These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

122 related articles for article (PubMed ID: 35278874)

  • 1. Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential.
    Mahr C; Grieb T; Krause FF; Schowalter M; Rosenauer A
    Ultramicroscopy; 2022 Jun; 236():113503. PubMed ID: 35278874
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction.
    Mahr C; Müller-Caspary K; Grieb T; Schowalter M; Mehrtens T; Krause FF; Zillmann D; Rosenauer A
    Ultramicroscopy; 2015 Nov; 158():38-48. PubMed ID: 26141289
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods.
    Mahr C; Müller-Caspary K; Grieb T; Krause FF; Schowalter M; Rosenauer A
    Ultramicroscopy; 2021 Feb; 221():113196. PubMed ID: 33341079
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction.
    Addiego C; Gao W; Pan X
    Ultramicroscopy; 2020 Jan; 208():112850. PubMed ID: 31629166
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence.
    Grieb T; Krause FF; Schowalter M; Zillmann D; Sellin R; Müller-Caspary K; Mahr C; Mehrtens T; Bimberg D; Rosenauer A
    Ultramicroscopy; 2018 Jul; 190():45-57. PubMed ID: 29783102
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images.
    Bürger J; Riedl T; Lindner JKN
    Ultramicroscopy; 2020 Dec; 219():113118. PubMed ID: 33126186
    [TBL] [Abstract][Full Text] [Related]  

  • 7. 4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection.
    Grieb T; Krause FF; Müller-Caspary K; Ritz R; Simson M; Schörmann J; Mahr C; Müßener J; Schowalter M; Soltau H; Eickhoff M; Rosenauer A
    Ultramicroscopy; 2021 Sep; 228():113321. PubMed ID: 34175788
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography.
    Béché A; Rouvière JL; Barnes JP; Cooper D
    Ultramicroscopy; 2013 Aug; 131():10-23. PubMed ID: 23673283
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Optimization of NBED simulations for disc-detection measurements.
    Grieb T; Krause FF; Mahr C; Zillmann D; Müller-Caspary K; Schowalter M; Rosenauer A
    Ultramicroscopy; 2017 Oct; 181():50-60. PubMed ID: 28500987
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probes.
    Taplin DJ; Shibata N; Weyland M; Findlay SD
    Ultramicroscopy; 2016 Oct; 169():69-79. PubMed ID: 27449276
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction.
    Mahr C; Müller-Caspary K; Ritz R; Simson M; Grieb T; Schowalter M; Krause FF; Lackmann A; Soltau H; Wittstock A; Rosenauer A
    Ultramicroscopy; 2019 Jan; 196():74-82. PubMed ID: 30291992
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Correlative micro-diffraction and differential phase contrast study of mean inner potential and subtle beam-specimen interaction.
    Wu M; Spiecker E
    Ultramicroscopy; 2017 Jun; 177():1-13. PubMed ID: 28189911
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Correlative micro-diffraction and differential phase contrast study of mean inner potential and subtle beam-specimen interaction.
    Wu M; Spiecker E
    Ultramicroscopy; 2017 May; 176():233-245. PubMed ID: 28366352
    [TBL] [Abstract][Full Text] [Related]  

  • 14. High-resolution scanning precession electron diffraction: Alignment and spatial resolution.
    Barnard JS; Johnstone DN; Midgley PA
    Ultramicroscopy; 2017 Mar; 174():79-88. PubMed ID: 28042983
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction.
    Müller K; Krause FF; Béché A; Schowalter M; Galioit V; Löffler S; Verbeeck J; Zweck J; Schattschneider P; Rosenauer A
    Nat Commun; 2014 Dec; 5():5653. PubMed ID: 25501385
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Position averaged convergent beam electron diffraction: theory and applications.
    Lebeau JM; Findlay SD; Allen LJ; Stemmer S
    Ultramicroscopy; 2010 Jan; 110(2):118-25. PubMed ID: 19939565
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Measuring Spatially-Resolved Potential Drops at Semiconductor Hetero-Interfaces Using 4D-STEM.
    Chejarla VS; Ahmed S; Belz J; Scheunert J; Beyer A; Volz K
    Small Methods; 2023 Sep; 7(9):e2300453. PubMed ID: 37246264
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Separation of three-dimensional scattering effects in tilt-series Fourier ptychography.
    Li P; Batey DJ; Edo TB; Rodenburg JM
    Ultramicroscopy; 2015 Nov; 158():1-7. PubMed ID: 26093970
    [TBL] [Abstract][Full Text] [Related]  

  • 19. A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging.
    Brown HG; Ishikawa R; Sánchez-Santolino G; Lugg NR; Ikuhara Y; Allen LJ; Shibata N
    Ultramicroscopy; 2017 Feb; 173():76-83. PubMed ID: 27987470
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Development of splitting convergent beam electron diffraction (SCBED).
    Houdellier F; Röder F; Snoeck E
    Ultramicroscopy; 2015 Dec; 159 Pt 1():59-66. PubMed ID: 26319180
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.