These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

140 related articles for article (PubMed ID: 34470380)

  • 41. Study of high-low KPFM on a pn-patterned Si surface.
    Izumi R; Li YJ; Naitoh Y; Sugawara Y
    Microscopy (Oxf); 2022 Apr; 71(2):98-103. PubMed ID: 35018450
    [TBL] [Abstract][Full Text] [Related]  

  • 42. Kelvin probe force microscopy in liquid using electrochemical force microscopy.
    Collins L; Jesse S; Kilpatrick JI; Tselev A; Okatan MB; Kalinin SV; Rodriguez BJ
    Beilstein J Nanotechnol; 2015; 6():201-14. PubMed ID: 25671164
    [TBL] [Abstract][Full Text] [Related]  

  • 43. Role of ALD Al
    Napari M; Huq TN; Meeth DJ; Heikkilä MJ; Niang KM; Wang H; Iivonen T; Wang H; Leskelä M; Ritala M; Flewitt AJ; Hoye RLZ; MacManus-Driscoll JL
    ACS Appl Mater Interfaces; 2021 Jan; 13(3):4156-4164. PubMed ID: 33443398
    [TBL] [Abstract][Full Text] [Related]  

  • 44. Multimodal Kelvin Probe Force Microscopy Investigations of a Photovoltaic WSe
    Almadori Y; Bendiab N; Grévin B
    ACS Appl Mater Interfaces; 2018 Jan; 10(1):1363-1373. PubMed ID: 29218991
    [TBL] [Abstract][Full Text] [Related]  

  • 45. Silicon Nanowire Heterojunction Solar Cells with an Al
    Kato S; Kurokawa Y; Gotoh K; Soga T
    Nanoscale Res Lett; 2019 Mar; 14(1):99. PubMed ID: 30877482
    [TBL] [Abstract][Full Text] [Related]  

  • 46. Dip Coating Passivation of Crystalline Silicon by Lewis Acids.
    Ji W; Zhao Y; Fahad HM; Bullock J; Allen T; Lien DH; De Wolf S; Javey A
    ACS Nano; 2019 Mar; 13(3):3723-3729. PubMed ID: 30830749
    [TBL] [Abstract][Full Text] [Related]  

  • 47. Nanostructure of Porous Si and Anodic SiO
    Sundarapura P; Zhang XM; Yogai R; Murakami K; Fave A; Ihara M
    Nanomaterials (Basel); 2021 Feb; 11(2):. PubMed ID: 33670159
    [TBL] [Abstract][Full Text] [Related]  

  • 48. Surface potential modeling and reconstruction in Kelvin probe force microscopy.
    Xu J; Wu Y; Li W; Xu J
    Nanotechnology; 2017 Sep; 28(36):365705. PubMed ID: 28664875
    [TBL] [Abstract][Full Text] [Related]  

  • 49. Open loop Kelvin probe force microscopy with single and multi-frequency excitation.
    Collins L; Kilpatrick JI; Weber SA; Tselev A; Vlassiouk IV; Ivanov IN; Jesse S; Kalinin SV; Rodriguez BJ
    Nanotechnology; 2013 Nov; 24(47):475702. PubMed ID: 24176878
    [TBL] [Abstract][Full Text] [Related]  

  • 50. Investigation of Surface Sulfurization in CuIn
    Kim H; Park SJ; Kim B; Hwang YJ; Min BK
    Chemphyschem; 2018 Feb; 19(3):261-265. PubMed ID: 29143420
    [TBL] [Abstract][Full Text] [Related]  

  • 51. Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals.
    Almadori Y; Moerman D; Martinez JL; Leclère P; Grévin B
    Beilstein J Nanotechnol; 2018; 9():1695-1704. PubMed ID: 29977703
    [TBL] [Abstract][Full Text] [Related]  

  • 52. Probing Interface Defects in Top-Gated MoS
    Zhao P; Azcatl A; Gomeniuk YY; Bolshakov P; Schmidt M; McDonnell SJ; Hinkle CL; Hurley PK; Wallace RM; Young CD
    ACS Appl Mater Interfaces; 2017 Jul; 9(28):24348-24356. PubMed ID: 28650155
    [TBL] [Abstract][Full Text] [Related]  

  • 53. Nanoscale characterization of the dielectric charging phenomenon in PECVD silicon nitride thin films with various interfacial structures based on Kelvin probe force microscopy.
    Zaghloul U; Papaioannou GJ; Wang H; Bhushan B; Coccetti F; Pons P; Plana R
    Nanotechnology; 2011 May; 22(20):205708. PubMed ID: 21444948
    [TBL] [Abstract][Full Text] [Related]  

  • 54. PO
    Theeuwes RJ; Melskens J; Black LE; Beyer W; Koushik D; Berghuis WJH; Macco B; Kessels WMM
    ACS Appl Electron Mater; 2021 Oct; 3(10):4337-4347. PubMed ID: 34723186
    [TBL] [Abstract][Full Text] [Related]  

  • 55. Li
    Kim JY; Kim AY; Liu G; Woo JY; Kim H; Lee JK
    ACS Appl Mater Interfaces; 2018 Mar; 10(10):8692-8701. PubMed ID: 29461043
    [TBL] [Abstract][Full Text] [Related]  

  • 56. Direct observation of surface charge redistribution in active nanoscale conducting channels by Kelvin Probe Force Microscopy.
    Ye S; Yan X; Husain MK; Saito S; de Groot CHK; Tsuchiya Y
    Nanotechnology; 2021 May; 32(32):. PubMed ID: 33930886
    [TBL] [Abstract][Full Text] [Related]  

  • 57. Ultralow Defect Density at Sub-0.5 nm HfO
    Kavrik MS; Thomson E; Chagarov E; Tang K; Ueda ST; Hou V; Aoki T; Kim M; Fruhberger B; Taur Y; McIntyre PC; Kummel AC
    ACS Appl Mater Interfaces; 2018 Sep; 10(36):30794-30802. PubMed ID: 30073827
    [TBL] [Abstract][Full Text] [Related]  

  • 58. Influence of Surface Passivation on AlN Barrier Stress and Scattering Mechanism in Ultra-thin AlN/GaN Heterostructure Field-Effect Transistors.
    Lv YJ; Song XB; Wang YG; Fang YL; Feng ZH
    Nanoscale Res Lett; 2016 Dec; 11(1):373. PubMed ID: 27553382
    [TBL] [Abstract][Full Text] [Related]  

  • 59. Effective Surface Passivation of InP Nanowires by Atomic-Layer-Deposited Al
    Black LE; Cavalli A; Verheijen MA; Haverkort JEM; Bakkers EPAM; Kessels WMM
    Nano Lett; 2017 Oct; 17(10):6287-6294. PubMed ID: 28885032
    [TBL] [Abstract][Full Text] [Related]  

  • 60. Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices.
    Axt A; Hermes IM; Bergmann VW; Tausendpfund N; Weber SAL
    Beilstein J Nanotechnol; 2018; 9():1809-1819. PubMed ID: 29977714
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 7.