216 related articles for article (PubMed ID: 33222706)
21. Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry.
Tiddia M; Mihara I; Seah MP; Trindade GF; Kollmer F; Roberts CJ; Hague R; Mula G; Gilmore IS; Havelund R
ACS Appl Mater Interfaces; 2019 Jan; 11(4):4500-4506. PubMed ID: 30604956
[TBL] [Abstract][Full Text] [Related]
22. Investigation of resins suitable for the preparation of biological sample for 3-D electron microscopy.
Kizilyaprak C; Longo G; Daraspe J; Humbel BM
J Struct Biol; 2015 Feb; 189(2):135-46. PubMed ID: 25433274
[TBL] [Abstract][Full Text] [Related]
23. Revealing surface oxidation on the organic semi-conducting single crystal rubrene with time of flight secondary ion mass spectroscopy.
Thompson RJ; Fearn S; Tan KJ; Cramer HG; Kloc CL; Curson NJ; Mitrofanov O
Phys Chem Chem Phys; 2013 Apr; 15(14):5202-7. PubMed ID: 23455651
[TBL] [Abstract][Full Text] [Related]
24. High aspect ratio AFM Probe processing by helium-ion-beam induced deposition.
Onishi K; Guo H; Nagano S; Fujita D
Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i30. PubMed ID: 25359832
[TBL] [Abstract][Full Text] [Related]
25. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputtering.
Chang CJ; Chang HY; You YW; Liao HY; Kuo YT; Kao WL; Yen GJ; Tsai MH; Shyue JJ
Anal Chim Acta; 2012 Mar; 718():64-9. PubMed ID: 22305899
[TBL] [Abstract][Full Text] [Related]
26. High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer.
Jiang J; Hua L; Xie Y; Cao Y; Wen Y; Chen P; Li H
J Am Soc Mass Spectrom; 2021 May; 32(5):1196-1204. PubMed ID: 33876638
[TBL] [Abstract][Full Text] [Related]
27. Cluster secondary ion mass spectrometry and the temperature dependence of molecular depth profiles.
Mao D; Wucher A; Brenes DA; Lu C; Winograd N
Anal Chem; 2012 May; 84(9):3981-9. PubMed ID: 22455606
[TBL] [Abstract][Full Text] [Related]
28. Two-dimensional and three-dimensional dynamic imaging of live biofilms in a microchannel by time-of-flight secondary ion mass spectrometry.
Hua X; Marshall MJ; Xiong Y; Ma X; Zhou Y; Tucker AE; Zhu Z; Liu S; Yu XY
Biomicrofluidics; 2015 May; 9(3):031101. PubMed ID: 26015837
[TBL] [Abstract][Full Text] [Related]
29. Surface morphology and chemistry of Prunus laurocerasus L. leaves: a study using X-ray photoelectron spectroscopy, time-of-flight secondary-ion mass spectrometry, atomic-force microscopy and scanning-electron microscopy.
Perkins MC; Roberts CJ; Briggs D; Davies MC; Friedmann A; Hart CA; Bell GA
Planta; 2005 Apr; 221(1):123-34. PubMed ID: 15565289
[TBL] [Abstract][Full Text] [Related]
30. Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry.
Wagner MS
Anal Chem; 2005 Feb; 77(3):911-22. PubMed ID: 15679361
[TBL] [Abstract][Full Text] [Related]
31. Application of focused ion-beam sampling for sidewall-roughness measurement of free-standing sub-μm objects by atomic force microscopy.
Nagatomi T; Nakao T; Fujimoto Y
Microscopy (Oxf); 2020 Mar; 69(1):11-16. PubMed ID: 31943021
[TBL] [Abstract][Full Text] [Related]
32. Enhanced Laterally Resolved ToF-SIMS and AFM Imaging of the Electrically Conductive Structures in Cable Bacteria.
Thiruvallur Eachambadi R; Boschker HTS; Franquet A; Spampinato V; Hidalgo-Martinez S; Valcke R; Meysman FJR; Manca JV
Anal Chem; 2021 May; 93(19):7226-7234. PubMed ID: 33939426
[TBL] [Abstract][Full Text] [Related]
33. Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application
Lorenz M; Zhang J; Shard AG; Vorng JL; Rakowska PD; Gilmore IS
Anal Chem; 2021 Feb; 93(7):3436-3444. PubMed ID: 33571411
[TBL] [Abstract][Full Text] [Related]
34. Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy study of 2-phenylimidazole on brass.
Finšgar M
Rapid Commun Mass Spectrom; 2021 Jan; 35(2):e8974. PubMed ID: 33053255
[TBL] [Abstract][Full Text] [Related]
35. FIB-SEM cathodoluminescence tomography: practical and theoretical considerations.
De Winter DA; Lebbink MN; Wiggers De Vries DF; Post JA; Drury MR
J Microsc; 2011 Sep; 243(3):315-26. PubMed ID: 21692799
[TBL] [Abstract][Full Text] [Related]
36. State-of-the-Art Three-Dimensional Chemical Characterization of Solid Oxide Fuel Cell Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Tomography.
Priebe A; Bleuet P; Goret G; Laurencin J; Montinaro D; Barnes JP
Microsc Microanal; 2016 Dec; 22(6):1261-1269. PubMed ID: 27998367
[TBL] [Abstract][Full Text] [Related]
37. Control of the average spacing between aligned gold nanoparticles by varying the FIB dose.
Rezaee A; Aliganga AK; Pavelka LC; Mittler S
Phys Chem Chem Phys; 2010 Apr; 12(16):4104-11. PubMed ID: 20379501
[TBL] [Abstract][Full Text] [Related]
38. Molecular depth profiling by wedged crater beveling.
Mao D; Lu C; Winograd N; Wucher A
Anal Chem; 2011 Aug; 83(16):6410-7. PubMed ID: 21744861
[TBL] [Abstract][Full Text] [Related]
39. Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry to Depth Profile Nanoparticles in Polymer Nanocomposites.
Zhang AC; Maguire SM; Ford JT; Composto RJ
Microsc Microanal; 2023 Sep; 29(5):1557-1565. PubMed ID: 37639375
[TBL] [Abstract][Full Text] [Related]
40. High sensitivity and high resolution element 3D analysis by a combined SIMS-SPM instrument.
Fleming Y; Wirtz T
Beilstein J Nanotechnol; 2015; 6():1091-9. PubMed ID: 26171285
[TBL] [Abstract][Full Text] [Related]
[Previous] [Next] [New Search]
