These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
249 related articles for article (PubMed ID: 34201620)
41. AlGaN/GaN on SiC Devices without a GaN Buffer Layer: Electrical and Noise Characteristics. Jorudas J; Šimukovič A; Dub M; Sakowicz M; Prystawko P; Indrišiūnas S; Kovalevskij V; Rumyantsev S; Knap W; Kašalynas I Micromachines (Basel); 2020 Dec; 11(12):. PubMed ID: 33419371 [TBL] [Abstract][Full Text] [Related]
42. Interference effects in GaN high electron mobility transistor power amplifier induced by microwave pulses. Zhao J; Chen Q; Chen C; Chen Z; Liu Z; Zhao G Sci Rep; 2022 Oct; 12(1):16922. PubMed ID: 36209287 [TBL] [Abstract][Full Text] [Related]
43. Power Electronics Revolutionized: A Comprehensive Analysis of Emerging Wide and Ultrawide Bandgap Devices. Rafin SMSH; Ahmed R; Haque MA; Hossain MK; Haque MA; Mohammed OA Micromachines (Basel); 2023 Oct; 14(11):. PubMed ID: 38004900 [TBL] [Abstract][Full Text] [Related]
44. The Influence of the Different Repair Methods on the Electrical Properties of the Normally off p-GaN HEMT. Niu D; Wang Q; Li W; Chen C; Xu J; Jiang L; Feng C; Xiao H; Wang Q; Xu X; Wang X Micromachines (Basel); 2021 Jan; 12(2):. PubMed ID: 33530451 [TBL] [Abstract][Full Text] [Related]
45. Vertical GaN MOSFET Power Devices. Langpoklakpam C; Liu AC; Hsiao YK; Lin CH; Kuo HC Micromachines (Basel); 2023 Oct; 14(10):. PubMed ID: 37893374 [TBL] [Abstract][Full Text] [Related]
46. Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer. Chang SJ; Kim DS; Kim TW; Lee JH; Bae Y; Jung HW; Kang SC; Kim H; Noh YS; Lee SH; Kim SI; Ahn HK; Lim JW Nanomaterials (Basel); 2020 Oct; 10(11):. PubMed ID: 33143313 [TBL] [Abstract][Full Text] [Related]
47. Breakdown Behavior of Metal Contact Positions in GaN HEMT with Nitrogen-Implanted Gate Using TCAD Simulation. Sheu G; Song YL; Mogarala R; Susmitha D; Issac K Micromachines (Basel); 2022 Jan; 13(2):. PubMed ID: 35208294 [TBL] [Abstract][Full Text] [Related]
48. Study of Normally-Off AlGaN/GaN HEMT with Microfield Plate for Improvement of Breakdown Voltage. Xia X; Guo Z; Sun H Micromachines (Basel); 2021 Oct; 12(11):. PubMed ID: 34832730 [TBL] [Abstract][Full Text] [Related]
49. A Wideband High-Efficiency GaN MMIC Power Amplifier for Sub-6-GHz Applications. Hu L; Liao X; Zhang F; Wu H; Ma S; Lin Q; Tang X Micromachines (Basel); 2022 May; 13(5):. PubMed ID: 35630260 [TBL] [Abstract][Full Text] [Related]
50. Mechanisms of the Device Property Alteration Generated by the Proton Irradiation in GaN-Based MIS-HEMTs Using Extremely Thin Gate Insulator. Chang SJ; Kim DS; Kim TW; Bae Y; Jung HW; Choi IG; Noh YS; Lee SH; Kim SI; Ahn HK; Kang DM; Lim JW Nanomaterials (Basel); 2023 Feb; 13(5):. PubMed ID: 36903774 [TBL] [Abstract][Full Text] [Related]
51. Fabrication and Evaluation of N-Channel GaN Metal-Oxide-Semiconductor Field-Effect Transistors Based on Regrown and Implantation Methods. Nguyen HT; Yamada H; Yamada T; Takahashi T; Shimizu M Materials (Basel); 2020 Feb; 13(4):. PubMed ID: 32085428 [TBL] [Abstract][Full Text] [Related]
52. Charging Effect by Fluorine-Treatment and Recess Gate for Enhancement-Mode on AlGaN/GaN High Electron Mobility Transistors. Kang SC; Jung HW; Chang SJ; Kim SM; Lee SK; Lee BH; Kim H; Noh YS; Lee SH; Kim SI; Ahn HK; Lim JW Nanomaterials (Basel); 2020 Oct; 10(11):. PubMed ID: 33114425 [TBL] [Abstract][Full Text] [Related]
53. Review on Driving Circuits for Wide-Bandgap Semiconductor Switching Devices for Mid- to High-Power Applications. Ma CT; Gu ZH Micromachines (Basel); 2021 Jan; 12(1):. PubMed ID: 33430093 [TBL] [Abstract][Full Text] [Related]
54. A GaN HEMT Amplifier Design for Phased Array Radars and 5G New Radios. Kuchta D; Gryglewski D; Wojtasiak W Micromachines (Basel); 2020 Apr; 11(4):. PubMed ID: 32290236 [TBL] [Abstract][Full Text] [Related]
55. Study of Self-Heating and High-Power Microwave Effects for Enhancement-Mode p-Gate GaN HEMT. Qin Y; Chai C; Li F; Liang Q; Wu H; Yang Y Micromachines (Basel); 2022 Jan; 13(1):. PubMed ID: 35056271 [TBL] [Abstract][Full Text] [Related]
56. Impact of Gamma Radiation on Dynamic R Martínez PJ; Maset E; Martín-Holgado P; Morilla Y; Gilabert D; Sanchis-Kilders E Materials (Basel); 2019 Aug; 12(17):. PubMed ID: 31466249 [TBL] [Abstract][Full Text] [Related]
57. An MMIC LNA for Millimeter-Wave Radar and 5G Applications with GaN-on-SiC Technology. Huang C; Zhang Z; Wang X; Liu H; Zhang G Sensors (Basel); 2023 Jul; 23(14):. PubMed ID: 37514906 [TBL] [Abstract][Full Text] [Related]
58. An Experimental and Systematic Insight into the Temperature Sensitivity for a 0.15-µm Gate-Length HEMT Based on the GaN Technology. Alim MA; Gaquiere C; Crupi G Micromachines (Basel); 2021 May; 12(5):. PubMed ID: 34065962 [TBL] [Abstract][Full Text] [Related]
59. Realization of p-type gallium nitride by magnesium ion implantation for vertical power devices. Shi YT; Ren FF; Xu WZ; Chen X; Ye J; Li L; Zhou D; Zhang R; Zheng Y; Tan HH; Jagadish C; Lu H Sci Rep; 2019 Jun; 9(1):8796. PubMed ID: 31217468 [TBL] [Abstract][Full Text] [Related]
60. E/D-Mode GaN Inverter on a 150-mm Si Wafer Based on p-GaN Gate E-Mode HEMT Technology. Jia LF; Zhang L; Xiao JP; Cheng Z; Lin DF; Ai YJ; Zhao JC; Zhang Y Micromachines (Basel); 2021 May; 12(6):. PubMed ID: 34071834 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]