These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
128 related articles for article (PubMed ID: 34199213)
1. Capacitive Measurements of SiO Lee H; Shin K; Moon W Sensors (Basel); 2021 Jun; 21(12):. PubMed ID: 34199213 [TBL] [Abstract][Full Text] [Related]
2. Improving the Performance of the ToGoFET Probe: Advances in Design, Fabrication, and Signal Processing. Lee H; Kim J; Shin K; Moon W Micromachines (Basel); 2021 Oct; 12(11):. PubMed ID: 34832715 [TBL] [Abstract][Full Text] [Related]
3. A scanning microscopy technique based on capacitive coupling with a field-effect transistor integrated with the tip. Shin K; Kang Ds; Lee Sh; Moon W Ultramicroscopy; 2015 Dec; 159 Pt 1():1-10. PubMed ID: 26231315 [TBL] [Abstract][Full Text] [Related]
4. Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy. Castellano-Hernández E; Moreno-Llorena J; Sáenz JJ; Sacha GM J Phys Condens Matter; 2012 Apr; 24(15):155303. PubMed ID: 22442155 [TBL] [Abstract][Full Text] [Related]
5. Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy. Coq Germanicus R; De Wolf P; Lallemand F; Bunel C; Bardy S; Murray H; Lüders U Beilstein J Nanotechnol; 2020; 11():1764-1775. PubMed ID: 33299736 [TBL] [Abstract][Full Text] [Related]
6. Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices. Gysin U; Glatzel T; Schmölzer T; Schöner A; Reshanov S; Bartolf H; Meyer E Beilstein J Nanotechnol; 2015; 6():2485-97. PubMed ID: 26885461 [TBL] [Abstract][Full Text] [Related]
7. DC-free Method to Evaluate Nanoscale Equivalent Oxide Thickness: Dark-Mode Scanning Capacitance Microscopy. Chang MN; Wu YS; Lin CJ; Hsueh YH; Su CJ; Lee YJ Nanomaterials (Basel); 2024 May; 14(11):. PubMed ID: 38869559 [TBL] [Abstract][Full Text] [Related]
8. On the Limits of Scanning Thermal Microscopy of Ultrathin Films. Metzke C; Frammelsberger W; Weber J; Kühnel F; Zhu K; Lanza M; Benstetter AG Materials (Basel); 2020 Jan; 13(3):. PubMed ID: 31978971 [TBL] [Abstract][Full Text] [Related]
9. Fast and reliable method of conductive carbon nanotube-probe fabrication for scanning probe microscopy. Dremov V; Fedoseev V; Fedorov P; Grebenko A Rev Sci Instrum; 2015 May; 86(5):053703. PubMed ID: 26026528 [TBL] [Abstract][Full Text] [Related]
10. Whispering-gallery acoustic sensing: characterization of mesoscopic films and scanning probe microscopy applications. La Rosa AH; Li N; Fernandez R; Wang X; Nordstrom R; Padigi SK Rev Sci Instrum; 2011 Sep; 82(9):093704. PubMed ID: 21974591 [TBL] [Abstract][Full Text] [Related]
11. Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy. Krivcov A; Ehrler J; Fuhrmann M; Junkers T; Möbius H Beilstein J Nanotechnol; 2019; 10():1056-1064. PubMed ID: 31165032 [TBL] [Abstract][Full Text] [Related]
12. Creating nanocrystals in amorphous silicon using a conductive tip. Rezek B; Sípek E; Ledinský M; Stuchlík J; Vetushka A; Kocka J Nanotechnology; 2009 Jan; 20(4):045302. PubMed ID: 19417314 [TBL] [Abstract][Full Text] [Related]
14. Imaging Channel Connectivity in Nafion Using Electrostatic Force Microscopy. Barnes AM; Buratto SK J Phys Chem B; 2018 Jan; 122(3):1289-1295. PubMed ID: 29290118 [TBL] [Abstract][Full Text] [Related]
15. Microscopic techniques bridging between nanoscale and microscale with an atomically sharpened tip - field ion microscopy/scanning probe microscopy/ scanning electron microscopy. Tomitori M; Sasahara A Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i11-i12. PubMed ID: 25359799 [TBL] [Abstract][Full Text] [Related]
16. Correlative analysis of embedded silicon interface passivation by Kelvin probe force microscopy and corona oxide characterization of semiconductor. Aubriet V; Courouble K; Gros-Jean M; Borowik Ł Rev Sci Instrum; 2021 Aug; 92(8):083905. PubMed ID: 34470380 [TBL] [Abstract][Full Text] [Related]
17. Diamond-modified AFM probes: from diamond nanowires to atomic force microscopy-integrated boron-doped diamond electrodes. Smirnov W; Kriele A; Hoffmann R; Sillero E; Hees J; Williams OA; Yang N; Kranz C; Nebel CE Anal Chem; 2011 Jun; 83(12):4936-41. PubMed ID: 21534601 [TBL] [Abstract][Full Text] [Related]
19. Growth and etch rate study of low temperature anodic silicon dioxide thin films. Ashok A; Pal P ScientificWorldJournal; 2014; 2014():106029. PubMed ID: 24672287 [TBL] [Abstract][Full Text] [Related]