These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

169 related articles for article (PubMed ID: 32608436)

  • 1. A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling.
    Tang S; Tang J; Chiu TW; Uzuhashi J; Tang DM; Ohkubo T; Mitome M; Uesugi F; Takeguchi M; Qin LC
    Nanoscale; 2020 Aug; 12(32):16770-16774. PubMed ID: 32608436
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Electrical conduction and field emission of a single-crystalline GdB
    Tang S; Tang J; Chiu TW; Yuan J; Tang DM; Mitome M; Uesugi F; Nemoto Y; Takeguchi M; Qin LC
    Nanoscale; 2020 Sep; 12(35):18263-18268. PubMed ID: 32857075
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Stable Field Emission from Single-Crystalline Zirconium Carbide Nanowires.
    Wu Y; Tang J; Tang S; Chen YH; Chiu TW; Takeguchi M; Qin LC
    Nanomaterials (Basel); 2024 Sep; 14(19):. PubMed ID: 39404294
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Stable field-emission from a CeB
    Tang S; Tang J; Wu Y; Chen YH; Uzuhashi J; Ohkubo T; Qin LC
    Nanoscale; 2021 Oct; 13(40):17156-17161. PubMed ID: 34636392
    [TBL] [Abstract][Full Text] [Related]  

  • 5. On the fabrication of atom probe tomography specimens of Al alloys at room temperature using focused ion beam milling with liquid Ga ion source.
    Mondal S; Bansal U; Makineni SK
    Microsc Res Tech; 2022 Sep; 85(9):3040-3049. PubMed ID: 35560854
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Fabrication of single Ga-doped ZnS nanowires as high-gain photosensors by focused ion beam deposition.
    Yen SH; Hung YC; Yeh PH; Su YW; Wang CY
    Nanotechnology; 2017 Sep; 28(39):395201. PubMed ID: 28675756
    [TBL] [Abstract][Full Text] [Related]  

  • 7. High-endurance micro-engineered LaB
    Zhang H; Jimbo Y; Niwata A; Ikeda A; Yasuhara A; Ovidiu C; Kimoto K; Kasaya T; Miyazaki HT; Tsujii N; Wang H; Yamauchi Y; Fujita D; Kitamura SI; Manabe H
    Nat Nanotechnol; 2022 Jan; 17(1):21-26. PubMed ID: 34750559
    [TBL] [Abstract][Full Text] [Related]  

  • 8. A Core-Shell MWCNT-Pt Nanowire Electron Source with Anomalously Long-Term Stable Field Emission.
    Zhang W; Chao P; Chen D; Yang Z; Dong L
    Nanomaterials (Basel); 2023 Jan; 13(3):. PubMed ID: 36770493
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique.
    Choi PP; Kwon YS; Kim JS; Al-Kassab T
    J Electron Microsc (Tokyo); 2007 Apr; 56(2):43-9. PubMed ID: 17928320
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Focused ion beam fabrication of novel core-shell nanowire structures.
    He L; Johansson J; Murayama M; Hull R
    Nanotechnology; 2008 Nov; 19(44):445610. PubMed ID: 21832742
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Sample preparation toward seamless 3D imaging technique from micrometer to nanometer scale.
    Miyake A; Matsuno J; Toh S
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i24-i25. PubMed ID: 25359821
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Nanostructured LaB6 field emitter with lowest apical work function.
    Zhang H; Tang J; Yuan J; Ma J; Shinya N; Nakajima K; Murakami H; Ohkubo T; Qin LC
    Nano Lett; 2010 Sep; 10(9):3539-44. PubMed ID: 20715844
    [TBL] [Abstract][Full Text] [Related]  

  • 13. An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy.
    Uzuhashi J; Ohkubo T; Hono K
    Microsc Microanal; 2024 Mar; ():. PubMed ID: 38442209
    [TBL] [Abstract][Full Text] [Related]  

  • 14. A stable LaB
    Tang S; Tang J; Uzuhashi J; Ohkubo T; Hayami W; Yuan J; Takeguchi M; Mitome M; Qin LC
    Nanoscale Adv; 2021 May; 3(10):2787-2792. PubMed ID: 36134182
    [TBL] [Abstract][Full Text] [Related]  

  • 15. A Comparative Study of Gallium-, Xenon-, and Helium-Focused Ion Beams for the Milling of GaN.
    Jiang S; Ortalan V
    Nanomaterials (Basel); 2023 Nov; 13(21):. PubMed ID: 37947742
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Atomic layer deposited Al
    Gurrentz JM; Jarvis KA; Gearba-Dolocan IR; Rose MJ
    Ultramicroscopy; 2022 Sep; 239():113562. PubMed ID: 35675735
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Low damage lamella preparation of metallic materials by FIB processing with low acceleration voltage and a low incident angle Ar ion milling finish.
    Sato T; Aizawa Y; Matsumoto H; Kiyohara M; Kamiya C; VON Cube F
    J Microsc; 2020 Sep; 279(3):234-241. PubMed ID: 32043578
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Low voltage FE-STEM for characterization of state-of-the-art silicon SRAM.
    Nakagawa M; Dunne R; Koike H; Sato M; Pérez-Camacho JJ; Kennedy BJ
    J Electron Microsc (Tokyo); 2002; 51(1):53-7. PubMed ID: 12003242
    [TBL] [Abstract][Full Text] [Related]  

  • 19. FIB-SEM cathodoluminescence tomography: practical and theoretical considerations.
    De Winter DA; Lebbink MN; Wiggers De Vries DF; Post JA; Drury MR
    J Microsc; 2011 Sep; 243(3):315-26. PubMed ID: 21692799
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Xenon gas field ion source from a single-atom tip.
    Lai WC; Lin CY; Chang WT; Li PC; Fu TY; Chang CS; Tsong TT; Hwang IS
    Nanotechnology; 2017 Jun; 28(25):255301. PubMed ID: 28548051
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.