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20. Erratum: "Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy" [Rev. Sci. Instrum. 92, 023703 (2021)]. Kaja K; Mariolle D; Chevalier N; Naja A; Jouiad M Rev Sci Instrum; 2021 Apr; 92(4):049901. PubMed ID: 34243477 [No Abstract] [Full Text] [Related] [Next] [New Search]