139 related articles for article (PubMed ID: 34243426)
1. Determination of calibration parameters of cantilevers of arbitrary shape by finite element analysis.
Rodriguez-Ramos J; Rico F
Rev Sci Instrum; 2021 Apr; 92(4):045001. PubMed ID: 34243426
[TBL] [Abstract][Full Text] [Related]
2. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
Yeh MK; Tai NH; Chen BY
Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
[TBL] [Abstract][Full Text] [Related]
3. Accuracy of the spring constant of atomic force microscopy cantilevers by finite element method.
Chen BY; Yeh MK; Tai NH
Anal Chem; 2007 Feb; 79(4):1333-8. PubMed ID: 17297931
[TBL] [Abstract][Full Text] [Related]
4. Spring constant calibration of atomic force microscope cantilevers of arbitrary shape.
Sader JE; Sanelli JA; Adamson BD; Monty JP; Wei X; Crawford SA; Friend JR; Marusic I; Mulvaney P; Bieske EJ
Rev Sci Instrum; 2012 Oct; 83(10):103705. PubMed ID: 23126772
[TBL] [Abstract][Full Text] [Related]
5. Calibration of the spring constant of cantilevers of arbitrary shape using the phase signal in an atomic force microscope.
Rawlings C; Durkan C
Nanotechnology; 2012 Dec; 23(48):485708. PubMed ID: 23137943
[TBL] [Abstract][Full Text] [Related]
6. Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulation.
Korayem MH; Saraie MB; Saraee MB
Ultramicroscopy; 2017 Apr; 175():9-24. PubMed ID: 28110179
[TBL] [Abstract][Full Text] [Related]
7. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers.
Killgore JP; Tung RC; Hurley DC
Nanotechnology; 2014 Aug; 25(34):345701. PubMed ID: 25098183
[TBL] [Abstract][Full Text] [Related]
8. Effect of cantilevers' dimensions on phase contrast in multifrequency atomic force microscopy.
Ehsanipour M; Damircheli M; Eslami B
Microsc Res Tech; 2019 Sep; 82(9):1438-1447. PubMed ID: 31106947
[TBL] [Abstract][Full Text] [Related]
9. Experimental determination of mode correction factors for thermal method spring constant calibration of AFM cantilevers using laser Doppler vibrometry.
Gates RS; Osborn WA; Pratt JR
Nanotechnology; 2013 Jun; 24(25):255706. PubMed ID: 23723188
[TBL] [Abstract][Full Text] [Related]
10. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope.
Sader JE; Lu J; Mulvaney P
Rev Sci Instrum; 2014 Nov; 85(11):113702. PubMed ID: 25430115
[TBL] [Abstract][Full Text] [Related]
11. Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor.
Xie H; Vitard J; Haliyo S; Régnier S; Boukallel M
Rev Sci Instrum; 2008 Mar; 79(3):033708. PubMed ID: 18377016
[TBL] [Abstract][Full Text] [Related]
12. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
Slattery AD; Blanch AJ; Quinton JS; Gibson CT
Ultramicroscopy; 2013 Aug; 131():46-55. PubMed ID: 23685172
[TBL] [Abstract][Full Text] [Related]
13. Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers.
Slattery AD; Blanch AJ; Quinton JS; Gibson CT
Nanotechnology; 2013 Jan; 24(1):015710. PubMed ID: 23220746
[TBL] [Abstract][Full Text] [Related]
14. Design of V-shaped cantilevers for enhanced multifrequency AFM measurements.
Damircheli M; Eslami B
Beilstein J Nanotechnol; 2020; 11():1525-1541. PubMed ID: 33094086
[TBL] [Abstract][Full Text] [Related]
15. Static and dynamic calibration of torsional spring constants of cantilevers.
Labuda A; Cao C; Walsh T; Meinhold J; Proksch R; Sun Y; Filleter T
Rev Sci Instrum; 2018 Sep; 89(9):093701. PubMed ID: 30278725
[TBL] [Abstract][Full Text] [Related]
16. Prototype cantilevers for quantitative lateral force microscopy.
Reitsma MG; Gates RS; Friedman LH; Cook RF
Rev Sci Instrum; 2011 Sep; 82(9):093706. PubMed ID: 21974593
[TBL] [Abstract][Full Text] [Related]
17. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever.
Yeh MK; Tai NH; Chen BY
Rev Sci Instrum; 2009 Apr; 80(4):043705. PubMed ID: 19405664
[TBL] [Abstract][Full Text] [Related]
18. Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: a kinetostatic method.
Tseytlin YM
Rev Sci Instrum; 2008 Feb; 79(2 Pt 1):025102. PubMed ID: 18315324
[TBL] [Abstract][Full Text] [Related]
19. 3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips.
Valdrè G; Moro D
Nanotechnology; 2008 Oct; 19(40):405502. PubMed ID: 21832618
[TBL] [Abstract][Full Text] [Related]
20. Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers.
Sader JE; Friend JR
Rev Sci Instrum; 2015 May; 86(5):056106. PubMed ID: 26026567
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
