These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

277 related articles for article (PubMed ID: 33087734)

  • 1. Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy.
    Beyer A; Krause FF; Robert HL; Firoozabadi S; Grieb T; Kükelhan P; Heimes D; Schowalter M; Müller-Caspary K; Rosenauer A; Volz K
    Sci Rep; 2020 Oct; 10(1):17890. PubMed ID: 33087734
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si.
    Grieb T; Krause FF; Müller-Caspary K; Firoozabadi S; Mahr C; Schowalter M; Beyer A; Oppermann O; Volz K; Rosenauer A
    Ultramicroscopy; 2021 Feb; 221():113175. PubMed ID: 33383361
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Quantitative atomic cross section analysis by 4D-STEM and EELS.
    Seifer S; Houben L; Elbaum M
    Ultramicroscopy; 2024 May; 259():113936. PubMed ID: 38359631
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM.
    Firoozabadi S; Kükelhan P; Beyer A; Lehr J; Heimes D; Volz K
    Ultramicroscopy; 2022 Oct; 240():113550. PubMed ID: 35724620
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Materials characterisation by angle-resolved scanning transmission electron microscopy.
    Müller-Caspary K; Oppermann O; Grieb T; Krause FF; Rosenauer A; Schowalter M; Mehrtens T; Beyer A; Volz K; Potapov P
    Sci Rep; 2016 Nov; 6():37146. PubMed ID: 27849001
    [TBL] [Abstract][Full Text] [Related]  

  • 6. An inelastic multislice simulation method incorporating plasmon energy losses.
    Mendis BG
    Ultramicroscopy; 2019 Nov; 206():112816. PubMed ID: 31377522
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.
    Grieb T; Krause FF; Müller-Caspary K; Ahl JP; Schowalter M; Oppermann O; Hertkorn J; Engl K; Rosenauer A
    Ultramicroscopy; 2022 Aug; 238():113535. PubMed ID: 35526315
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Scattering angle dependence of temperature susceptivity of electron scattering in scanning transmission electron microscopy.
    Zhu M; Hwang J
    Ultramicroscopy; 2022 Jan; 232():113419. PubMed ID: 34740029
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution.
    Robert HL; Lobato I; Lyu FJ; Chen Q; Van Aert S; Van Dyck D; Müller-Caspary K
    Ultramicroscopy; 2022 Mar; 233():113425. PubMed ID: 34800894
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Decisive factors for realizing atomic-column resolution using STEM and EELS .
    Kimoto K; Ishizuka K; Matsui Y
    Micron; 2008 Aug; 39(6):653-7. PubMed ID: 18788098
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Decisive factors for realizing atomic-column resolution using STEM and EELS.
    Kimoto K; Ishizuka K; Matsui Y
    Micron; 2008; 39(3):257-62. PubMed ID: 18054240
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging.
    Beyer A; Belz J; Knaub N; Jandieri K; Volz K
    Ultramicroscopy; 2016 Oct; 169():1-10. PubMed ID: 27391526
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?
    Xin HL; Dwyer C; Muller DA
    Ultramicroscopy; 2014 Apr; 139():38-46. PubMed ID: 24561427
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Spatially resolved diffractometry with atomic-column resolution.
    Kimoto K; Ishizuka K
    Ultramicroscopy; 2011 Jul; 111(8):1111-6. PubMed ID: 21740874
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Scattering intensity distribution dependence on collection angles in annular dark-field STEM-in-SEM images.
    Holm J
    Ultramicroscopy; 2018 Dec; 195():12-20. PubMed ID: 30172856
    [TBL] [Abstract][Full Text] [Related]  

  • 16. The role of symmetry in the theory of inelastic high-energy electron scattering and its application to atomic-resolution core-loss imaging.
    Dwyer C
    Ultramicroscopy; 2015 Apr; 151():68-77. PubMed ID: 25541390
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Electron beam broadening in electron-transparent samples at low electron energies.
    Hugenschmidt M; Müller E; Gerthsen D
    J Microsc; 2019 Jun; 274(3):150-157. PubMed ID: 31001840
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction.
    Addiego C; Gao W; Pan X
    Ultramicroscopy; 2020 Jan; 208():112850. PubMed ID: 31629166
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Photoelectron angular distribution from free SiO
    Antonsson E; Langer B; Halfpap I; Gottwald J; Rühl E
    J Chem Phys; 2017 Jun; 146(24):244301. PubMed ID: 28668021
    [TBL] [Abstract][Full Text] [Related]  

  • 20. The influence of inelastic scattering on EFTEM images--exemplified at 20 kV for graphene and silicon.
    Lee Z; Rose H; Hambach R; Wachsmuth P; Kaiser U
    Ultramicroscopy; 2013 Nov; 134():102-12. PubMed ID: 23870401
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 14.