These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
2. Linear chirped slope profile for spatial calibration in slope measuring deflectometry. Siewert F; Zeschke T; Arnold T; Paetzelt H; Yashchuk VV Rev Sci Instrum; 2016 May; 87(5):051907. PubMed ID: 27250379 [TBL] [Abstract][Full Text] [Related]
3. Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy. Kashyap Y; Wang H; Sawhney K Rev Sci Instrum; 2016 May; 87(5):052001. PubMed ID: 27250381 [TBL] [Abstract][Full Text] [Related]
4. Optimization of the size and shape of the scanning aperture in autocollimator-based deflectometric profilometers. Lacey I; Geckler RD; Just A; Siewert F; Arnold T; Paetzelt H; Smith BV; Yashchuk VV Rev Sci Instrum; 2019 Feb; 90(2):021717. PubMed ID: 30831748 [TBL] [Abstract][Full Text] [Related]
5. Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad. Alcock SG; Nistea I; Sawhney K Rev Sci Instrum; 2016 May; 87(5):051902. PubMed ID: 27250374 [TBL] [Abstract][Full Text] [Related]
6. Nano-precision metrology of X-ray mirrors with laser speckle angular measurement. Wang H; Moriconi S; Sawhney K Light Sci Appl; 2021 Sep; 10(1):195. PubMed ID: 34552044 [TBL] [Abstract][Full Text] [Related]
7. Ex situ metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source. Yashchuk VV; Lacey I; Gevorkyan GS; McKinney WR; Smith BV; Warwick T Rev Sci Instrum; 2019 Feb; 90(2):021711. PubMed ID: 30831770 [TBL] [Abstract][Full Text] [Related]
8. On the characterization of a 1 m long, ultra-precise KB-focusing mirror pair for European XFEL by means of slope measuring deflectometry. Siewert F; Buchheim J; Gwalt G; Bean R; Mancuso AP Rev Sci Instrum; 2019 Feb; 90(2):021713. PubMed ID: 30831716 [TBL] [Abstract][Full Text] [Related]
9. Optimized alignment of X-ray mirrors with an automated speckle-based metrology tool. Zhou T; Wang H; Fox OJL; Sawhney KJS Rev Sci Instrum; 2019 Feb; 90(2):021706. PubMed ID: 30831677 [TBL] [Abstract][Full Text] [Related]
10. Long, elliptically bent, active X-ray mirrors with slope errors <200 nrad. Nistea IT; Alcock SG; Kristiansen P; Young A J Synchrotron Radiat; 2017 May; 24(Pt 3):615-621. PubMed ID: 28452753 [TBL] [Abstract][Full Text] [Related]
11. Enhanced-spatial-resolution optical surface profiler based on focusing deflectometry. Wu M; Han J; Hu W; Li M; Yang F; Sheng W Opt Express; 2022 Dec; 30(25):45918-45929. PubMed ID: 36522985 [TBL] [Abstract][Full Text] [Related]
12. Sub-nanometre quality X-ray mirrors created using ion beam figuring. Majhi A; Shurvinton R; Pradhan PC; Hand M; Gu W; Da Silva MB; Moriconi S; Nistea I; Alcock SG; Wang H; Sawhney K J Synchrotron Radiat; 2024 Jul; 31(Pt 4):706-715. PubMed ID: 38904938 [TBL] [Abstract][Full Text] [Related]
13. Measurement techniques to improve the accuracy of x-ray mirror metrology using stitching Shack-Hartmann wavefront sensors. Adapa BR; Dovillaire G; Vivo A; Perrin F; Mayer R; Barrett R Rev Sci Instrum; 2021 Nov; 92(11):113103. PubMed ID: 34852555 [TBL] [Abstract][Full Text] [Related]
14. Environmental influences on autocollimator-based angle and form metrology. Geckeler RD; Křen P; Just A; Schumann M; Krause M; Lacey I; Yashchuk VV Rev Sci Instrum; 2019 Feb; 90(2):021705. PubMed ID: 30831764 [TBL] [Abstract][Full Text] [Related]
15. Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning technique. Wang H; Kashyap Y; Laundy D; Sawhney K J Synchrotron Radiat; 2015 Jul; 22(4):925-9. PubMed ID: 26134795 [TBL] [Abstract][Full Text] [Related]
16. Advanced in situ metrology for x-ray beam shaping with super precision. Wang H; Sutter J; Sawhney K Opt Express; 2015 Jan; 23(2):1605-14. PubMed ID: 25835918 [TBL] [Abstract][Full Text] [Related]
17. Multi-pitch self-calibration measurement using a nano-accuracy surface profiler for X-ray mirror metrology. Huang L; Wang T; Nicolas J; Polack F; Zuo C; Nakhoda K; Idir M Opt Express; 2020 Aug; 28(16):23060-23074. PubMed ID: 32752308 [TBL] [Abstract][Full Text] [Related]
18. At-wavelength metrology of hard X-ray mirror using near field speckle. Berujon S; Wang H; Alcock S; Sawhney K Opt Express; 2014 Mar; 22(6):6438-46. PubMed ID: 24663992 [TBL] [Abstract][Full Text] [Related]
19. On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology. Siewert F; Buchheim J; Zeschke T; Störmer M; Falkenberg G; Sankari R J Synchrotron Radiat; 2014 Sep; 21(Pt 5):968-75. PubMed ID: 25177985 [TBL] [Abstract][Full Text] [Related]