137 related articles for article (PubMed ID: 35209352)
1. Optical characterization of inhomogeneous thin films with randomly rough boundaries.
Vohánka J; Ohlídal I; Buršíková V; Klapetek P; Kaur NJ
Opt Express; 2022 Jan; 30(2):2033-2047. PubMed ID: 35209352
[TBL] [Abstract][Full Text] [Related]
2. Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies.
Ohlídal I; Vohánka J; Buršíková V; Dvořák J; Klapetek P; Jeet Kaur N
Opt Express; 2022 Oct; 30(21):39068-39085. PubMed ID: 36258456
[TBL] [Abstract][Full Text] [Related]
3. Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.
Ohlídal I; Vohánka J; Buršíková V; Šulc V; Šustek Š; Ohlídal M
Opt Express; 2020 Nov; 28(24):36796-36811. PubMed ID: 33379765
[TBL] [Abstract][Full Text] [Related]
4. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers.
Ohlídal I; Vohánka J; Buršíková V; Franta D; Čermák M
Opt Express; 2020 Jan; 28(1):160-174. PubMed ID: 32118947
[TBL] [Abstract][Full Text] [Related]
5. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.
Nečas D; Ohlídal I; Franta D; Ohlídal M; Čudek V; Vodák J
Appl Opt; 2014 Sep; 53(25):5606-14. PubMed ID: 25321353
[TBL] [Abstract][Full Text] [Related]
6. Optical characterization of inhomogeneity of polymer-like thin films arising in the initial phase of plasma-enhanced chemical vapor deposition.
Dvořák J; Vohánka J; Buršíková V; Ohlídal I
Heliyon; 2024 Mar; 10(5):e27246. PubMed ID: 38562509
[TBL] [Abstract][Full Text] [Related]
7. Simultaneous determination of optical constants, thickness, and surface roughness of thin film from spectrophotometric measurements.
Guo C; Kong M; Gao W; Li B
Opt Lett; 2013 Jan; 38(1):40-2. PubMed ID: 23282831
[TBL] [Abstract][Full Text] [Related]
8. Partial dewetting of polyethylene thin films on rough silicon dioxide surfaces.
Zhang F; Baralia G; Boborodea A; Bailly C; Nysten B; Jonas AM
Langmuir; 2005 Aug; 21(16):7427-32. PubMed ID: 16042475
[TBL] [Abstract][Full Text] [Related]
9. The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition.
Wang ZY; Zhang RJ; Lu HL; Chen X; Sun Y; Zhang Y; Wei YF; Xu JP; Wang SY; Zheng YX; Chen LY
Nanoscale Res Lett; 2015; 10():46. PubMed ID: 25852343
[TBL] [Abstract][Full Text] [Related]
10. Spectroscopic ellipsometry analysis of a thin film composite membrane consisting of polysulfone on a porous α-alumina support.
Ogieglo W; Wormeester H; Wessling M; Benes NE
ACS Appl Mater Interfaces; 2012 Feb; 4(2):935-43. PubMed ID: 22235899
[TBL] [Abstract][Full Text] [Related]
11. Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film.
Janicek P; Putri M; Kim KH; Lee HJ; Bouska M; Šlang S; Lee HY
Materials (Basel); 2021 Jan; 14(3):. PubMed ID: 33530567
[TBL] [Abstract][Full Text] [Related]
12. Plasma oxidized polyhydroxymethylsiloxane--a new smooth surface for supported lipid bilayer formation.
Satriano C; Edvardsson M; Ohlsson G; Wang G; Svedhem S; Kasemo B
Langmuir; 2010 Apr; 26(8):5715-25. PubMed ID: 20170173
[TBL] [Abstract][Full Text] [Related]
13. Optical properties of epitaxial BiFeO3 thin film grown on SrRuO3-buffered SrTiO3 substrate.
Xu JP; Zhang RJ; Chen ZH; Wang ZY; Zhang F; Yu X; Jiang AQ; Zheng YX; Wang SY; Chen LY
Nanoscale Res Lett; 2014; 9(1):188. PubMed ID: 24791162
[TBL] [Abstract][Full Text] [Related]
14. Microstructure-related properties of magnesium fluoride films at 193nm by oblique-angle deposition.
Guo C; Kong M; Lin D; Liu C; Li B
Opt Express; 2013 Jan; 21(1):960-7. PubMed ID: 23388989
[TBL] [Abstract][Full Text] [Related]
15. Crystal phase transition of HfO2 films evaporated by plasma-ion-assisted deposition.
Wang J; Maier RL; Schreiber H
Appl Opt; 2008 May; 47(13):C189-92. PubMed ID: 18449245
[TBL] [Abstract][Full Text] [Related]
16. Infrared optical constants and roughness factor functions determination: the H(T)H(R)TR method.
Gunde MK; Aleksandrov B
Appl Opt; 1991 Aug; 30(22):3186-96. PubMed ID: 20706373
[TBL] [Abstract][Full Text] [Related]
17. Model-blind characterization of thin-film optical constants with momentum-resolved reflectometry.
DeCrescent RA; Brown SJ; Schlitz RA; Chabinyc ML; Schuller JA
Opt Express; 2016 Dec; 24(25):28842-28857. PubMed ID: 27958527
[TBL] [Abstract][Full Text] [Related]
18. Optical studies of pulsed laser deposited nanostructured Pb(Zr0.52Ti0.48)O3 thin film by spectroscopic ellipsometry.
Prabu M; Banu IB; Sundari ST; Krishnan R; Chen YC; Chavali M
J Nanosci Nanotechnol; 2014 Jul; 14(7):5335-41. PubMed ID: 24758028
[TBL] [Abstract][Full Text] [Related]
19. Atmospheric-pressure plasma-enhanced chemical vapor deposition of a-SiCN:H films: role of precursors on the film growth and properties.
Guruvenket S; Andrie S; Simon M; Johnson KW; Sailer RA
ACS Appl Mater Interfaces; 2012 Oct; 4(10):5293-9. PubMed ID: 22979919
[TBL] [Abstract][Full Text] [Related]
20. Thickness dependence of the response of metal-dioxide-based micromechanical sensors for sensitive gamma-ray detection.
Shamma K; Albrithen H; Alodhayb A
Appl Radiat Isot; 2022 Aug; 186():110225. PubMed ID: 35567933
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]