These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
150 related articles for article (PubMed ID: 35542752)
21. Simultaneous measurement of thermal conductivity and heat capacity of bulk and thin film materials using frequency-dependent transient thermoreflectance method. Liu J; Zhu J; Tian M; Gu X; Schmidt A; Yang R Rev Sci Instrum; 2013 Mar; 84(3):034902. PubMed ID: 23556838 [TBL] [Abstract][Full Text] [Related]
23. A dark mode in scanning thermal microscopy. Ramiandrisoa L; Allard A; Joumani Y; Hay B; Gomés S Rev Sci Instrum; 2017 Dec; 88(12):125115. PubMed ID: 29289173 [TBL] [Abstract][Full Text] [Related]
24. Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: resolution in the nanometer range. Meckenstock R Rev Sci Instrum; 2008 Apr; 79(4):041101. PubMed ID: 18447516 [TBL] [Abstract][Full Text] [Related]
25. Direct observation of optical near field in nanophotonics devices at the nanoscale using Scanning Thermal Microscopy. Grajower M; Desiatov B; Goykhman I; Stern L; Mazurski N; Levy U Opt Express; 2015 Oct; 23(21):27763-75. PubMed ID: 26480438 [TBL] [Abstract][Full Text] [Related]
26. Scanning hall probe microscopy (SHPM) using quartz crystal AFM feedback. Dede M; Urkmen K; Girişen O; Atabak M; Oral A; Farrer I; Ritchie D J Nanosci Nanotechnol; 2008 Feb; 8(2):619-22. PubMed ID: 18464380 [TBL] [Abstract][Full Text] [Related]
27. Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size. Ge Y; Zhang Y; Booth JA; Weaver JM; Dobson PS Nanotechnology; 2016 Aug; 27(32):325503. PubMed ID: 27363896 [TBL] [Abstract][Full Text] [Related]
28. Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy. Wielgoszewski G; Pałetko P; Tomaszewski D; Zaborowski M; Jóźwiak G; Kopiec D; Gotszalk T; Grabiec P Micron; 2015 Dec; 79():93-100. PubMed ID: 26381074 [TBL] [Abstract][Full Text] [Related]
29. Nanoscale thermometry using point contact thermocouples. Sadat S; Tan A; Chua YJ; Reddy P Nano Lett; 2010 Jul; 10(7):2613-7. PubMed ID: 20550098 [TBL] [Abstract][Full Text] [Related]
30. Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopy. Ge Y; Zhang Y; Weaver JMR; Dobson PS Nanotechnology; 2017 Dec; 28(48):485706. PubMed ID: 29035274 [TBL] [Abstract][Full Text] [Related]
36. Methods for topography artifacts compensation in scanning thermal microscopy. Martinek J; Klapetek P; Campbell AC Ultramicroscopy; 2015 Aug; 155():55-61. PubMed ID: 25942752 [TBL] [Abstract][Full Text] [Related]
37. Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices. Kim DU; Jeong CB; Kim JD; Lee KS; Hur H; Nam KH; Kim GH; Chang KS Sensors (Basel); 2017 Nov; 17(12):. PubMed ID: 29189725 [TBL] [Abstract][Full Text] [Related]
38. Quantitative temperature measurement of an electrically heated carbon nanotube using the null-point method. Chung J; Kim K; Hwang G; Kwon O; Jung S; Lee J; Lee JW; Kim GT Rev Sci Instrum; 2010 Nov; 81(11):114901. PubMed ID: 21133490 [TBL] [Abstract][Full Text] [Related]
39. Optimized hand fabricated AFM probes for simultaneous topographical and electrochemical tapping mode imaging. Rodriguez RD; Anne A; Cambril E; Demaille C Ultramicroscopy; 2011 Jul; 111(8):973-81. PubMed ID: 21740860 [TBL] [Abstract][Full Text] [Related]
40. The qPlus sensor, a powerful core for the atomic force microscope. Giessibl FJ Rev Sci Instrum; 2019 Jan; 90(1):011101. PubMed ID: 30709191 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]