These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

164 related articles for article (PubMed ID: 33182409)

  • 1. In Situ and Real-Time Nanoscale Monitoring of Ultra-Thin Metal Film Growth Using Optical and Electrical Diagnostic Tools.
    Colin J; Jamnig A; Furgeaud C; Michel A; Pliatsikas N; Sarakinos K; Abadias G
    Nanomaterials (Basel); 2020 Nov; 10(11):. PubMed ID: 33182409
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Atomic-scale diffusion rates during growth of thin metal films on weakly-interacting substrates.
    Jamnig A; Sangiovanni DG; Abadias G; Sarakinos K
    Sci Rep; 2019 Apr; 9(1):6640. PubMed ID: 31036908
    [TBL] [Abstract][Full Text] [Related]  

  • 3. A load-lock compatible system for in situ electrical resistivity measurements during thin film growth.
    Colin JJ; Diot Y; Guerin P; Lamongie B; Berneau F; Michel A; Jaouen C; Abadias G
    Rev Sci Instrum; 2016 Feb; 87(2):023902. PubMed ID: 26931861
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Influence of Oxygen Concentration on the Performance of Ultra-Thin RF Magnetron Sputter Deposited Indium Tin Oxide Films as a Top Electrode for Photovoltaic Devices.
    Gwamuri J; Marikkannan M; Mayandi J; Bowen PK; Pearce JM
    Materials (Basel); 2016 Jan; 9(1):. PubMed ID: 28787863
    [TBL] [Abstract][Full Text] [Related]  

  • 5. In Situ Study of the Interface-Mediated Solid-State Reactions during Growth and Postgrowth Annealing of Pd/a-Ge Bilayers.
    Krause B; Abadias G; Babonneau D; Michel A; Resta A; Coati A; Garreau Y; Vlad A; Plech A; Wochner P; Baumbach T
    ACS Appl Mater Interfaces; 2023 Mar; 15(8):11268-11280. PubMed ID: 36791093
    [TBL] [Abstract][Full Text] [Related]  

  • 6. In situ stress evolution during and after sputter deposition of Al thin films.
    Pletea M; Koch R; Wendrock H; Kaltofen R; Schmidt OG
    J Phys Condens Matter; 2009 Jun; 21(22):225008. PubMed ID: 21715772
    [TBL] [Abstract][Full Text] [Related]  

  • 7. On the O
    Zapata R; Balestrieri M; Gozhyk I; Montigaud H; Lazzari R
    ACS Appl Mater Interfaces; 2023 Aug; 15(30):36951-36965. PubMed ID: 37480335
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Growth, structure and stability of sputter-deposited MoS
    Kaindl R; Bayer BC; Resel R; Müller T; Skakalova V; Habler G; Abart R; Cherevan AS; Eder D; Blatter M; Fischer F; Meyer JC; Polyushkin DK; Waldhauser W
    Beilstein J Nanotechnol; 2017; 8():1115-1126. PubMed ID: 28685112
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Metal-Insulator Transition of Ultrathin Sputtered Metals on Phenolic Resin Thin Films: Growth Morphology and Relations to Surface Free Energy and Reactivity.
    Schuster C; Rennhofer H; Amenitsch H; Lichtenegger HC; Jungbauer A; Tscheliessing R
    Nanomaterials (Basel); 2021 Feb; 11(3):. PubMed ID: 33652867
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Real-Time Monitoring of Morphology and Optical Properties during Sputter Deposition for Tailoring Metal-Polymer Interfaces.
    Schwartzkopf M; Santoro G; Brett CJ; Rothkirch A; Polonskyi O; Hinz A; Metwalli E; Yao Y; Strunskus T; Faupel F; Müller-Buschbaum P; Roth SV
    ACS Appl Mater Interfaces; 2015 Jun; 7(24):13547-56. PubMed ID: 26030314
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Real Time Spectroscopic Ellipsometry Analysis of First Stage CuIn
    Pradhan P; Aryal P; Attygalle D; Ibdah AR; Koirala P; Li J; Bhandari KP; Liyanage GK; Ellingson RJ; Heben MJ; Marsillac S; Collins RW; Podraza NJ
    Materials (Basel); 2018 Jan; 11(1):. PubMed ID: 29337931
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Wafer-Scale Synthesis of 2D Materials by an Amorphous Phase-Mediated Crystallization Approach.
    Jaiswal S; Fathi-Hafshejani P; Yakupoglu B; Boebinger MG; Azam N; Unocic RR; Hamilton MC; Mahjouri-Samani M
    ACS Appl Mater Interfaces; 2023 Aug; 15(33):39697-39706. PubMed ID: 37579298
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition.
    Bohórquez C; Bakkali H; Delgado JJ; Blanco E; Herrera M; Domínguez M
    ACS Appl Electron Mater; 2022 Mar; 4(3):925-935. PubMed ID: 35607319
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry.
    Kilic U; Mock A; Sekora D; Gilbert S; Valloppilly S; Melendez G; Ianno N; Langell M; Schubert E; Schubert M
    Sci Rep; 2020 Jun; 10(1):10392. PubMed ID: 32587273
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Probing the Interplay between Mo Back Contact Layer Deposition Condition and MoSe
    Za'abar F'; Mahmood Zuhdi AW; Doroody C; Chelvanathan P; Yusoff Y; Abdullah SF; Bahrudin MS; Wan Adini WS; Ahmad I; Wan Abdullah WS; Amin N
    Materials (Basel); 2023 Mar; 16(6):. PubMed ID: 36984377
    [TBL] [Abstract][Full Text] [Related]  

  • 16. In-situ spatial and temporal electrical characterization of ZnO thin films deposited by atmospheric pressure chemical vapour deposition on flexible polymer substrates.
    Jones A; Mistry K; Kao M; Shahin A; Yavuz M; Musselman KP
    Sci Rep; 2020 Nov; 10(1):19947. PubMed ID: 33203953
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Elucidating the role of nitrogen plasma composition in the low-temperature self-limiting growth of indium nitride thin films.
    Ilhom S; Mohammad A; Shukla D; Grasso J; Willis BG; Okyay AK; Biyikli N
    RSC Adv; 2020 Jul; 10(46):27357-27368. PubMed ID: 35516968
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Substrate Bias Voltage Tailoring the Interfacial Chemistry of a-SiC
    Crespi ÂE; Leidens LM; Antunes V; Perotti BL; Michels AF; Alvarez F; Figueroa CA
    ACS Appl Mater Interfaces; 2019 May; 11(19):18024-18033. PubMed ID: 30951281
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Epitaxial growth of Cu(001) thin films onto Si(001) using a single-step HiPIMS process.
    Cemin F; Lundin D; Furgeaud C; Michel A; Amiard G; Minea T; Abadias G
    Sci Rep; 2017 May; 7(1):1655. PubMed ID: 28490804
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Direct Observation of the Thickness-Induced Crystallization and Stress Build-Up during Sputter-Deposition of Nanoscale Silicide Films.
    Krause B; Abadias G; Michel A; Wochner P; Ibrahimkutty S; Baumbach T
    ACS Appl Mater Interfaces; 2016 Dec; 8(50):34888-34895. PubMed ID: 27998117
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.