These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
156 related articles for article (PubMed ID: 34361189)
41. Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates. Hübner R; Hecker M; Mattern N; Hoffmann V; Wetzig K; Engelmann HJ; Zschech E Anal Bioanal Chem; 2004 Jun; 379(4):568-75. PubMed ID: 15067495 [TBL] [Abstract][Full Text] [Related]
42. Effective suppression of nano-textured black silicon surface recombination channels through sputtered aluminum oxide: A comparison study with ALD grown films. Parashar PK Nanotechnology; 2020 Jun; ():. PubMed ID: 32604087 [TBL] [Abstract][Full Text] [Related]
44. Electron energy-loss spectroscopy study of thin film hafnium aluminates for novel gate dielectrics. Stemmer S; Chen ZQ; Zhu WJ; Ma TP J Microsc; 2003 Apr; 210(Pt 1):74-9. PubMed ID: 12694419 [TBL] [Abstract][Full Text] [Related]
45. Low Surface Recombination Velocity on P-Type Cz-Si Surface by Sol-Gel Deposition of Al2O3 Films for Solar Cell Applications. Balaji N; Park C; Raja J; Ju M; Venkatesan MR; Lee H; Yi J J Nanosci Nanotechnol; 2015 Jul; 15(7):5123-8. PubMed ID: 26373089 [TBL] [Abstract][Full Text] [Related]
46. Correlative analysis of embedded silicon interface passivation by Kelvin probe force microscopy and corona oxide characterization of semiconductor. Aubriet V; Courouble K; Gros-Jean M; Borowik Ł Rev Sci Instrum; 2021 Aug; 92(8):083905. PubMed ID: 34470380 [TBL] [Abstract][Full Text] [Related]
47. Thermal annealing effects on tunnel oxide passivated hole contacts for high-efficiency crystalline silicon solar cells. Kim YJ; Kweon IS; Min KH; Lee SH; Choi S; Jeong KT; Park S; Song HE; Kang MG; Kim KH Sci Rep; 2022 Sep; 12(1):15024. PubMed ID: 36056111 [TBL] [Abstract][Full Text] [Related]
48. Enhanced Si Passivation and PERC Solar Cell Efficiency by Atomic Layer Deposited Aluminum Oxide with Two-step Post Annealing. Hsu CH; Cho YS; Wu WY; Lien SY; Zhang XY; Zhu WZ; Zhang S; Chen SY Nanoscale Res Lett; 2019 Apr; 14(1):139. PubMed ID: 31001714 [TBL] [Abstract][Full Text] [Related]
49. Band Alignment and Surface Photo-Voltage Analysis of C-Si/Sio Alzahrani A; Harrison GT; Allen TG; De Bastiani M; Razzaq A; Van Kerschaver E; De Wolf S Chemphyschem; 2024 Aug; ():e202400687. PubMed ID: 39166708 [TBL] [Abstract][Full Text] [Related]
50. Nb Texture Evolution and Interdiffusion in Nb/Si-Layered Systems. Chandrasekaran A; van de Kruijs RWE; Sturm JM; Bijkerk F ACS Appl Mater Interfaces; 2021 Jul; 13(26):31260-31270. PubMed ID: 34165281 [TBL] [Abstract][Full Text] [Related]
51. Nanostructure of Porous Si and Anodic SiO Sundarapura P; Zhang XM; Yogai R; Murakami K; Fave A; Ihara M Nanomaterials (Basel); 2021 Feb; 11(2):. PubMed ID: 33670159 [TBL] [Abstract][Full Text] [Related]
52. Enhanced Lifetime of Polymer Solar Cells by Surface Passivation of Metal Oxide Buffer Layers. Venkatesan S; Ngo E; Khatiwada D; Zhang C; Qiao Q ACS Appl Mater Interfaces; 2015 Jul; 7(29):16093-100. PubMed ID: 26148302 [TBL] [Abstract][Full Text] [Related]
53. Measuring the lifetime of silicon nanocrystal solar cell photo-carriers by using Kelvin probe force microscopy and x-ray photoelectron spectroscopy. Borowik L; Lepage H; Chevalier N; Mariolle D; Renault O Nanotechnology; 2014 Jul; 25(26):265703. PubMed ID: 24916454 [TBL] [Abstract][Full Text] [Related]
54. Polarization memory effect in the photoluminescence of nc-Si-SiOx light-emitting structures. Michailovska K; Indutnyi I; Shepeliavyi P; Sopinskyy M Nanoscale Res Lett; 2016 Dec; 11(1):277. PubMed ID: 27255897 [TBL] [Abstract][Full Text] [Related]
55. Enhancement of Electrical Characteristics and Stability of Amorphous Si-Sn-O Thin Film Transistors with SiO Liu X; Wu W; Chen W; Ning H; Zhang X; Yuan W; Xiong M; Wang X; Yao R; Peng J Materials (Basel); 2018 Aug; 11(8):. PubMed ID: 30111704 [TBL] [Abstract][Full Text] [Related]
56. Electron tomography analysis of 3D interfacial nanostructures appearing in annealed Si rich SiC films. Xie L; Jarolimek K; Kocevski V; Rusz J; Zeman M; van Swaaij RACMM; Leifer K Nanoscale; 2017 May; 9(20):6703-6710. PubMed ID: 28485440 [TBL] [Abstract][Full Text] [Related]
57. Optimization of a Solution-Processed TiO Beyraghi N; Sahiner MC; Oguz O; Yerci S ACS Appl Mater Interfaces; 2024 Apr; 16(13):16950-16961. PubMed ID: 38502908 [TBL] [Abstract][Full Text] [Related]
58. Insight into the Degradation Mechanisms of Atomic Layer Deposited TiO Ros C; Carretero NM; David J; Arbiol J; Andreu T; Morante JR ACS Appl Mater Interfaces; 2019 Aug; 11(33):29725-29735. PubMed ID: 31347833 [TBL] [Abstract][Full Text] [Related]
59. Nanoscale Study of the Hole-Selective Passivating Contacts with High Thermal Budget Using C-AFM Tomography. Hývl M; Nogay G; Loper P; Haug FJ; Jeangros Q; Fejfar A; Ballif C; Ledinský M ACS Appl Mater Interfaces; 2021 Mar; 13(8):9994-10000. PubMed ID: 33591174 [TBL] [Abstract][Full Text] [Related]
60. Microstructure evolution in amorphous Hf-B-Si-C-N high temperature resistant coatings after annealing to 1500 °C in air. Shen Y; Jiang JC; Zeman P; Šímová V; Vlček J; Meletis EI Sci Rep; 2019 Mar; 9(1):3603. PubMed ID: 30837640 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]