These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

194 related articles for article (PubMed ID: 3246607)

  • 1. EELS log-ratio technique for specimen-thickness measurement in the TEM.
    Malis T; Cheng SC; Egerton RF
    J Electron Microsc Tech; 1988 Feb; 8(2):193-200. PubMed ID: 3246607
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Local thickness measurement through scattering contrast and electron energy-loss spectroscopy.
    Zhang HR; Egerton RF; Malac M
    Micron; 2012 Jan; 43(1):8-15. PubMed ID: 21803591
    [TBL] [Abstract][Full Text] [Related]  

  • 3. An experimental method for calibration of the plasmon mean free path.
    Meltzman H; Kauffmann Y; Thangadurai P; Drozdov M; Baram M; Brandon D; Kaplan WD
    J Microsc; 2009 Dec; 236(3):165-73. PubMed ID: 19941556
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Practical aspects of electron energy loss spectroscopy (EELS) in biology.
    Jeanguillaume C; Tencé M; Zhang L; Ballongue P
    Cell Mol Biol (Noisy-le-grand); 1996 May; 42(3):439-50. PubMed ID: 8793197
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Thickness measurements with electron energy loss spectroscopy.
    Iakoubovskii K; Mitsuishi K; Nakayama Y; Furuya K
    Microsc Res Tech; 2008 Aug; 71(8):626-31. PubMed ID: 18454473
    [TBL] [Abstract][Full Text] [Related]  

  • 6. High-Energy Electron Scattering in
    Hayashida M; Malac M
    Microsc Microanal; 2022 Mar; ():1-13. PubMed ID: 35343421
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Inelastic mean free path measurement by STEM-EELS technique using needle-shaped specimen.
    Oh-Ishi K; Ohsuna T
    Ultramicroscopy; 2020 May; 212():112955. PubMed ID: 32086184
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Thickness measurement of hydrated and dehydrated cryosections by EELS.
    Shi S; Sun S; Andrews SB; Leapman RD
    Microsc Res Tech; 1996 Feb; 33(3):241-50. PubMed ID: 8652882
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel.
    Mitchell DR
    J Microsc; 2006 Nov; 224(Pt 2):187-96. PubMed ID: 17204066
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Decisive factors for realizing atomic-column resolution using STEM and EELS.
    Kimoto K; Ishizuka K; Matsui Y
    Micron; 2008; 39(3):257-62. PubMed ID: 18054240
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Dose-limited spectroscopic imaging of soft materials by low-loss EELS in the scanning transmission electron microscope.
    Yakovlev S; Libera M
    Micron; 2008 Aug; 39(6):734-40. PubMed ID: 18096395
    [TBL] [Abstract][Full Text] [Related]  

  • 12. The influence of lens chromatic aberration on electron energy-loss spectroscopy quantitative measurements.
    Yang YY; Egerton RF
    Microsc Res Tech; 1992 Jun; 21(4):361-7. PubMed ID: 1638055
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Practical image restoration of thick biological specimens using multiple focus levels in transmission electron microscopy.
    Han KF; Sedat JW; Agard DA
    J Struct Biol; 1997 Dec; 120(3):237-44. PubMed ID: 9441929
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Biological electron energy loss spectroscopy in the field-emission scanning transmission electron microscope.
    Leapman RD; Sun SQ; Hunt JA; Andrews SB
    Scanning Microsc Suppl; 1994; 8():245-58; discussion 258-9. PubMed ID: 7638490
    [TBL] [Abstract][Full Text] [Related]  

  • 15. On the measurement of thickness in nanoporous materials by EELS.
    Jiang N; Su D; Spence JC
    Ultramicroscopy; 2010 Dec; 111(1):62-5. PubMed ID: 21036477
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Ultramicrotomy of powder material for TEM/STEM study.
    Wei LY; Li T
    Microsc Res Tech; 1997 Mar; 36(5):380-1. PubMed ID: 9140939
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging.
    Feja B; Aebi U
    J Microsc; 1999 Jan; 193(1):15-19. PubMed ID: 12558683
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides.
    Basha A; Levi G; Amrani T; Li Y; Ankonina G; Shekhter P; Kornblum L; Goldfarb I; Kohn A
    Ultramicroscopy; 2022 Oct; 240():113570. PubMed ID: 35700667
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Site-specific angular dependent determination of inelastic mean free path of 300 keV electrons in GaN nanorods.
    Ghatak J; Chatterjee A; Shivaprasad SM
    J Microsc; 2021 Jun; 282(3):250-257. PubMed ID: 33442878
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Study of local atomic order in amorphous materials in a computerized transmission electron microscope.
    Balossier G; Garg RK; Bonhomme P; Thomas X
    J Electron Microsc Tech; 1989 Mar; 11(3):186-90. PubMed ID: 2723799
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 10.