These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

133 related articles for article (PubMed ID: 34134066)

  • 1. Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy.
    Jóźwik I; Jagielski J; Dumiszewska E; Kamiński M; Kentsch U
    Ultramicroscopy; 2021 Sep; 228():113333. PubMed ID: 34134066
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Damage-induced voltage alteration (DIVA) contrast in SEM images of ion-irradiated semiconductors.
    Jóźwik I; Barcz A; Dąbrowska E; Dumiszewska E; Michałowski PP
    Ultramicroscopy; 2019 Sep; 204():6-9. PubMed ID: 31108365
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Electron beam broadening in electron-transparent samples at low electron energies.
    Hugenschmidt M; Müller E; Gerthsen D
    J Microsc; 2019 Jun; 274(3):150-157. PubMed ID: 31001840
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment.
    Lee JW; Park IY; Ogawa T
    Ultramicroscopy; 2024 Mar; 257():113908. PubMed ID: 38134559
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Unravelling new principles of site-selective doping contrast in the dual-beam focused ion beam/scanning electron microscope.
    Chee AKW
    Ultramicroscopy; 2020 Jun; 213():112947. PubMed ID: 32361280
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Investigation of the Image Contrast in an Ultra-Low Voltage Scanning Electron Microscope Using an Auger Electron Spectrometer.
    Sakuda Y; Asahina S; Togashi T; Terasaki O; Kurihara M
    Microsc Microanal; 2020 Aug; 26(4):758-767. PubMed ID: 31753049
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Utilizing the charging effect in scanning electron microscopy.
    Zhang HB; Feng RJ; Ura K
    Sci Prog; 2004; 87(Pt 4):249-68. PubMed ID: 16028835
    [TBL] [Abstract][Full Text] [Related]  

  • 8. The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics.
    Stevens-Kalceff MA; Levick KJ
    Microsc Res Tech; 2007 Mar; 70(3):195-204. PubMed ID: 17279517
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Analytical scanning electron microscopy for solid surface.
    Ichinokawa T
    J Electron Microsc Tech; 1989 Jul; 12(3):219-27. PubMed ID: 2795228
    [TBL] [Abstract][Full Text] [Related]  

  • 10. A compact, versatile low-energy electron beam ion source.
    Zschornack G; König J; Schmidt M; Thorn A
    Rev Sci Instrum; 2014 Feb; 85(2):02B703. PubMed ID: 24593602
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Enhancement of image contrast for carbon nanotube and polymer composite film in scanning electron microscope.
    Hashimoto Y; Ito H; Sasajima M
    Microscopy (Oxf); 2020 May; 69(3):167-172. PubMed ID: 32115663
    [TBL] [Abstract][Full Text] [Related]  

  • 12. On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope.
    Sun C; Müller E; Meffert M; Gerthsen D
    Microsc Microanal; 2018 Apr; 24(2):99-106. PubMed ID: 29589573
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Simulation study on image contrast and spatial resolution in helium ion microscope.
    Inai K; Ohya K; Ishitani T
    J Electron Microsc (Tokyo); 2007 Oct; 56(5):163-9. PubMed ID: 17989086
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Origins of material contrast in scanning ion microscope images.
    Ishitani T; Madokoro Y; Nakagawa M; Ohya K
    J Electron Microsc (Tokyo); 2002; 51(4):207-13. PubMed ID: 12227550
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV.
    Mikmeková Š; Aoyama T
    Ultramicroscopy; 2021 Jan; 220():113144. PubMed ID: 33126106
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Surface potential distribution of resist exposed by electron beam and the non-charging exposure conditions.
    Kotera M; Kono Y
    Microscopy (Oxf); 2024 Sep; ():. PubMed ID: 39300968
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Observation of the ion-mirror effect during microscopy of insulating materials.
    Croccolo F; Riccardi C
    J Microsc; 2008 Jan; 229(Pt 1):39-43. PubMed ID: 18173643
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures.
    Srinivasan A; Han W; Khursheed A
    Microsc Microanal; 2018 Oct; 24(5):453-460. PubMed ID: 30277195
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200 kev.
    Li P; Egerton RF
    Ultramicroscopy; 2004 Nov; 101(2-4):161-72. PubMed ID: 15450662
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Contrast mechanism at landing energy near 0 eV in super low-energy scanning electron microscopy.
    Aoyama T; Mikmeková Š; Kumagai K
    Microscopy (Oxf); 2024 Jun; 73(3):243-250. PubMed ID: 37616515
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.