These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

148 related articles for article (PubMed ID: 35630210)

  • 1. Electron Radiation Effects of Grain-Boundary Evolution on Polycrystalline Silicon in MEMS.
    Wang L; Liu H; Liu X
    Micromachines (Basel); 2022 May; 13(5):. PubMed ID: 35630210
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Multi-scale characterization by FIB-SEM/TEM/3DAP.
    Ohkubo T; Sepehri-Amin H; Sasaki TT; Hono K
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i6-i7. PubMed ID: 25359845
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Grain rotation mediated by grain boundary dislocations in nanocrystalline platinum.
    Wang L; Teng J; Liu P; Hirata A; Ma E; Zhang Z; Chen M; Han X
    Nat Commun; 2014 Jul; 5():4402. PubMed ID: 25030380
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary.
    Pérez-Willard F; Wolde-Giorgis D; Al-Kassab T; López GA; Mittemeijer EJ; Kirchheim R; Gerthsen D
    Micron; 2008; 39(1):45-52. PubMed ID: 17331735
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Energy dispersive spectroscopy analysis of aluminium segregation in silicon carbide grain boundaries.
    Zhang XF; Yang Q; De Jonghe LC; Zhang Z
    J Microsc; 2002 Jul; 207(Pt 1):58-68. PubMed ID: 12135460
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Observations of crack propagation along a Zr-doped alumina grain boundary.
    Ishihara A; Kondo S; Tochigi E; Shibata N; Ikuhara Y
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i20-i21. PubMed ID: 25359814
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Evidence of Stress Development as a Source of Driving Force for Grain-Boundary Migration in a Ni Bicrystalline TEM Specimen.
    Lee SB; Jung J; Han HN
    Materials (Basel); 2020 Jan; 13(2):. PubMed ID: 31940950
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Record Low Thermal Conductivity of Polycrystalline MoS
    Sledzinska M; Quey R; Mortazavi B; Graczykowski B; Placidi M; Saleta Reig D; Navarro-Urrios D; Alzina F; Colombo L; Roche S; Sotomayor Torres CM
    ACS Appl Mater Interfaces; 2017 Nov; 9(43):37905-37911. PubMed ID: 28956443
    [TBL] [Abstract][Full Text] [Related]  

  • 9. A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.
    Babinsky K; De Kloe R; Clemens H; Primig S
    Ultramicroscopy; 2014 Sep; 144():9-18. PubMed ID: 24815026
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Observation of atomic diffusion at twin-modified grain boundaries in copper.
    Chen KC; Wu WW; Liao CN; Chen LJ; Tu KN
    Science; 2008 Aug; 321(5892):1066-9. PubMed ID: 18719278
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Electron microscopy analysis of the boundary layer structure of SrTiO3 semiconducting ceramic.
    Kawasaki M; Yoshioka T; Sato S; Nomura T; Shiojiri M
    J Electron Microsc (Tokyo); 2000; 49(1):73-84. PubMed ID: 10791423
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Atomic-Scale Observation of Grain Boundary Dominated Unsynchronized Phase Transition in Polycrystalline Cu
    Yuan HL; Wang K; Hu H; Yang L; Chen J; Zheng K
    Adv Mater; 2022 Oct; 34(40):e2205715. PubMed ID: 35981531
    [TBL] [Abstract][Full Text] [Related]  

  • 13. YSZ thin films with minimized grain boundary resistivity.
    Mills EM; Kleine-Boymann M; Janek J; Yang H; Browning ND; Takamura Y; Kim S
    Phys Chem Chem Phys; 2016 Apr; 18(15):10486-91. PubMed ID: 27030391
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Plan-view characterization of intergranular precipitates on grain boundaries by combination of FIB lift out method and TEM analyses: A case study in austenitic stainless steel.
    Sato K; Kaneko K; Hara T; Kawahara Y; Hamada JI; Takushima C; Teranishi R
    Micron; 2020 Nov; 138():102927. PubMed ID: 32905976
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries.
    Stoffers A; Barthel J; Liebscher CH; Gault B; Cojocaru-Mirédin O; Scheu C; Raabe D
    Microsc Microanal; 2017 Apr; 23(2):291-299. PubMed ID: 28215198
    [TBL] [Abstract][Full Text] [Related]  

  • 16. In situ atomic scale mechanical microscopy discovering the atomistic mechanisms of plasticity in nano-single crystals and grain rotation in polycrystalline metals.
    Han X; Wang L; Yue Y; Zhang Z
    Ultramicroscopy; 2015 Apr; 151():94-100. PubMed ID: 25576291
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials.
    Ii S
    Materials (Basel); 2024 Jan; 17(3):. PubMed ID: 38591374
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Grains, growth, and grooving.
    Rost MJ; Quist DA; Frenken JW
    Phys Rev Lett; 2003 Jul; 91(2):026101. PubMed ID: 12906493
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Atomistic Investigation of Grain Boundary Fracture in Alumina.
    Yan J; Kondo S; Feng B; Shibata N; Ikuhara Y
    Nano Lett; 2024 Mar; 24(10):3112-3117. PubMed ID: 38416575
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Complete Goss Secondary Recrystallization by Control of the Grain Size and Texture of Primary Recrystallization in Grain-Oriented Silicon Steel.
    Xu Z; Sha Y; He Z; Zhang F; Liu W; Zhang H; Zuo L
    Materials (Basel); 2021 Sep; 14(18):. PubMed ID: 34576607
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.