):753-9. PubMed ID: 11270856
    [TBL] [Abstract][Full Text] [Related]  

  • 8. 3D strain measurement in electronic devices using through-focal annular dark-field imaging.
    Kim S; Jung Y; Lee S; Jung Kim J; Byun G; Lee S; Lee H
    Ultramicroscopy; 2014 Nov; 146():1-5. PubMed ID: 24859824
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Quantitative analysis of interfacial strain in InAs/GaSb superlattices by aberration-corrected HRTEM and HAADF-STEM.
    Mahalingam K; Haugan HJ; Brown GJ; Eyink KG
    Ultramicroscopy; 2013 Apr; 127():70-5. PubMed ID: 23298538
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.
    Van Aert S; Verbeeck J; Erni R; Bals S; Luysberg M; Van Dyck D; Van Tendeloo G
    Ultramicroscopy; 2009 Sep; 109(10):1236-44. PubMed ID: 19525069
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Enhanced electron field emission properties of high aspect ratio silicon nanowire-zinc oxide core-shell arrays.
    Kale VS; Prabhakar RR; Pramana SS; Rao M; Sow CH; Jinesh KB; Mhaisalkar SG
    Phys Chem Chem Phys; 2012 Apr; 14(13):4614-9. PubMed ID: 22354387
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Microstructure study of a severely plastically deformed Mg-Zn-Y alloy by application of low angle annular dark field diffraction contrast imaging.
    Basha DA; Rosalie JM; Somekawa H; Miyawaki T; Singh A; Tsuchiya K
    Sci Technol Adv Mater; 2016; 17(1):115-127. PubMed ID: 27877863
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Experimental evaluation of interfaces using atomic-resolution high angle annular dark field (HAADF) imaging.
    Robb PD; Finnie M; Longo P; Craven AJ
    Ultramicroscopy; 2012 Mar; 114():11-9. PubMed ID: 22343667
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Polarity assignment in ZnTe, GaAs, ZnO, and GaN-AlN nanowires from direct dumbbell analysis.
    de la Mata M; Magen C; Gazquez J; Utama MI; Heiss M; Lopatin S; Furtmayr F; Fernández-Rojas CJ; Peng B; Morante JR; Rurali R; Eickhoff M; Fontcuberta i Morral A; Xiong Q; Arbiol J
    Nano Lett; 2012 May; 12(5):2579-86. PubMed ID: 22493937
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Moiré fringe imaging of heterostructures by scanning transmission electron microscopy.
    Hu WT; Tian M; Wang YJ; Zhu YL
    Micron; 2024 Oct; 185():103679. PubMed ID: 38924906
    [TBL] [Abstract][Full Text] [Related]  

  • 16. One Step Toward a New Generation of C-MOS Compatible Oxide P-N Junctions: Structure of the LSMO/ZnO Interface Elucidated by an Experimental and Theoretical Synergic Work.
    Pullini D; Sgroi MF; Mahmoud A; Gauquelin N; Maschio L; Ferrari AM; Groenen R; Damen C; Rijnders G; van den Bos KHW; Van Aert S; Verbeeck J
    ACS Appl Mater Interfaces; 2017 Jun; 9(24):20974-20980. PubMed ID: 28540719
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline material.
    Lazar S; Etheridge J; Dwyer C; Freitag B; Botton GA
    Acta Crystallogr A; 2011 Sep; 67(Pt 5):487-90. PubMed ID: 21844654
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Application of high-angle annular dark field scanning transmission electron microscopy, scanning transmission electron microscopy-energy dispersive X-ray spectrometry, and energy-filtered transmission electron microscopy to the characterization of nanoparticles in the environment.
    Utsunomiya S; Ewing RC
    Environ Sci Technol; 2003 Feb; 37(4):786-91. PubMed ID: 12636280
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Modelling of AlAs/GaAs interfacial structures using high-angle annular dark field (HAADF) image simulations.
    Robb PD; Finnie M; Craven AJ
    Ultramicroscopy; 2012 Jul; 118():53-60. PubMed ID: 22728405
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination.
    Pfaff M; Müller E; Klein MF; Colsmann A; Lemmer U; Krzyzanek V; Reichelt R; Gerthsen D
    J Microsc; 2011 Jul; 243(1):31-9. PubMed ID: 21155995
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.