These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

110 related articles for article (PubMed ID: 34544518)

  • 1. Composition of Carbon Clusters in Implanted Silicon Using Atom Probe Tomography.
    Dumas P; Duguay S; Borrel J; Hilario F; Blavette D
    Microsc Microanal; 2021 Sep; ():1-4. PubMed ID: 34544518
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Atom probe tomography quantification of carbon in silicon.
    Dumas P; Duguay S; Borrel J; Hilario F; Blavette D
    Ultramicroscopy; 2021 Jan; 220():113153. PubMed ID: 33128965
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfaces.
    Philippe T; Cojocaru-Mirédin O; Duguay S; Blavette D
    J Microsc; 2010 Jul; 239(1):72-7. PubMed ID: 20579271
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Clustering and nearest neighbour distances in atom-probe tomography.
    Philippe T; De Geuser F; Duguay S; Lefebvre W; Cojocaru-Mirédin O; Da Costa G; Blavette D
    Ultramicroscopy; 2009 Sep; 109(10):1304-9. PubMed ID: 19592168
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Correlated Si isotope anomalies and large 13C enrichments in a family of exotic SiC grains.
    Stone J; Hutcheon ID; Epstein S; Wasserburg GJ
    Earth Planet Sci Lett; 1991; 107():570-81. PubMed ID: 11538380
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Clustering and pair correlation function in atom probe tomography.
    Philippe T; Duguay S; Blavette D
    Ultramicroscopy; 2010 Jun; 110(7):862-5. PubMed ID: 20378248
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Atom probe tomographic assessment of the distribution of germanium atoms implanted in a silicon matrix through nano-apertures.
    Tu Y; Han B; Shimizu Y; Inoue K; Fukui Y; Yano M; Tanii T; Shinada T; Nagai Y
    Nanotechnology; 2017 Sep; 28(38):385301. PubMed ID: 28699622
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Carbon-13 labeled polymers: an alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry.
    Harton SE; Stevie FA; Zhu Z; Ade H
    Anal Chem; 2006 May; 78(10):3452-60. PubMed ID: 16689549
    [TBL] [Abstract][Full Text] [Related]  

  • 9. The formation of clusters and nanocrystals in er-implanted hexagonal silicon carbide.
    Kaiser U; Muller DA; Chuvilin A; Pasold G; Witthuhn W
    Microsc Microanal; 2004 Apr; 10(2):301-10. PubMed ID: 15306056
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Quantitative investigation of SiGeC layers using atom probe tomography.
    Estivill R; Grenier A; Duguay S; Vurpillot F; Terlier T; Barnes JP; Hartmann JM; Blavette D
    Ultramicroscopy; 2015 Mar; 150():23-29. PubMed ID: 25497493
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Quantitative analysis of Si/SiGeC superlattices using atom probe tomography.
    Estivill R; Grenier A; Duguay S; Vurpillot F; Terlier T; Barnes JP; Hartmann JM; Blavette D
    Ultramicroscopy; 2015 Dec; 159 Pt 2():223-31. PubMed ID: 25814020
    [TBL] [Abstract][Full Text] [Related]  

  • 12. The effects of helium, strontium, and silver triple ions implanted into SiC.
    Ntshobeni G; Abdalla ZAY; Mokgadi TF; Mlambo M; Njoroge EG; Msimanga M; Sohatsky A; Skuratov VA; Hlatshwayo TT
    Heliyon; 2023 Oct; 9(10):e20877. PubMed ID: 37867893
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Small SiC grains and a nitride grain of circumstellar origin from the Murchison meteorite: implications for stellar evolution and nucleosynthesis.
    Hoppe P; Strebel R; Eberhardt P; Amari S; Lewis RS
    Geochim Cosmochim Acta; 1996 Mar; 60(5):883-907. PubMed ID: 11539147
    [TBL] [Abstract][Full Text] [Related]  

  • 14. 4H-SiC surface morphology after Al ion implantation and annealing with C-cap.
    Canino M; Fedeli P; Albonetti C; Nipoti R
    J Microsc; 2020 Dec; 280(3):229-240. PubMed ID: 32495384
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Deep level defects in 4H-SiC introduced by ion implantation: the role of single ion regime.
    Pastuović Ž; Siegele R; Capan I; Brodar T; Sato SI; Ohshima T
    J Phys Condens Matter; 2017 Nov; 29(47):475701. PubMed ID: 28972198
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Clustering and local magnification effects in atom probe tomography: a statistical approach.
    Philippe T; Gruber M; Vurpillot F; Blavette D
    Microsc Microanal; 2010 Oct; 16(5):643-8. PubMed ID: 20849680
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Extended defects formation in nanosecond laser-annealed ion implanted silicon.
    Qiu Y; Cristiano F; Huet K; Mazzamuto F; Fisicaro G; La Magna A; Quillec M; Cherkashin N; Wang H; Duguay S; Blavette D
    Nano Lett; 2014; 14(4):1769-75. PubMed ID: 24588318
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Determination of matrix composition based on solute-solute nearest-neighbor distances in atom probe tomography.
    De Geuser F; Lefebvre W
    Microsc Res Tech; 2011 Mar; 74(3):257-63. PubMed ID: 20623755
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Small Al cluster ion implantation into Si and 4H-SiC.
    Zeng X; Pelenovich V; Ieshkin A; Danilov A; Tolstogouzov A; Zuo W; Ranjana J; Hu D; Devi N; Fu D; Xiao X
    Rapid Commun Mass Spectrom; 2019 Sep; 33(18):1449-1454. PubMed ID: 31128075
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Significant Oxygen Underestimation When Quantifying Barium-Doped SrTiO Layers by Atom Probe Tomography.
    Morris RJH; Lin JR; Scheerder JE; Popovici MI; Meersschaut J; Goux L; Kar GS; van der Heide P; Fleischmann C
    Microsc Microanal; 2024 Mar; 30(1):49-58. PubMed ID: 38232229
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.