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8. Fast universal quantum gate above the fault-tolerance threshold in silicon. Noiri A; Takeda K; Nakajima T; Kobayashi T; Sammak A; Scappucci G; Tarucha S Nature; 2022 Jan; 601(7893):338-342. PubMed ID: 35046603 [TBL] [Abstract][Full Text] [Related]
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