These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

120 related articles for article (PubMed ID: 34343885)

  • 1. Crystalline defect analysis in epitaxial Si
    Han H; Strakos L; Hantschel T; Porret C; Vystavel T; Loo R; Caymax M
    Micron; 2021 Nov; 150():103123. PubMed ID: 34343885
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization.
    Deitz JI; Carnevale SD; Ringel SA; McComb DW; Grassman TJ
    J Vis Exp; 2015 Jul; (101):e52745. PubMed ID: 26274560
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Modelling Electron Channeling Contrast Intensity of Stacking Fault and Twin Boundary Using Crystal Thickness Effect.
    Kriaa H; Guitton A; Maloufi N
    Materials (Basel); 2021 Mar; 14(7):. PubMed ID: 33808289
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Observation and quantitative analysis of dislocations in steel using electron channeling contrast imaging method with precise control of electron beam incident direction.
    Mori T; Amino T; Yokoyama C; Taniguchi S; Yonezawa T; Taniyama A
    Microscopy (Oxf); 2023 Dec; ():. PubMed ID: 38113894
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Analysis of FIB-induced damage by electron channelling contrast imaging in the SEM.
    Gutierrez-Urrutia I
    J Microsc; 2017 Jan; 265(1):51-59. PubMed ID: 27546033
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Enhancing the defect contrast in ECCI through angular filtering of BSEs.
    Han H; Hantschel T; Schulze A; Strakos L; Vystavel T; Loo R; Kunert B; Langer R; Vandervorst W; Caymax M
    Ultramicroscopy; 2020 Mar; 210():112922. PubMed ID: 31896441
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast.
    Crimp MA
    Microsc Res Tech; 2006 May; 69(5):374-81. PubMed ID: 16646010
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations.
    Han H; Hantschel T; Strakos L; Vystavel T; Baryshnikova M; Mols Y; Kunert B; Langer R; Vandervorst W; Caymax M
    Ultramicroscopy; 2020 Mar; 210():112928. PubMed ID: 31918068
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Investigate on the Mechanism of HfO
    Yao Q; Ma X; Wang H; Wang Y; Wang G; Zhang J; Liu W; Wang X; Yan J; Li Y; Wang W
    Nanomaterials (Basel); 2021 Apr; 11(4):. PubMed ID: 33918553
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Characterization of Anomalous Grains in FeCo Magnetic Alloys.
    Deitz JI; Ruggles TJ; Noell PJ; Susan DF; Kustas AB; Kotula PG; Michael JR
    Microsc Microanal; 2023 Jun; 29(3):913-918. PubMed ID: 37749680
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Electron channeling contrast imaging of plastic deformation induced by indentation in polycrystalline nickel.
    Kaboli S; Goldbaum D; Chromik RR; Gauvin R
    Microsc Microanal; 2013 Dec; 19(6):1620-31. PubMed ID: 24119314
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Depth profiles of the interfacial strains of Si0.7Ge0.3/Si using three-beam Bragg-surface diffraction.
    Zheng YZ; Soo YL; Chang SL
    Sci Rep; 2016 May; 6():25580. PubMed ID: 27156699
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope.
    Kriaa H; Guitton A; Maloufi N
    Sci Rep; 2017 Aug; 7(1):9742. PubMed ID: 28851960
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Non-destructive characterization of extended crystalline defects in confined semiconductor device structures.
    Schulze A; Strakos L; Vystavel T; Loo R; Pacco A; Collaert N; Vandervorst W; Caymax M
    Nanoscale; 2018 Apr; 10(15):7058-7066. PubMed ID: 29616259
    [TBL] [Abstract][Full Text] [Related]  

  • 15. 4-Levels Vertically Stacked SiGe Channel Nanowires Gate-All-Around Transistor with Novel Channel Releasing and Source and Drain Silicide Process.
    Cheng X; Li Y; Zhao F; Chen A; Liu H; Li C; Zhang Q; Yin H; Luo J; Wang W
    Nanomaterials (Basel); 2022 Mar; 12(5):. PubMed ID: 35269377
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Sample preparation toward seamless 3D imaging technique from micrometer to nanometer scale.
    Miyake A; Matsuno J; Toh S
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i24-i25. PubMed ID: 25359821
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Study of Selective Dry Etching Effects of 15-Cycle Si
    Liu E; Li J; Zhou N; Chen R; Shao H; Gao J; Zhang Q; Kong Z; Lin H; Zhang C; Lai P; Yang C; Liu Y; Wang G; Zhao C; Yang T; Yin H; Li J; Luo J; Wang W
    Nanomaterials (Basel); 2023 Jul; 13(14):. PubMed ID: 37513138
    [TBL] [Abstract][Full Text] [Related]  

  • 18. 3D imaging of cells and tissues by focused ion beam/scanning electron microscopy (FIB/SEM).
    Drobne D
    Methods Mol Biol; 2013; 950():275-92. PubMed ID: 23086881
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Stage-Rocked Electron Channeling for Crystal Orientation Mapping.
    Hujsak KA; Myers BD; Grovogui J; Dravid VP
    Sci Rep; 2018 Mar; 8(1):5175. PubMed ID: 29581581
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Analysis of dislocation configurations in a [0 0 1] fcc single crystal by electron channeling contrast imaging in the SEM.
    Gutierrez-Urrutia I
    Microscopy (Oxf); 2017 Apr; 66(2):63-67. PubMed ID: 28423410
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.